Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies
if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the
same subfield and year (this is the minimum needed to enter the top 1%, not the average
within it), or reaches the top citation threshold in at least one of its specific research
topics.
Low dielectric constant materials for microelectronics
20031.4k citationsMikhaı̈l R. Baklanov, Denis Shamiryan et al.profile →
Peers — A (Enhanced Table)
Peers by citation overlap · career bar shows stage (early→late)
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Countries citing papers authored by Mikhaı̈l R. Baklanov
Since
Specialization
Citations
This map shows the geographic impact of Mikhaı̈l R. Baklanov's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Mikhaı̈l R. Baklanov with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Mikhaı̈l R. Baklanov more than expected).
Fields of papers citing papers by Mikhaı̈l R. Baklanov
This network shows the impact of papers produced by Mikhaı̈l R. Baklanov. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Mikhaı̈l R. Baklanov. The network helps show where Mikhaı̈l R. Baklanov may publish in the future.
Co-authorship network of co-authors of Mikhaı̈l R. Baklanov
This figure shows the co-authorship network connecting the top 25 collaborators of Mikhaı̈l R. Baklanov.
A scholar is included among the top collaborators of Mikhaı̈l R. Baklanov based on the total number of
citations received by their joint publications. Widths of edges
represent the number of papers authors have co-authored together.
Node borders
signify the number of papers an author published with Mikhaı̈l R. Baklanov. Mikhaı̈l R. Baklanov is excluded from
the visualization to improve readability, since they are connected to all nodes in the network.
Mironov, A. Yu., J. G. Rodrigo, Hermann Suderow, et al.. (2020). Superconductivity in a disordered metal with unscreened Coulomb interactions. arXiv (Cornell University).1 indexed citations
Baklanov, Mikhaı̈l R., et al.. (2012). Materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics--2011 : symposium held April 25-29, 2011, San Francisco, California, U.S.A.. Cambridge University Press eBooks.
14.
Zhao, Larry, et al.. (2011). Direct observation of the 1/E dependence of time dependent. Applied Physics Letters. 98(3). 32107.5 indexed citations
15.
Urbanowicz, Adam, et al.. (2010). Mechanism of k-value Reduction of PECVD Low-k Films Treated with He/H2 Ash Plasma. Lirias (KU Leuven).2 indexed citations
16.
Sacépé, Benjamin, C. Chapelier, T. I. Baturina, et al.. (2009). Fluctuation-induced pseudogap in thin conventional superconducting films. arXiv (Cornell University).1 indexed citations
Baklanov, Mikhaı̈l R. & K. P. Mogilnikov. (2000). Characterization of porous dielectric films by ellipsometric porosimetry.. Optica Applicata. 30. 491–494.6 indexed citations
Baklanov, Mikhaı̈l R., et al.. (1974). Initiation of a surface chemical reaction between single-crystal germanium and bromine gas by using a powerful argon laser. Soviet physics. Doklady. 19. 312.2 indexed citations
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive
bibliographic database. While OpenAlex provides broad and valuable coverage of the global
research landscape, it—like all bibliographic datasets—has inherent limitations. These include
incomplete records, variations in author disambiguation, differences in journal indexing, and
delays in data updates. As a result, some metrics and network relationships displayed in
Rankless may not fully capture the entirety of a scholar's output or impact.