Gayle Murdoch
-
- Copper Interconnects and Reliability 26
-
- Semiconductor materials and devices 23
- 3D IC and TSV technologies 11
- Advancements in Photolithography Techniques 10
- Electronic Packaging and Soldering Technologies 7
-
- Optical Coatings and Gratings 4
-
- Semiconductor materials and interfaces 6
-
- Metal and Thin Film Mechanics 5
- Co-authors
- Zsolt TökeiQuoc Toan LeZheng LuMichael G. HelanderMark GreinerChristopher J. WilsonJ. BömmelsFrédéric Lazzarino
- Cited by
- Electronic, Optical and Magnetic MaterialsElectrical and Electronic EngineeringSurfaces, Coatings and Films
- Journals
- Applied Physics Letters (3 papers)IEEE Electron Device Letters (1 paper)Microelectronic Engineering (1 paper)
- Partner nations
- BelgiumNetherlandsUnited States
In The Last Decade
Gayle Murdoch
31 papers receiving 324 citations
Peers
Comparison fields: 5 of 32
- Electronic, Optical and Magnetic Materials 131
- Electrical and Electronic Engineering 296
- Surfaces, Coatings and Films 16
- Atomic and Molecular Physics, and Optics 64
- Materials Chemistry 69
Countries citing papers authored by Gayle Murdoch
This map shows the geographic impact of Gayle Murdoch's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Gayle Murdoch with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Gayle Murdoch more than expected).
Fields of papers citing papers by Gayle Murdoch
This network shows the impact of papers produced by Gayle Murdoch. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Gayle Murdoch. The network helps show where Gayle Murdoch may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Gayle Murdoch, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 1 | |
| 2 | 2024 | 0 | |
| 3 | 2024 | 0 | |
| 4 | 2023 | 3 | |
| 5 | 2023 | 0 | |
| 6 | 2022 | 5 | |
| 7 | 2022 | 25 | |
| 8 | 2021 | 5 | |
| 9 | 2020 | 19 | |
| 10 | 2018 | 6 | |
| 11 | 2018 | 22 | |
| 12 | 2017 | 27 | |
| 13 | 2017 | 7 | |
| 14 | 2016 | 3 | |
| 15 | 2016 | 13 | |
| 16 | 2015 | 25 | |
| 17 | 2015 | 9 | |
| 18 | 2015 | 1 | |
| 19 | Advanced 300-mm waferscale patterning for silicon photonics devices with record low loss and phase errors | 2012 | 23 |
| 20 | 2008 | 48 |
About Gayle Murdoch
Gayle Murdoch is a scholar working on Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering, Surfaces, Coatings and Films, Mechanics of Materials and Atomic and Molecular Physics, and Optics, having authored 39 papers that have together received 346 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (26 papers), Semiconductor materials and devices (23 papers), 3D IC and TSV technologies (11 papers), Advancements in Photolithography Techniques (10 papers), Electronic Packaging and Soldering Technologies (7 papers), Semiconductor materials and interfaces (6 papers), Metal and Thin Film Mechanics (5 papers) and Optical Coatings and Gratings (4 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (131 citations), Electrical and Electronic Engineering (296 citations), Surfaces, Coatings and Films (16 citations), Atomic and Molecular Physics, and Optics (64 citations) and Materials Chemistry (69 citations). Gayle Murdoch has collaborated with scholars based in Belgium, Netherlands and United States. Frequent co-authors include Zsolt Tökei, Quoc Toan Le, Zheng Lu, Michael G. Helander, Mark Greiner, Christopher J. Wilson, J. Bömmels, Frédéric Lazzarino, William F. Clark and Stefan Decoster. Their work appears in journals such as Applied Physics Letters, IEEE Electron Device Letters, Microelectronic Engineering, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena and Microelectronics Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.