D. Bouchu
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- Copper Interconnects and Reliability 21
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- 3D IC and TSV technologies 25
- Electronic Packaging and Soldering Technologies 19
- Semiconductor materials and devices 11
- Advancements in Photolithography Techniques 2
- Integrated Circuits and Semiconductor Failure Analysis 2
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- Additive Manufacturing and 3D Printing Technologies 2
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- Semiconductor materials and interfaces 2
- Cited by
- Electronic, Optical and Magnetic MaterialsElectrical and Electronic EngineeringAutomotive Engineering
- Journals
- Microelectronic Engineering (3 papers)Microelectronics Reliability (2 papers)ECS Journal of Solid State Science and Technology (2 papers)
- Partner nations
- FranceSwitzerlandBelgium
In The Last Decade
D. Bouchu
33 papers receiving 283 citations
Peers
Comparison fields: 5 of 27
- Electronic, Optical and Magnetic Materials 105
- Electrical and Electronic Engineering 267
- Automotive Engineering 23
- Hardware and Architecture 10
- Surfaces, Coatings and Films 7
Countries citing papers authored by D. Bouchu
This map shows the geographic impact of D. Bouchu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Bouchu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Bouchu more than expected).
Fields of papers citing papers by D. Bouchu
This network shows the impact of papers produced by D. Bouchu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Bouchu. The network helps show where D. Bouchu may publish in the future.
Co-authorship network
The 25 scholars most cited alongside D. Bouchu, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2022 | 35 | |
| 2 | 2021 | 6 | |
| 3 | 2020 | 1 | |
| 4 | 2019 | 2 | |
| 5 | 2019 | 10 | |
| 6 | 2018 | 8 | |
| 7 | 2017 | 9 | |
| 8 | 2017 | 2 | |
| 9 | 2015 | 5 | |
| 10 | 2015 | 9 | |
| 11 | 2014 | 6 | |
| 12 | 2013 | 12 | |
| 13 | 2013 | 2 | |
| 14 | 2010 | 3 | |
| 15 | 2009 | 20 | |
| 16 | 2008 | 2 | |
| 17 | 2008 | 11 | |
| 18 | 2007 | 9 | |
| 19 | 2006 | 1 | |
| 20 | 2006 | 2 |
About D. Bouchu
D. Bouchu is a scholar working on Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering and Bioengineering, having authored 33 papers that have together received 294 indexed citations. Recurring topics across this work include 3D IC and TSV technologies (25 papers), Copper Interconnects and Reliability (21 papers), Electronic Packaging and Soldering Technologies (19 papers), Semiconductor materials and devices (11 papers), Advancements in Photolithography Techniques (2 papers), Semiconductor materials and interfaces (2 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers) and Additive Manufacturing and 3D Printing Technologies (2 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (105 citations), Electrical and Electronic Engineering (267 citations) and Automotive Engineering (23 citations). D. Bouchu has collaborated with scholars based in France, Switzerland and Belgium. Frequent co-authors include S. Moreau, S. Lhostis, H. Frémont, L. Arnaud, A. Farcy, M. Assous, L. Di Cioccio, J. Torrès, N. Sillon and G. Passemard. Their work appears in journals such as Microelectronic Engineering, Microelectronics Reliability, ECS Journal of Solid State Science and Technology, IEEE Transactions on Components Packaging and Manufacturing Technology and IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.