N. Revil
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- Semiconductor materials and devices 44
- Advancements in Semiconductor Devices and Circuit Design 42
- Integrated Circuits and Semiconductor Failure Analysis 13
- Silicon Carbide Semiconductor Technologies 10
- Ferroelectric and Negative Capacitance Devices 9
- Radio Frequency Integrated Circuit Design 7
- Advanced Power Amplifier Design 3
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- Electronic and Structural Properties of Oxides 3
- Co-authors
- A. BravaixC. ParthasarathyEmmanuel VincentM. DenaisV. HuardF. PerrierG. RibesD. Goguenheim
- Journals
- Microelectronics Reliability (12 papers)Microelectronic Engineering (8 papers)IEEE Transactions on Device and Materials Reliability (2 papers)
- Partner nations
- FranceSwitzerlandIndia
In The Last Decade
N. Revil
46 papers receiving 399 citations
Peers
Comparison fields: 5 of 21
- Electrical and Electronic Engineering 413
- Hardware and Architecture 13
- Condensed Matter Physics 10
- Materials Chemistry 36
- Atomic and Molecular Physics, and Optics 24
Countries citing papers authored by N. Revil
This map shows the geographic impact of N. Revil's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. Revil with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. Revil more than expected).
Fields of papers citing papers by N. Revil
This network shows the impact of papers produced by N. Revil. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. Revil. The network helps show where N. Revil may publish in the future.
Co-authorship network
The 25 scholars most cited alongside N. Revil, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2023 | 1 | |
| 2 | 2016 | 17 | |
| 3 | 2008 | 1 | |
| 4 | 2008 | 1 | |
| 5 | 2005 | 7 | |
| 6 | 2005 | 6 | |
| 7 | 2005 | 9 | |
| 8 | 2004 | 3 | |
| 9 | 2004 | 9 | |
| 10 | 2004 | 13 | |
| 11 | 2004 | 10 | |
| 12 | 2004 | 101 | |
| 13 | 2003 | 10 | |
| 14 | 2003 | 6 | |
| 15 | 2003 | 6 | |
| 16 | 2000 | 7 | |
| 17 | 1999 | 3 | |
| 18 | Projecting Device Lifetime for Scaling Technology Generations with the Quasi-Static model | 1998 | 1 |
| 19 | 1997 | 1 | |
| 20 | 1997 | 1 |
About N. Revil
N. Revil is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Materials Chemistry and Infectious Diseases, having authored 47 papers that have together received 418 indexed citations. Recurring topics across this work include Semiconductor materials and devices (44 papers), Advancements in Semiconductor Devices and Circuit Design (42 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers), Silicon Carbide Semiconductor Technologies (10 papers), Ferroelectric and Negative Capacitance Devices (9 papers), Radio Frequency Integrated Circuit Design (7 papers), Electronic and Structural Properties of Oxides (3 papers) and Advanced Power Amplifier Design (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (413 citations), Hardware and Architecture (13 citations), Condensed Matter Physics (10 citations), Materials Chemistry (36 citations) and Atomic and Molecular Physics, and Optics (24 citations). N. Revil has collaborated with scholars based in France, Switzerland and India. Frequent co-authors include A. Bravaix, C. Parthasarathy, Emmanuel Vincent, M. Denais, V. Huard, F. Perrier, G. Ribes, D. Goguenheim, G. Ghibaudo and P. Mortini. Their work appears in journals such as Microelectronics Reliability, Microelectronic Engineering, IEEE Transactions on Device and Materials Reliability, Journal of Applied Physics and Journal of Non-Crystalline Solids.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.