Tamer San

1.1k total citations
18 papers, 936 citations indexed

About

Tamer San is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Biomedical Engineering. According to data from OpenAlex, Tamer San has authored 18 papers receiving a total of 936 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Electrical and Electronic Engineering, 10 papers in Materials Chemistry and 2 papers in Biomedical Engineering. Recurrent topics in Tamer San's work include Semiconductor materials and devices (10 papers), Ferroelectric and Negative Capacitance Devices (9 papers) and MXene and MAX Phase Materials (6 papers). Tamer San is often cited by papers focused on Semiconductor materials and devices (10 papers), Ferroelectric and Negative Capacitance Devices (9 papers) and MXene and MAX Phase Materials (6 papers). Tamer San collaborates with scholars based in United States, South Korea and Australia. Tamer San's co-authors include Luigi Colombo, Scott R. Summerfelt, Si Joon Kim, Jiyoung Kim, Jaidah Mohan, Chadwin D. Young, Jaebeom Lee, Joy S. Lee, Paolo Bondavalli and Sung‐Yool Choi and has published in prestigious journals such as Advanced Materials, Applied Physics Letters and ACS Applied Materials & Interfaces.

In The Last Decade

Tamer San

18 papers receiving 916 citations

Peers

Tamer San
Bong Jin Kuh South Korea
Fabio Carta United States
Kai‐Shin Li Taiwan
Pei-Jer Tzeng Taiwan
Lu Tai China
Min‐Cheng Chen Taiwan
R. Annunziata Italy
Raik Hoffmann Germany
Nanbo Gong United States
Masahiro Moniwa Japan
Bong Jin Kuh South Korea
Tamer San
Citations per year, relative to Tamer San Tamer San (= 1×) peers Bong Jin Kuh

Countries citing papers authored by Tamer San

Since Specialization
Citations

This map shows the geographic impact of Tamer San's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Tamer San with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Tamer San more than expected).

Fields of papers citing papers by Tamer San

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Tamer San. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Tamer San. The network helps show where Tamer San may publish in the future.

Co-authorship network of co-authors of Tamer San

This figure shows the co-authorship network connecting the top 25 collaborators of Tamer San. A scholar is included among the top collaborators of Tamer San based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Tamer San. Tamer San is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

18 of 18 papers shown
1.
Kim, Si Joon, Jaidah Mohan, Joy S. Lee, et al.. (2019). Stress-Induced Crystallization of Thin Hf1–XZrXO2 Films: The Origin of Enhanced Energy Density with Minimized Energy Loss for Lead-Free Electrostatic Energy Storage Applications. ACS Applied Materials & Interfaces. 11(5). 5208–5214. 31 indexed citations
2.
Bertolazzi, Simone, Paolo Bondavalli, Stephan Roche, et al.. (2019). Nonvolatile Memories Based on Graphene and Related 2D Materials. Advanced Materials. 31(10). e1806663–e1806663. 256 indexed citations
3.
Kim, Si Joon, Jaidah Mohan, Harrison Sejoon Kim, et al.. (2019). Effect of hydrogen derived from oxygen source on low-temperature ferroelectric TiN/Hf0.5Zr0.5O2/TiN capacitors. Applied Physics Letters. 115(18). 29 indexed citations
4.
Kim, Si Joon, Jaidah Mohan, Chadwin D. Young, et al.. (2018). Ferroelectric TiN/Hf0.5Zr0.5O2/TiN Capacitors with Low-Voltage Operation and High Reliability for Next-Generation FRAM Applications. 1–4. 28 indexed citations
5.
Kim, Si Joon, Jaidah Mohan, Jaebeom Lee, et al.. (2018). Effect of film thickness on the ferroelectric and dielectric properties of low-temperature (400 °C) Hf0.5Zr0.5O2 films. Applied Physics Letters. 112(17). 139 indexed citations
6.
Kim, Si Joon, Jaidah Mohan, Harrison Sejoon Kim, et al.. (2018). Low-voltage operation and high endurance of 5-nm ferroelectric Hf0.5Zr0.5O2 capacitors. Applied Physics Letters. 113(18). 73 indexed citations
7.
Kim, Si Joon, Dushyant Narayan, Jae‐Gil Lee, et al.. (2017). Low Temperature (400°c) Ferroelectric Hf0.5Zr0.5O2 Capacitors for Next-Generation FRAM Applications. 12 indexed citations
8.
Kim, Si Joon, Dushyant Narayan, Jae‐Gil Lee, et al.. (2017). Large ferroelectric polarization of TiN/Hf0.5Zr0.5O2/TiN capacitors due to stress-induced crystallization at low thermal budget. Applied Physics Letters. 111(24). 256 indexed citations
9.
Travieso-Rodríguez, J. Antonio, Michael Ball, H.C. Wen, et al.. (2016). High Temperature Data Retention of Ferroelectric Memory on 130nm and 180nm CMOS. 28. 1–4. 11 indexed citations
10.
11.
Udayakumar, Krishna, Tamer San, J. Antonio Travieso-Rodríguez, et al.. (2013). Low-power ferroelectric random access memory embedded in 180nm analog friendly CMOS technology. 128–131. 16 indexed citations
12.
Travieso-Rodríguez, J. Antonio, A. Venugopal, Michael Ball, et al.. (2013). 180nm FRAM reliability demonstration with ten years data retention at 125°C. MY.11.1–MY.11.5. 4 indexed citations
13.
Obradovic, B., Scott R. Summerfelt, Tamer San, et al.. (2010). Scaling reliability and modeling of ferroelectric capacitors. 2. 689–693. 2 indexed citations
14.
Surthi, Shyam, Xun Gong, Thomas Aquinas, et al.. (2009). Nanotechnology Conference and Trade Show. 9 indexed citations
15.
Ferain, Isabelle, Tamer San, C. Kerner, et al.. (2007). Treshold voltage modulation in FinFET devices through Arsenic Ion Implantation into TiN/HfSiON gate stack. 48. 31–32. 7 indexed citations
16.
Jurczak, M., Nadine Collaert, R. Rooyackers, et al.. (2006). MUGFET - alternative transistor architecture for 32 nm CMOS generation. 1–1. 1 indexed citations
17.
Keerthipala, W.W.L., et al.. (2002). Multi-modular multi-level pulse width modulated inverters. 1. 469–474. 3 indexed citations
18.
Strauss, T., et al.. (1994). Flash EPROM disturb mechanisms. 299–308. 51 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by Bong Jin Kuh Breakdown of academic impact, for papers by Fabio Carta Breakdown of academic impact, for papers by Kai‐Shin Li Breakdown of academic impact, for papers by Pei-Jer Tzeng Breakdown of academic impact, for papers by Lu Tai Breakdown of academic impact, for papers by Min‐Cheng Chen Breakdown of academic impact, for papers by R. Annunziata Breakdown of academic impact, for papers by Raik Hoffmann Breakdown of academic impact, for papers by Nanbo Gong Breakdown of academic impact, for papers by Masahiro Moniwa
Rankless by CCL
2026