D. Roy
-
- Semiconductor materials and devices 80
- Advancements in Semiconductor Devices and Circuit Design 56
- Integrated Circuits and Semiconductor Failure Analysis 45
- Ferroelectric and Negative Capacitance Devices 7
- Advanced Memory and Neural Computing 4
- Silicon Carbide Semiconductor Technologies 4
-
- Copper Interconnects and Reliability 15
-
- Electronic and Structural Properties of Oxides 4
- Cited by
- Electrical and Electronic EngineeringElectronic, Optical and Magnetic MaterialsInstrumentation
- Journals
- Microelectronics Reliability (7 papers)Microelectronic Engineering (5 papers)IEEE Transactions on Device and Materials Reliability (3 papers)
- Partner nations
- FranceSwitzerlandIndia
In The Last Decade
D. Roy
80 papers receiving 654 citations
Peers
Comparison fields: 5 of 31
- Electrical and Electronic Engineering 660
- Electronic, Optical and Magnetic Materials 94
- Instrumentation 8
- Hardware and Architecture 11
- Atomic and Molecular Physics, and Optics 41
Countries citing papers authored by D. Roy
This map shows the geographic impact of D. Roy's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Roy with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Roy more than expected).
Fields of papers citing papers by D. Roy
This network shows the impact of papers produced by D. Roy. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Roy. The network helps show where D. Roy may publish in the future.
Co-authorship network
The 25 scholars most cited alongside D. Roy, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2023 | 5 | |
| 2 | 2018 | 1 | |
| 3 | 2016 | 4 | |
| 4 | 2013 | 22 | |
| 5 | 2013 | 11 | |
| 6 | 2011 | 8 | |
| 7 | 2011 | 8 | |
| 8 | 2010 | 1 | |
| 9 | 2009 | 9 | |
| 10 | 2009 | 5 | |
| 11 | 2008 | 1 | |
| 12 | 2007 | 16 | |
| 13 | 2005 | 15 | |
| 14 | 2005 | 7 | |
| 15 | 2005 | 9 | |
| 16 | 2004 | 0 | |
| 17 | 2004 | 4 | |
| 18 | 2003 | 1 | |
| 19 | 2003 | 2 | |
| 20 | 2001 | 10 |
About D. Roy
D. Roy is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Instrumentation, Biophysics and Atomic and Molecular Physics, and Optics, having authored 83 papers that have together received 678 indexed citations. Recurring topics across this work include Semiconductor materials and devices (80 papers), Advancements in Semiconductor Devices and Circuit Design (56 papers), Integrated Circuits and Semiconductor Failure Analysis (45 papers), Copper Interconnects and Reliability (15 papers), Ferroelectric and Negative Capacitance Devices (7 papers), Advanced Memory and Neural Computing (4 papers), Electronic and Structural Properties of Oxides (4 papers) and Silicon Carbide Semiconductor Technologies (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (660 citations), Electronic, Optical and Magnetic Materials (94 citations), Instrumentation (8 citations), Hardware and Architecture (11 citations) and Atomic and Molecular Physics, and Optics (41 citations). D. Roy has collaborated with scholars based in France, Switzerland and India. Frequent co-authors include X. Federspiel, G. Ghibaudo, M. Rafik, S. Bruyère, F. Monsieur, Emmanuel Vincent, V. Huard, G. Ribes, A. Bravaix and G. Pananakakis. Their work appears in journals such as Microelectronics Reliability, Microelectronic Engineering, IEEE Transactions on Device and Materials Reliability, SAE technical papers on CD-ROM/SAE technical paper series and Solid-State Electronics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.