Pierre Eyben

1.8k total citations
121 papers, 1.3k citations indexed

About

Pierre Eyben is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, Pierre Eyben has authored 121 papers receiving a total of 1.3k indexed citations (citations by other indexed papers that have themselves been cited), including 105 papers in Electrical and Electronic Engineering, 64 papers in Atomic and Molecular Physics, and Optics and 30 papers in Biomedical Engineering. Recurrent topics in Pierre Eyben's work include Integrated Circuits and Semiconductor Failure Analysis (69 papers), Semiconductor materials and devices (52 papers) and Force Microscopy Techniques and Applications (50 papers). Pierre Eyben is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (69 papers), Semiconductor materials and devices (52 papers) and Force Microscopy Techniques and Applications (50 papers). Pierre Eyben collaborates with scholars based in Belgium, United States and Netherlands. Pierre Eyben's co-authors include Wilfried Vandervorst, Trudo Clarysse, Jay Mody, Thomas Hantschel, W. Vandervorst, Andreas Schulze, Kausala Mylvaganam, Man Xu, David Álvarez and Marc Fouchier and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

Pierre Eyben

108 papers receiving 1.2k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Pierre Eyben Belgium 19 988 688 479 274 71 121 1.3k
J. Slinkman United States 17 707 0.7× 617 0.9× 298 0.6× 111 0.4× 33 0.5× 42 1.0k
Joseph J. Kopanski United States 18 836 0.8× 578 0.8× 355 0.7× 217 0.8× 15 0.2× 70 1.1k
S. Akamine United States 10 394 0.4× 691 1.0× 345 0.7× 85 0.3× 76 1.1× 17 839
G. J. Pietsch Germany 12 394 0.4× 340 0.5× 277 0.6× 294 1.1× 36 0.5× 17 663
V. I. Mashanov Russia 16 719 0.7× 589 0.9× 338 0.7× 305 1.1× 31 0.4× 58 1.1k
P. Hudek Germany 14 548 0.6× 333 0.5× 341 0.7× 86 0.3× 54 0.8× 89 779
M. Mühlberger Austria 20 664 0.7× 605 0.9× 483 1.0× 190 0.7× 43 0.6× 76 1.1k
Emmanuel Dubois France 14 630 0.6× 551 0.8× 363 0.8× 182 0.7× 20 0.3× 41 845
M. Kaiser Netherlands 14 752 0.8× 244 0.4× 356 0.7× 690 2.5× 32 0.5× 49 1.2k
S. Teichert Germany 18 470 0.5× 341 0.5× 145 0.3× 494 1.8× 47 0.7× 62 904

Countries citing papers authored by Pierre Eyben

Since Specialization
Citations

This map shows the geographic impact of Pierre Eyben's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Pierre Eyben with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Pierre Eyben more than expected).

Fields of papers citing papers by Pierre Eyben

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Pierre Eyben. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Pierre Eyben. The network helps show where Pierre Eyben may publish in the future.

Co-authorship network of co-authors of Pierre Eyben

This figure shows the co-authorship network connecting the top 25 collaborators of Pierre Eyben. A scholar is included among the top collaborators of Pierre Eyben based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Pierre Eyben. Pierre Eyben is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Laskar, Md Ashiqur Rahman, et al.. (2025). The enduring legacy of scanning spreading resistance microscopy: Overview, advancements, and future directions. Applied Physics Reviews. 12(4).
3.
Eyben, Pierre, A. De Keersgieter, Philippe Matagne, et al.. (2024). Predictive and prospective calibrated TCAD to improve device performances in sub-20 nm gate length p-FinFETs. Japanese Journal of Applied Physics. 63(4). 04SP03–04SP03. 1 indexed citations
4.
Ritzenthaler, R., Pierre Eyben, Kiroubanand Sankaran, et al.. (2024). Nb Contacts for Thermally-Stable High-Performance Logic and Memory Peripheral Transistor. 1–4.
5.
Eyben, Pierre, A. De Keersgieter, Hans Mertens, et al.. (2024). Direct Extraction of Contact and S/D epi Access Resistance Components on 45nm Gate Pitch NS-Based n-FET Devices for the 2nm Node. Lirias (KU Leuven). 1–4.
6.
7.
Eyben, Pierre, Goutham Arutchelvan, T. Chiarella, et al.. (2022). Investigation of access resistance components in Si-channel p-FinFET using cascaded devices.. 1 indexed citations
8.
Vandooren, A., Toshiyuki Tabata, Pierre Eyben, et al.. (2021). Potential benefits of S/D HDD activation by melt laser annealing in 3D-integrated top-tier FDSOI FETs. 2 indexed citations
9.
Schulze, Andreas, Rui Cao, Pierre Eyben, Thomas Hantschel, & W. Vandervorst. (2015). Outwitting the series resistance in scanning spreading resistance microscopy. Ultramicroscopy. 161. 59–65. 11 indexed citations
10.
11.
Schulze, Andreas, Thomas Hantschel, Pierre Eyben, et al.. (2012). Quantitative three-dimensional carrier mapping in nanowire-based transistors using scanning spreading resistance microscopy. Ultramicroscopy. 125. 18–23. 14 indexed citations
12.
Eyben, Pierre, Trudo Clarysse, Geert Hellings, et al.. (2012). Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations. Solid-State Electronics. 74. 38–42. 3 indexed citations
13.
Schulze, Andreas, Thomas Hantschel, Pierre Eyben, et al.. (2011). Observation of diameter dependent carrier distribution in nanowire-based transistors. Nanotechnology. 22(18). 185701–185701. 35 indexed citations
14.
Giannazzo, Filippo, et al.. (2011). Advanced materials nanocharacterization. Nanoscale Research Letters. 6(1). 107–107. 3 indexed citations
15.
Mylvaganam, Kausala, et al.. (2009). Evolution of metastable phases in silicon during nanoindentation: mechanism analysis and experimental verification. Nanotechnology. 20(30). 305705–305705. 105 indexed citations
16.
Nguyen, Ngoc Duy, Frederik Leys, Shotaro Takeuchi, et al.. (2008). Conformal ultra shallow junctions by vapor phase doping with boron. Open Repository and Bibliography (University of Liège). 1 indexed citations
17.
Vandervorst, W., M. Jurczak, T. Hoffman, et al.. (2008). Conformal Doping of FINFETs: a Fabrication and Metrology Challenge. AIP conference proceedings. 449–456. 23 indexed citations
18.
Adachi, K., K. Ohuchi, N. Aoki, et al.. (2006). Direct Observation of 2-D Dopant Profiles of MOSFETs Activated by Millisecond Anneal. 104–107. 1 indexed citations
19.
Eyben, Pierre, Ingrid De Wolf, R. Rooyackers, et al.. (2001). SSRM and SCM observation of modified lateral diffusion of As, BF2 and Sb induced by nitride spacers.. MRS Proceedings. 669. 4 indexed citations
20.
Haegeman, Bart, Thomas Trenkler, Pierre Eyben, et al.. (1999). Nanopotentiometry: Data Interpretation and Quantification. European Solid-State Device Research Conference. 1. 192–195.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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