O. Musseau
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing 3
-
- Radiation Effects in Electronics 39
- Semiconductor materials and devices 37
- Advancements in Semiconductor Devices and Circuit Design 36
- Integrated Circuits and Semiconductor Failure Analysis 23
- Electrostatic Discharge in Electronics 5
- Advanced Memory and Neural Computing 3
- Radiation top 10%
- Nuclear Physics and Applications 3
- Co-authors
- J.L. LerayV. Ferlet-CavroisJ.L. PelloieYves‐Marie CoïcO. FlamentS. BüchnerA.B. CampbellM.R. Shaneyfelt
- Journals
- IEEE Transactions on Electron Devices (1 paper)IEEE Electron Device Letters (2 papers)Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms (1 paper)
- Partner nations
- FranceUnited StatesGermany
In The Last Decade
O. Musseau
62 papers receiving 1.0k citations
Peers
Comparison fields: 5 of 34
- Hardware and Architecture 179
- Electrical and Electronic Engineering 1.0k
- Radiation 44
- Nuclear and High Energy Physics 34
- Materials Chemistry 80
Countries citing papers authored by O. Musseau
This map shows the geographic impact of O. Musseau's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by O. Musseau with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites O. Musseau more than expected).
Fields of papers citing papers by O. Musseau
This network shows the impact of papers produced by O. Musseau. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by O. Musseau. The network helps show where O. Musseau may publish in the future.
Co-authorship network
The 25 scholars most cited alongside O. Musseau, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2005 | 4 | |
| 2 | 2005 | 4 | |
| 3 | 2002 | 5 | |
| 4 | 2002 | 1 | |
| 5 | 2002 | 5 | |
| 6 | 2002 | 10 | |
| 7 | 2002 | 45 | |
| 8 | 2002 | 2 | |
| 9 | 2000 | 41 | |
| 10 | 2000 | 7 | |
| 11 | 1999 | 7 | |
| 12 | 1998 | 6 | |
| 13 | 1997 | 6 | |
| 14 | 1996 | 4 | |
| 15 | 1996 | 18 | |
| 16 | 1996 | 2 | |
| 17 | 1994 | 8 | |
| 18 | 1994 | 44 | |
| 19 | 1993 | 27 | |
| 20 | 1992 | 10 |
About O. Musseau
O. Musseau is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Radiation, having authored 64 papers that have together received 1.1k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (39 papers), Semiconductor materials and devices (37 papers), Advancements in Semiconductor Devices and Circuit Design (36 papers), Integrated Circuits and Semiconductor Failure Analysis (23 papers), Electrostatic Discharge in Electronics (5 papers), Advanced Memory and Neural Computing (3 papers), VLSI and Analog Circuit Testing (3 papers) and Nuclear Physics and Applications (3 papers). The work is most often cited by research in Hardware and Architecture (179 citations), Electrical and Electronic Engineering (1.0k citations) and Radiation (44 citations). O. Musseau has collaborated with scholars based in France, United States and Germany. Frequent co-authors include J.L. Leray, V. Ferlet-Cavrois, J.L. Pelloie, Yves‐Marie Coïc, O. Flament, S. Büchner, A.B. Campbell, M.R. Shaneyfelt, Philippe Paillet and C. Raynaud. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Electron Device Letters and Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.