Nicolas Daval

858 total citations
49 papers, 441 citations indexed

About

Nicolas Daval is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Nicolas Daval has authored 49 papers receiving a total of 441 indexed citations (citations by other indexed papers that have themselves been cited), including 48 papers in Electrical and Electronic Engineering, 10 papers in Biomedical Engineering and 9 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Nicolas Daval's work include Advancements in Semiconductor Devices and Circuit Design (37 papers), Semiconductor materials and devices (36 papers) and Integrated Circuits and Semiconductor Failure Analysis (17 papers). Nicolas Daval is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (37 papers), Semiconductor materials and devices (36 papers) and Integrated Circuits and Semiconductor Failure Analysis (17 papers). Nicolas Daval collaborates with scholars based in France, United States and Singapore. Nicolas Daval's co-authors include Bich-Yen Nguyen, K.K. Bourdelle, D. Delprat, A. R. Brown, Asen Asenov, Charlotte Drazek, C. Fenouillet-Béranger, J. Foucher, Eugene A. Fitzgerald and Mayank T. Bulsara and has published in prestigious journals such as Journal of Applied Physics, IEEE Transactions on Electron Devices and Journal of Crystal Growth.

In The Last Decade

Nicolas Daval

47 papers receiving 417 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Nicolas Daval France 11 429 90 73 30 13 49 441
J. Sandford United States 5 490 1.1× 118 1.3× 60 0.8× 49 1.6× 20 1.5× 6 518
C. Kerner Belgium 11 347 0.8× 40 0.4× 63 0.9× 26 0.9× 8 0.6× 33 360
H. van Meer Belgium 10 444 1.0× 54 0.6× 61 0.8× 18 0.6× 10 0.8× 41 452
P. Charvát United States 4 390 0.9× 93 1.0× 56 0.8× 47 1.6× 6 0.5× 5 412
F.N. Cubaynes Belgium 9 369 0.9× 60 0.7× 34 0.5× 48 1.6× 12 0.9× 26 388
Hamilton Carrillo-Nuñez United Kingdom 11 367 0.9× 124 1.4× 90 1.2× 49 1.6× 11 0.8× 41 403
Hiroaki Arimura Belgium 15 620 1.4× 95 1.1× 82 1.1× 95 3.2× 12 0.9× 96 651
Elvedin Memišević Sweden 13 598 1.4× 284 3.2× 88 1.2× 50 1.7× 13 1.0× 25 628
E. Simoen Belgium 12 370 0.9× 42 0.5× 63 0.9× 35 1.2× 17 1.3× 44 382
F. Andrieu France 15 803 1.9× 94 1.0× 52 0.7× 50 1.7× 8 0.6× 60 810

Countries citing papers authored by Nicolas Daval

Since Specialization
Citations

This map shows the geographic impact of Nicolas Daval's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Nicolas Daval with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Nicolas Daval more than expected).

Fields of papers citing papers by Nicolas Daval

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Nicolas Daval. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Nicolas Daval. The network helps show where Nicolas Daval may publish in the future.

Co-authorship network of co-authors of Nicolas Daval

This figure shows the co-authorship network connecting the top 25 collaborators of Nicolas Daval. A scholar is included among the top collaborators of Nicolas Daval based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Nicolas Daval. Nicolas Daval is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Meunier, Tristan, et al.. (2025). Silicon spin qubits: a viable path towards industrial manufacturing of large-scale quantum processors. The European Physical Journal A. 61(3). 1 indexed citations
2.
Shrestha, Ramesh, et al.. (2023). High Sensitivity Surface Defect Inspection of SiC and SmartSiC<sup>TM</sup> Substrates Using a DUV Laser-Based System. Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum. 425. 57–61. 3 indexed citations
3.
Clifton, P.A., Ryan Sporer, Rick Carter, et al.. (2019). Buried SiGe as a performance booster in n-channel FDSOI MOSFETs. Solid-State Electronics. 162. 107631–107631. 1 indexed citations
4.
Daval, Nicolas, W. Schwarzenbach, Oleg Kononchuk, et al.. (2013). Smart Cut&#x2122; technology provides excellent layer uniformity for fully depleted CMOS. 1–2.
5.
Liu, Bin, Xiao Gong, Chunlei Zhan, et al.. (2013). Germanium Multiple-Gate Field-Effect Transistors Formed on Germanium-on-Insulator Substrate. IEEE Transactions on Electron Devices. 60(6). 1852–1860. 16 indexed citations
6.
7.
Schwarzenbach, W., et al.. (2013). (Invited) Manufacturing of Ultra Thin SOI. ECS Transactions. 50(5). 53–57. 2 indexed citations
8.
Cheng, Ran, Qian Zhou, Anyan Du, et al.. (2013). Strain engineering of ultra-thin silicon-on-insulator structures using through-buried-oxide ion implantation and crystallization. Solid-State Electronics. 83. 37–41. 3 indexed citations
9.
Brown, A. R., Nicolas Daval, K.K. Bourdelle, Bich-Yen Nguyen, & Asen Asenov. (2012). Simulation analysis of process-induced variability in nanoscale SOI and bulk FinFETs. 1–2. 2 indexed citations
10.
Liu, Bin, Xiao Gong, Genquan Han, et al.. (2012). High-Performance Germanium $\Omega$ -Gate MuGFET With Schottky-Barrier Nickel Germanide Source/Drain and Low-Temperature Disilane-Passivated Gate Stack. IEEE Electron Device Letters. 33(10). 1336–1338. 18 indexed citations
11.
Schwarzenbach, W., Nicolas Daval, B.-Y. Nguyen, et al.. (2011). Ultra-thin SOI for 20nm node and beyond. 35. 1–2. 1 indexed citations
12.
Schwarzenbach, W., et al.. (2010). Ultra Thin silicon substrate for next generation technology nodes. 1–3. 1 indexed citations
13.
Bedell, Stephen W., Nicolas Daval, A. Khakifirooz, et al.. (2010). New opportunities for SiGe and Ge channel p-FETs. Microelectronic Engineering. 88(4). 324–330. 10 indexed citations
14.
Yang, Nancy, Mayank T. Bulsara, Eugene A. Fitzgerald, et al.. (2009). Thermal considerations for advanced SOI substrates designed for III-V/Si heterointegration. DSpace@MIT (Massachusetts Institute of Technology). 1–2. 3 indexed citations
15.
Fitzgerald, Eugene A., et al.. (2009). Monolithic III-V/Si Integration. ECS Transactions. 19(5). 345–350. 11 indexed citations
16.
Nguyen, Bich-Yen, C. Mazuré, D. Delprat, et al.. (2009). Overview of FDSOI technology from substrate to device. 1–2. 4 indexed citations
17.
Nguyen, P., K.K. Bourdelle, Nicolas Daval, et al.. (2008). Splitting kinetics of Si0.8Ge0.2 layers implanted with H or sequentially with He and H. Journal of Applied Physics. 104(11). 4 indexed citations
18.
Kazior, T.E., Amy Liu, Dmitri Loubychev, et al.. (2008). Direct Growth of III-V Devices on Silicon. MRS Proceedings. 1068. 1 indexed citations
19.
Allain, F., O. Faynot, M. Cassé, et al.. (2007). Additivity between sSOI- and CESL-induced nMOSFETs Performance Boosts. 2 indexed citations
20.
Tiberj, Antoine, Vincent Paillard, Nicolas Daval, et al.. (2004). Stress Metrology : The challenge for the next generation of engineered wafers. MRS Proceedings. 809. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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