I.C. Chen
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
- Ferroelectric and Negative Capacitance Devices
- Advanced Memory and Neural Computing
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- Copper Interconnects and Reliability
Papers in
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- Semiconductor materials and devices 8
- Advancements in Semiconductor Devices and Circuit Design 5
- Radiation Effects in Electronics 2
- Silicon Carbide Semiconductor Technologies 2
- Plasma Diagnostics and Applications 1
- Integrated Circuits and Semiconductor Failure Analysis 1
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- Electronic and Structural Properties of Oxides 1
- Silicon Nanostructures and Photoluminescence 1
- Co-authors
- Chenming HuS. HollandP.K. KoJ. ChenT.Y. ChanT.P. Ma
- Partner nations
- United StatesItaly
In The Last Decade
I.C. Chen
8 papers receiving 665 citations
Peers
Comparison fields: 5 of 31
- Electrical and Electronic Engineering 696
- Electronic, Optical and Magnetic Materials 61
- Materials Chemistry 125
- Hardware and Architecture 16
- Nuclear Energy and Engineering 1
Countries citing papers authored by I.C. Chen
This map shows the geographic impact of I.C. Chen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by I.C. Chen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites I.C. Chen more than expected).
Fields of papers citing papers by I.C. Chen
This network shows the impact of papers produced by I.C. Chen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by I.C. Chen. The network helps show where I.C. Chen may publish in the future.
Co-authorship network
The 7 scholars most cited alongside I.C. Chen, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1987 | 232 | |
| 2 | 1987 | 19 | |
| 3 | 1987 | 53 | |
| 4 | 1986 | 113 | |
| 5 | 1986 | 47 | |
| 6 | 1986 | 54 | |
| 7 | 1985 | 110 | |
| 8 | 1984 | 82 |
About I.C. Chen
I.C. Chen is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Infectious Diseases, Organic Chemistry and Surgery, having authored 8 papers that have together received 710 indexed citations. Recurring topics across this work include Semiconductor materials and devices (8 papers), Advancements in Semiconductor Devices and Circuit Design (5 papers), Radiation Effects in Electronics (2 papers), Silicon Carbide Semiconductor Technologies (2 papers), Plasma Diagnostics and Applications (1 paper), Electronic and Structural Properties of Oxides (1 paper), Integrated Circuits and Semiconductor Failure Analysis (1 paper) and Silicon Nanostructures and Photoluminescence (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (696 citations), Electronic, Optical and Magnetic Materials (61 citations), Materials Chemistry (125 citations), Hardware and Architecture (16 citations) and Nuclear Energy and Engineering (1 citation). I.C. Chen has collaborated with scholars based in United States and Italy. Frequent co-authors include Chenming Hu, S. Holland, P.K. Ko, J. Chen, T.Y. Chan, T.P. Ma and Chenming Hu. Their work appears in journals such as IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.