E. Simoen

477 citations

44 papers · 382 indexed · h-index 12

Electrical and Electronic Engineering top 10%
- Semiconductor materials and devices 32
- Advancements in Semiconductor Devices and Circuit Design 28
- Integrated Circuits and Semiconductor Failure Analysis 17
- Silicon and Solar Cell Technologies 12
- Silicon Carbide Semiconductor Technologies 6
- Radiation Effects in Electronics 3
- Thin-Film Transistor Technologies 3
Atomic and Molecular Physics, and Optics
- Semiconductor materials and interfaces 8
Condensed Matter Physics
Electronic, Optical and Magnetic Materials
Biomedical Engineering

Co-authors: Cor Claeys C. Claeys L.K.J. Vandamme E.P. Vandamme R.J. Schreutelkamp Jan Vanhellemont N. Lukyanchikova N. Garbar
Cited by: Electrical and Electronic Engineering Atomic and Molecular Physics, and Optics Condensed Matter Physics
Journals: Semiconductor Science and Technology (6 papers)Solid-State Electronics (6 papers)Journal of The Electrochemical Society (5 papers)
Partner nations: Belgium Ukraine Japan

In The Last Decade

E. Simoen

43 papers receiving 364 citations

Peers

Countries citing papers authored by E. Simoen

Since Specialization

Citations

This map shows the geographic impact of E. Simoen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Simoen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Simoen more than expected).

Fields of papers citing papers by E. Simoen

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. Simoen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Simoen. The network helps show where E. Simoen may publish in the future.

Co-authorship network

The 25 scholars most cited alongside E. Simoen, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with E. Simoen Line = papers co-authored together E. Simoen links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Insights into Scaled Logic Devices Connected from Both Wafer Sides 2022 International Electron Devices Meeting (IEDM) ·A. Veloso,Geert Eneman,Prachand Man Pradhan,Bjorn Vermeersch,Anne Jourdain,余明,Barry O’Sullivan,Δημήτριος Ματραλής,A. De Keersgieter,E. Simoen,D. Radisic,Yusuke Oniki,A Shukairi,S. Brus,Eric Beyne,E. Dentoni Litta,Naoto Horiguchi	2022	4
2	Electrical Activity of Extended Defects in Relaxed In _x Ga _1−x As Hetero-Epitaxial Layers ECS Journal of Solid State Science and Technology ·Cor Claeys,Po-Chun Hsu,Y. Mols,清恵弘中,H. Bender,F. C. Seidel,Patrick Carolan,Clément Merckling,A. Alian,Niamh Waldron,Geert Eneman,Nadine Collaert,Marc Heyns,E. Simoen	2020	3
3	Deep Level Assessment of n-Type Si/SiO₂Metal-Oxide-Semiconductor Capacitors with Embedded Ge Quantum Dots ECS Journal of Solid State Science and Technology ·Mansour Aouassa,Henk Vrielinck,E. Simoen	2018	5
4	Deep Levels in W-Doped Czochralski Silicon ECS Journal of Solid State Science and Technology ·E. Simoen,佳久井料,Henk Vrielinck,Jeroen Lauwaert	2015	2
5	In depth static and low-frequency noise characterization of n-channel FinFETs on SOI substrates at cryogenic temperature Solid-State Electronics ·Juan Gómez Espinosa,B. Cretu,Jean‐Marc Routoure,R. Carin,Bhavin Chothani,杜瑞平,E. Simoen,C. Claeys	2014	7
6	A deep-level analysis of Ni–Au/AlN/(1 1 1) p⁺-Si metal–insulator–semiconductor capacitors Journal of Physics D Applied Physics ·E. Simoen,Domenica Visalli,M. Van Hove,Maarten Leys,G. Borghs	2011	15
7	High Purity Silicon 11 Electrochemical Society eBooks ·E. Simoen,Cor Claeys,R. Falster,C. Mazuré,Desi Kristina Natalia Sitompul	2010	2
8	On the Origin of the Excess Low-Frequency Noise in Graded-Channel Silicon-on-Insulator nMOSFETs IEEE Electron Device Letters ·E. Simoen,Cor Claeys,Tsung Ming Chung,Denis Flandre,Jean‐Pierre Raskin	2007	4
9	Investigation of back gate interface states by drain current hysteresis in PD-SOI n-MOSFETs Physica B Condensed Matter ·Ankita Pathak,George Paimpillil,Shuichi Okada,峯子文野,H. Ohyama,J.M. Rafı́,João Antônio Martino,A. Mercha,E. Simoen,C. Claeys	2006	7
10	Low-Frequency (1∕f) Noise Performance of n- and p-MOSFETs with Poly-Si∕Hf-Based Gate Dielectrics Journal of The Electrochemical Society ·P. Srinivasan,E. Simoen,L. Pantisano,Phramaha Papon Saengyoi,D. Misra	2006	21
11	Deep Levels in Oxygenated n-Type High-Resistivity FZ Silicon before and after a Low-Temperature Hydrogenation Step Journal of The Electrochemical Society ·E. Simoen,Cor Claeys,R. Job,A. Ulyashin,W. R. Fahrner,G. Tonelli,Aghayali Amir,P. Clauws	2003	11
12	γ-irradiation hardness of short-channel nMOSFETs fabricated in a 0.5 SOI technology Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·Cor Claeys,E. Simoen,A. A. Efremov,В. Г. Литовченко,А.А. Еvtukh,Guk-Hyun Suh,Ju. Rassamakin	2002	4
13	Impact of advanced processing modules on the low-frequency noise performance of deep-submicron CMOS technologies Microelectronics Reliability ·C. Claeys,E. Simoen	2000	3
14	Electrical Quality Assessment of Epitaxial Wafers Based on p-n Junction Diagnostics Journal of The Electrochemical Society ·Cor Claeys,E. Simoen,Amporn Poyai,美子芝尾	1999	5
15	Degradation of MOSFETs on SIMOX by irradiation Journal of Radioanalytical and Nuclear Chemistry ·Kathryn Lunn,H. Ohyama,E. Simoen,C. Claeys,Eunices Pauleth Mendoza Donoso,K. Kawamura,清水正元,Y. Takami	1999	2
16	Non-trivial GR and 1/fnoise generated in the p-Si layer of SOI and SOS MOSFETs near the inverted front or buried p-Si/SiO₂interface Semiconductor Science and Technology ·N. Lukyanchikova,A. Andreassi,N. Garbar,E. Simoen,C. Claeys	1999	16
17	Perspectives of the cryo-electronics for the year 2000 Edmundo A. Gutiérrez-D,C. Claeys,E. Simoen,S. Koshevaya	1998	1
18	The response of Si p - n junction diodes to proton irradiation Semiconductor Science and Technology ·E. Simoen,Jan Vanhellemont,C. Claeys,A. J. da Silva,E. Gaubas	1996	10
19	On the relationship between the bulk recombination lifetime and the excess noise in silicon p-n junction diodes Solid State Communications ·E. Simoen,Jan Vanhellemont,C. Claeys	1996	3
20	A new method for determining the front and back interface trap densities of accumulation mode SOI MOSFETs at 77K Solid-State Electronics ·João Antônio Martino,E. Simoen,Cor Claeys	1995	5

About E. Simoen

E. Simoen is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Ceramics and Composites, Condensed Matter Physics and Biomedical Engineering, having authored 44 papers that have together received 382 indexed citations. Recurring topics across this work include Semiconductor materials and devices (32 papers), Advancements in Semiconductor Devices and Circuit Design (28 papers), Integrated Circuits and Semiconductor Failure Analysis (17 papers), Silicon and Solar Cell Technologies (12 papers), Semiconductor materials and interfaces (8 papers), Silicon Carbide Semiconductor Technologies (6 papers), Radiation Effects in Electronics (3 papers) and Thin-Film Transistor Technologies (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (370 citations), Atomic and Molecular Physics, and Optics (63 citations), Condensed Matter Physics (17 citations), Electronic, Optical and Magnetic Materials (19 citations) and Biomedical Engineering (42 citations). E. Simoen has collaborated with scholars based in Belgium, Ukraine and Japan. Frequent co-authors include Cor Claeys, C. Claeys, L.K.J. Vandamme, E.P. Vandamme, R.J. Schreutelkamp, C. Claeys, Jan Vanhellemont, N. Lukyanchikova, N. Garbar and Geert Eneman. Their work appears in journals such as Semiconductor Science and Technology, Solid-State Electronics, Journal of The Electrochemical Society, ECS Journal of Solid State Science and Technology and Physica B Condensed Matter.

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