D. Blin

505 citations
8 papers · 433 indexed · h-index 7

D. Blin

8 papers receiving 420 citations

Peers

D. Blin
Comparison fields: 5 of 26
  • Electrical and Electronic Engineering 412
  • Materials Chemistry 186
  • Surfaces, Coatings and Films 19
  • Electronic, Optical and Magnetic Materials 48
  • Atomic and Molecular Physics, and Optics 52
Replace Chia Ching Yeo with:
Chia Ching Yeo Singapore
Yusaku Kashiwagi Japan
Stefanie Sergeant Belgium
Seok-Jun Won South Korea
Dara Bobb-Semple United States
Z.S. Houweling Netherlands
S.N. Singh India
Austin S. Lyons United States
Zhong Zhi You China
M. S. Joo Singapore
D. Blin relative to Chia Ching Yeo Singapore Chia Ching Yeo's profile →
Citations per field
00.5×4.7×
Chia Ching Yeo · 1×
Citations per year

Countries citing papers authored by D. Blin

Since Specialization
Citations

This map shows the geographic impact of D. Blin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Blin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Blin more than expected).

Fields of papers citing papers by D. Blin

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. Blin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Blin. The network helps show where D. Blin may publish in the future.

Co-authorship network

The 25 scholars most cited alongside D. Blin, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with D. Blin Line = papers co-authored together D. Blin links everyone, so they are left out of the graph.

All Works

8 of 8 papers shown
#Work
1 2008127
2
3D passive and heterogeneous integration technology options for system-in-package
20073
3 200722
4 20049
5 200418
6 200363
7 20027
8 2002184

About D. Blin

D. Blin is a scholar working on Hardware and Architecture, Surfaces, Coatings and Films and Electrical and Electronic Engineering, having authored 8 papers that have together received 433 indexed citations. Recurring topics across this work include Semiconductor materials and devices (7 papers), Electronic and Structural Properties of Oxides (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), Advancements in Semiconductor Devices and Circuit Design (2 papers), Advanced Memory and Neural Computing (2 papers), Copper Interconnects and Reliability (1 paper), Ferroelectric and Negative Capacitance Devices (1 paper) and Semiconductor materials and interfaces (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (412 citations), Materials Chemistry (186 citations) and Surfaces, Coatings and Films (19 citations). D. Blin has collaborated with scholars based in France, Netherlands and South Korea. Frequent co-authors include O. Renault, S. Marthon, F. Martín, J.-F. Damlencourt, N. Barrett, P. Besson, J.H. Klootwijk, F. Roozeboom, K. B. Jinesh and R.G.R. Weemaes. Their work appears in journals such as Thin Solid Films, IEEE Electron Device Letters, The European Physical Journal B, Applied Physics Letters and Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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