L. Arnaud
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- Copper Interconnects and Reliability 66
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- Semiconductor materials and devices 47
- Electronic Packaging and Soldering Technologies 44
- 3D IC and TSV technologies 24
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- Semiconductor materials and interfaces 6
- Magnetic properties of thin films 5
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- Metal and Thin Film Mechanics 5
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- Phase-change materials and chalcogenides 6
- Cited by
- Electronic, Optical and Magnetic MaterialsElectrical and Electronic EngineeringAtomic and Molecular Physics, and Optics
- Journals
- Microelectronic Engineering (11 papers)Microelectronics Reliability (9 papers)IEEE Transactions on Magnetics (7 papers)
- Partner nations
- FranceSwitzerlandBelgium
In The Last Decade
L. Arnaud
81 papers receiving 752 citations
Peers
Comparison fields: 5 of 60
- Electronic, Optical and Magnetic Materials 394
- Electrical and Electronic Engineering 652
- Atomic and Molecular Physics, and Optics 112
- Hardware and Architecture 24
- Mechanics of Materials 87
Countries citing papers authored by L. Arnaud
This map shows the geographic impact of L. Arnaud's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L. Arnaud with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L. Arnaud more than expected).
Fields of papers citing papers by L. Arnaud
This network shows the impact of papers produced by L. Arnaud. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L. Arnaud. The network helps show where L. Arnaud may publish in the future.
Co-authorship network
The 25 scholars most cited alongside L. Arnaud, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2022 | 35 | |
| 2 | 2019 | 17 | |
| 3 | 2018 | 23 | |
| 4 | 2017 | 5 | |
| 5 | 2017 | 27 | |
| 6 | 2016 | 18 | |
| 7 | 2013 | 1 | |
| 8 | 2011 | 1 | |
| 9 | 2010 | 6 | |
| 10 | 2009 | 15 | |
| 11 | 2005 | 5 | |
| 12 | 2004 | 7 | |
| 13 | 2003 | 4 | |
| 14 | 2002 | 1 | |
| 15 | 2002 | 61 | |
| 16 | 2002 | 18 | |
| 17 | 2000 | 6 | |
| 18 | 1998 | 3 | |
| 19 | 1988 | 2 | |
| 20 | 1988 | 15 |
About L. Arnaud
L. Arnaud is a scholar working on Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering and Acoustics and Ultrasonics, having authored 85 papers that have together received 779 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (66 papers), Semiconductor materials and devices (47 papers), Electronic Packaging and Soldering Technologies (44 papers), 3D IC and TSV technologies (24 papers), Semiconductor materials and interfaces (6 papers), Phase-change materials and chalcogenides (6 papers), Metal and Thin Film Mechanics (5 papers) and Magnetic properties of thin films (5 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (394 citations), Electrical and Electronic Engineering (652 citations) and Atomic and Molecular Physics, and Optics (112 citations). L. Arnaud has collaborated with scholars based in France, Switzerland and Belgium. Frequent co-authors include G. Reimbold, S. Moreau, Y. Wouters, C. Chappaz, Thomas Frank, Lorena Anghel, F. Lorut, Philip R. LeDuc, Aurélie Thuaire and X. Federspiel. Their work appears in journals such as Microelectronic Engineering, Microelectronics Reliability, IEEE Transactions on Magnetics, Journal of Applied Physics and BioMetals.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.