C. Parthasarathy
Impact in
-
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- Advanced Memory and Neural Computing
- Silicon Carbide Semiconductor Technologies
- Low-power high-performance VLSI design
- Hardware and Architecture top 10%
Papers in
-
- Semiconductor materials and devices 32
- Advancements in Semiconductor Devices and Circuit Design 28
- Integrated Circuits and Semiconductor Failure Analysis 20
- Ferroelectric and Negative Capacitance Devices 3
- Electrostatic Discharge in Electronics 3
- Silicon Carbide Semiconductor Technologies 3
- Low-power high-performance VLSI design 2
- Journals
- Microelectronics Reliability (4 papers)IEEE Transactions on Device and Materials Reliability (3 papers)Marine Georesources and Geotechnology (1 paper)International Journal of Ambient Energy (1 paper)Electrochemical and Solid-State Letters (1 paper)
- Partner nations
- FranceIndiaSwitzerland
In The Last Decade
C. Parthasarathy
42 papers receiving 1.4k citations
Hit Papers
Peers
Comparison fields: 5 of 49
- Electrical and Electronic Engineering 1.4k
- Hardware and Architecture 50
- Materials Chemistry 136
- Atomic and Molecular Physics, and Optics 69
- Condensed Matter Physics 19
Countries citing papers authored by C. Parthasarathy
This map shows the geographic impact of C. Parthasarathy's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Parthasarathy with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Parthasarathy more than expected).
Fields of papers citing papers by C. Parthasarathy
This network shows the impact of papers produced by C. Parthasarathy. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Parthasarathy. The network helps show where C. Parthasarathy may publish in the future.
Co-authorship network
The 25 scholars most cited alongside C. Parthasarathy, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2023 | 3 | |
| 2 | 2020 | 7 | |
| 3 | 2019 | 7 | |
| 4 | 2016 | 1 | |
| 5 | 2015 | 2 | |
| 6 | 2008 | 110 | |
| 7 | 2008 | 7 | |
| 8 | Newcharacterization andmodeling approach forNBTIdegradation fromtransistor toproduct level | 2007 | 1 |
| 9 | 2007 | 1 | |
| 10 | 2006 | 13 | |
| 11 | 2006 | 22 | |
| 12 | 2005 | 7 | |
| 13 | 2005 | 6 | |
| 14 | 2005 | 9 | |
| 15 | 2004 | 9 | |
| 16 | 2004 | 13 | |
| 17 | 2004 | 10 | |
| 18 | 2004 | 101 | |
| 19 | 2003 | 2 | |
| 20 | 2003 | 1 |
About C. Parthasarathy
C. Parthasarathy is a scholar working on Electrical and Electronic Engineering, Fluid Flow and Transfer Processes, Surfaces, Coatings and Films, Automotive Engineering and Mechanical Engineering, having authored 42 papers that have together received 1.4k indexed citations. Recurring topics across this work include Semiconductor materials and devices (32 papers), Advancements in Semiconductor Devices and Circuit Design (28 papers), Integrated Circuits and Semiconductor Failure Analysis (20 papers), Ferroelectric and Negative Capacitance Devices (3 papers), Electrostatic Discharge in Electronics (3 papers), Silicon Carbide Semiconductor Technologies (3 papers), Low-power high-performance VLSI design (2 papers) and Magnetic Bearings and Levitation Dynamics (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (1.4k citations), Hardware and Architecture (50 citations), Materials Chemistry (136 citations), Atomic and Molecular Physics, and Optics (69 citations) and Condensed Matter Physics (19 citations). C. Parthasarathy has collaborated with scholars based in France, India and Switzerland. Frequent co-authors include M. Denais, V. Huard, Emmanuel Vincent, G. Ribes, F. Monsieur, S. Bruyère, G. Ghibaudo, Jérôme Mitard, A. Bravaix and C. Guérin. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability, Marine Georesources and Geotechnology, International Journal of Ambient Energy and Electrochemical and Solid-State Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.