M. Bruel
Impact in
-
- Semiconductor materials and devices
- Silicon and Solar Cell Technologies
- Integrated Circuits and Semiconductor Failure Analysis
- Thin-Film Transistor Technologies
- Advancements in Semiconductor Devices and Circuit Design
- Computational Mechanics top 2%
- Ion-surface interactions and analysis
Papers in
-
- Silicon and Solar Cell Technologies 38
- Semiconductor materials and devices 33
- Integrated Circuits and Semiconductor Failure Analysis 21
- Thin-Film Transistor Technologies 12
- Advancements in Semiconductor Devices and Circuit Design 12
- 3D IC and TSV technologies 7
-
- Ion-surface interactions and analysis 12
- Co-authors
- C. JaussaudJ. MargailJ. StoëmenosA.J. Auberton‐HervéB. AsparA.M. PaponY. Le TiecL. Di Cioccio
In The Last Decade
M. Bruel
56 papers receiving 2.3k citations
Hit Papers
Peers
Comparison fields: 5 of 47
- Electrical and Electronic Engineering 2.3k
- Computational Mechanics 393
- Atomic and Molecular Physics, and Optics 463
- Materials Chemistry 559
- Biomedical Engineering 378
Countries citing papers authored by M. Bruel
This map shows the geographic impact of M. Bruel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Bruel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Bruel more than expected).
Fields of papers citing papers by M. Bruel
This network shows the impact of papers produced by M. Bruel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Bruel. The network helps show where M. Bruel may publish in the future.
Co-authorship network
The 25 scholars most cited alongside M. Bruel, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2015 | 3 | |
| 2 | 2003 | 1 | |
| 3 | 1999 | 43 | |
| 4 | 1998 | 65 | |
| 5 | 1998 | 19 | |
| 6 | SMART-CUT: The Basic Fabrication Process for UNIBOND SOI Wafers | 1997 | 13 |
| 7 | 1997 | 184 | |
| 8 | 1997 | 31 | |
| 9 | 1996 | 25 | |
| 10 | A 16×16 bits Multiplier in 0.5μm CMOS technology | 1991 | 1 |
| 11 | 1989 | 0 | |
| 12 | 1988 | 8 | |
| 13 | 1988 | 20 | |
| 14 | 1987 | 10 | |
| 15 | 1987 | 7 | |
| 16 | 1985 | 5 | |
| 17 | 1985 | 2 | |
| 18 | 1979 | 2 | |
| 19 | Ion implantation in semiconductors and other materials | 1977 | 16 |
| 20 | 1973 | 3 |
About M. Bruel
M. Bruel is a scholar working on Electrical and Electronic Engineering, Computational Mechanics, Biomedical Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films, having authored 60 papers that have together received 2.5k indexed citations. Recurring topics across this work include Silicon and Solar Cell Technologies (38 papers), Semiconductor materials and devices (33 papers), Integrated Circuits and Semiconductor Failure Analysis (21 papers), Ion-surface interactions and analysis (12 papers), Thin-Film Transistor Technologies (12 papers), Advancements in Semiconductor Devices and Circuit Design (12 papers), 3D IC and TSV technologies (7 papers) and Semiconductor materials and interfaces (5 papers). The work is most often cited by research in Electrical and Electronic Engineering (2.3k citations), Computational Mechanics (393 citations), Atomic and Molecular Physics, and Optics (463 citations), Materials Chemistry (559 citations) and Biomedical Engineering (378 citations). M. Bruel has collaborated with scholars based in France, Greece and Italy. Frequent co-authors include C. Jaussaud, J. Margail, J. Stoëmenos, A.J. Auberton‐Hervé, B. Aspar, A.M. Papon, Y. Le Tiec, L. Di Cioccio, F. Letertre and H. Moriceau. Their work appears in journals such as Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Electronics Letters, Applied Physics Letters, IEEE Transactions on Nuclear Science and Journal of Radioanalytical and Nuclear Chemistry.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.