IEEE Transactions on Instrumentation and Measurement · 1×
×0.599k/180kEEE
×1.713k/8kSRRQ
×9.15k/528SOFTW
×0.57k/14kSPU
×0.75k/7kHA
Citations per year
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Countries where authors publish in Microelectronics Reliability
Since Specialization
Citations
This map shows the geographic impact of research published in Microelectronics Reliability. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by papers published in Microelectronics Reliability with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Microelectronics Reliability more than expected).
Fields of papers published in Microelectronics Reliability
This network shows the impact of papers published in Microelectronics Reliability. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers published in Microelectronics Reliability.
About Microelectronics Reliability
The 11.2k papers published in Microelectronics Reliability in the last decades have received a total of 137.3k indexed citations . Papers published in Microelectronics Reliability usually cover Software (610 papers), Safety, Risk, Reliability and Quality (1.3k papers), Electrical and Electronic Engineering (8.3k papers), Hardware and Architecture (728 papers) and Statistics, Probability and Uncertainty (627 papers) specifically the topics of Semiconductor materials and devices (3.2k papers), Integrated Circuits and Semiconductor Failure Analysis (2.0k papers), Electronic Packaging and Soldering Technologies (2.0k papers), Advancements in Semiconductor Devices and Circuit Design (1.9k papers), Silicon Carbide Semiconductor Technologies (1.5k papers), Reliability and Maintenance Optimization (1.3k papers), 3D IC and TSV technologies (1.0k papers) and Electrostatic Discharge in Electronics (951 papers). The most active scholars publishing in Microelectronics Reliability are Michael Pecht, Mauro Ciappa, B.S. Dhillon, K. N. Tu, Tibor Grasser, Souvik Mahapatra, Yi‐Shao Lai, Hei Wong, Daniel M. Fleetwood and Md Ashraful Alam.
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