F. Cacho

1.0k total citations
92 papers, 623 citations indexed

About

F. Cacho is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, F. Cacho has authored 92 papers receiving a total of 623 indexed citations (citations by other indexed papers that have themselves been cited), including 89 papers in Electrical and Electronic Engineering, 9 papers in Hardware and Architecture and 7 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in F. Cacho's work include Semiconductor materials and devices (67 papers), Advancements in Semiconductor Devices and Circuit Design (56 papers) and Integrated Circuits and Semiconductor Failure Analysis (38 papers). F. Cacho is often cited by papers focused on Semiconductor materials and devices (67 papers), Advancements in Semiconductor Devices and Circuit Design (56 papers) and Integrated Circuits and Semiconductor Failure Analysis (38 papers). F. Cacho collaborates with scholars based in France, India and Switzerland. F. Cacho's co-authors include X. Federspiel, V. Huard, A. Bravaix, D. Roy, M. Rafik, A. Bajolet, A. Cros, Lorena Anghel, X. Garros and G. Ghibaudo and has published in prestigious journals such as Journal of Applied Physics, IEEE Journal of Solid-State Circuits and Applied Physics A.

In The Last Decade

F. Cacho

85 papers receiving 614 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
F. Cacho France 14 595 63 47 29 29 92 623
Toshihiro Sekigawa Japan 9 339 0.6× 39 0.6× 31 0.7× 34 1.2× 40 1.4× 48 353
Kazuo Terada Japan 11 450 0.8× 50 0.8× 20 0.4× 25 0.9× 71 2.4× 62 474
T. Iwamatsu Japan 16 787 1.3× 31 0.5× 26 0.6× 46 1.6× 50 1.7× 101 806
Y. Eo South Korea 5 733 1.2× 32 0.5× 40 0.9× 55 1.9× 56 1.9× 7 753
M. Togo Japan 14 599 1.0× 18 0.3× 24 0.5× 62 2.1× 69 2.4× 68 619
X. Federspiel France 15 758 1.3× 42 0.7× 178 3.8× 58 2.0× 13 0.4× 109 787
K.P. Müller United States 10 236 0.4× 44 0.7× 31 0.7× 20 0.7× 48 1.7× 26 261
G. Bouche France 9 425 0.7× 25 0.4× 24 0.5× 69 2.4× 116 4.0× 15 479
Juergen Boemmels Belgium 7 316 0.5× 16 0.3× 46 1.0× 17 0.6× 54 1.9× 28 351
H. Ishiuchi Japan 16 594 1.0× 28 0.4× 9 0.2× 54 1.9× 94 3.2× 63 611

Countries citing papers authored by F. Cacho

Since Specialization
Citations

This map shows the geographic impact of F. Cacho's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Cacho with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Cacho more than expected).

Fields of papers citing papers by F. Cacho

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. Cacho. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Cacho. The network helps show where F. Cacho may publish in the future.

Co-authorship network of co-authors of F. Cacho

This figure shows the co-authorship network connecting the top 25 collaborators of F. Cacho. A scholar is included among the top collaborators of F. Cacho based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. Cacho. F. Cacho is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
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Bravaix, A., et al.. (2023). CMOS Scaling Challenges for High Performance and Low Power applications facing Reliability Criteria towards the Decananometer range. Journal of Physics Conference Series. 2548(1). 12003–12003. 2 indexed citations
3.
Bravaix, A., et al.. (2023). DC to AC analysis of HC vs. BTI damage in N-EDMOS used in single photon avalanche diode cell. Microelectronics Reliability. 150. 115111–115111. 1 indexed citations
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Federspiel, X., et al.. (2022). Frequency dependant gate oxide TDDB model. SPIRE - Sciences Po Institutional REpository. P25–1. 6 indexed citations
6.
Federspiel, X., et al.. (2022). New Modelling Off-state TDDB for 130nm to 28nm CMOS nodes. HAL (Le Centre pour la Communication Scientifique Directe). 11A.3–1. 5 indexed citations
7.
Cacho, F., et al.. (2022). Comprehensive Analysis of RF Hot-Carrier Reliability Sensitivity and Design Explorations for 28GHz Power Amplifier Applications. SPIRE - Sciences Po Institutional REpository. 4B.2–1. 5 indexed citations
8.
Federspiel, X., et al.. (2021). HCI Temperature sense effect from 180nm to 28nm nodes. 38. 1–5. 1 indexed citations
9.
Federspiel, X., et al.. (2020). Comparison of variability of HCI induced drift for SiON and HKMG devices. 1–5. 3 indexed citations
10.
Huard, V., et al.. (2017). Enabling robust automotive electronic components in advanced CMOS nodes. Microelectronics Reliability. 76-77. 13–24. 1 indexed citations
11.
Federspiel, X., et al.. (2014). (Invited) Effect of SOI Substrate on CMOS Devices Reliability. ECS Transactions. 61(3). 127–134.
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Huard, V., A. Cros, X. Federspiel, et al.. (2013). BTI variability fundamental understandings and impact on digital logic by the use of extensive dataset. 15.4.1–15.4.4. 55 indexed citations
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Huard, Vincent, et al.. (2011). Design-in reliability approach for Hot Carrier injection modeling in the context of AMS/RF applications. 1. 5A.5.1–5A.5.7. 3 indexed citations
17.
Cacho, F., P. Scheer, S. Boret, et al.. (2011). Aging of 40nm MOSFET RF parameters under RF conditions from characterization to compact modeling for RF design. 55. 1–4. 4 indexed citations
18.
Cacho, F., et al.. (2010). Insights about reliability of Heterojunction Bipolar Transistor under DC stress. 139–141. 1 indexed citations
19.
Cacho, F., et al.. (2010). Simulation of pattern effect induced by millisecond annealing used in advanced metal-oxide-semiconductor technologies. Journal of Applied Physics. 108(1). 8 indexed citations
20.
Arnaud, L., et al.. (2009). Analysis of electromigration induced early failures in Cu interconnects for 45nm node. Microelectronic Engineering. 87(3). 355–360. 15 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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