J.L. Leray

603 citations
28 papers · 441 indexed · h-index 12
Topics
Semiconductor materials and devices (25 papers)Advancements in Semiconductor Devices and Circuit Design (17 papers)Integrated Circuits and Semiconductor Failure Analysis (9 papers)

In The Last Decade

J.L. Leray

28 papers receiving 421 citations

Peers

J.L. Leray
Comparison fields: 5 of 40
  • Electrical and Electronic Engineering 407
  • Materials Chemistry 108
  • Electronic, Optical and Magnetic Materials 40
  • Biomedical Engineering 20
  • Mechanics of Materials 18
Replace M.C. Habrard with:
M.C. Habrard France
R.K. Freitag United States
F. Pio Italy
P. Mutti Italy
A. Peeva Germany
J. D. Parsons United States
K. P. Bastos Brazil
Isao Tsunoda Japan
Christoph Buchal Germany
Akimasa Kinoshita Japan
J.L. Leray relative to M.C. Habrard France M.C. Habrard's profile →
Citations per field
00.5×3.1×
M.C. Habrard · 1×
Citations per year

Countries citing papers authored by J.L. Leray

Since Specialization
Citations

This map shows the geographic impact of J.L. Leray's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.L. Leray with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.L. Leray more than expected).

Fields of papers citing papers by J.L. Leray

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J.L. Leray. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.L. Leray. The network helps show where J.L. Leray may publish in the future.

Co-authorship network of co-authors of J.L. Leray

This figure shows the co-authorship network connecting the top 25 collaborators of J.L. Leray. A scholar is included among the top collaborators of J.L. Leray based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J.L. Leray. J.L. Leray is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1
Proceedings of the 17. European Conference on Radiation and Its Effects on Components and Systems (RADECS 2017)
4
2 2
3 7
4 1
5
Effects of irradiation and isochronal anneal temperature on hole and electron trapping in MOS devices
1
6 14
7 12
8 13
9 59
10
Annealing of Stress-Induced Interface and Border Traps in MOS Devices: A Charge-Pumping Study
5
11 26
12 2
13 27
14 11
15 2
16 10
17 2
18 9
19 10
20 46

About J.L. Leray

J.L. Leray is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Materials Chemistry, having authored 28 papers that have together received 441 indexed citations. Recurring topics across this work include Semiconductor materials and devices (25 papers), Advancements in Semiconductor Devices and Circuit Design (17 papers) and Integrated Circuits and Semiconductor Failure Analysis (9 papers). The work is most often cited by research in Electrical and Electronic Engineering (407 citations), Ceramics and Composites (16 citations) and Materials Chemistry (108 citations). J.L. Leray has collaborated with scholars based in France, Switzerland and United States. Frequent co-authors include R. A. B. Devine, P. Paillet, Jean‐Luc Autran, O. Flament, J. Margail, O. Musseau, L. Vallier, V. Ferlet-Cavrois, A.J. Auberton‐Hervé and J.L. Pelloie. Their work appears in journals such as Applied Physics Letters, Journal of Non-Crystalline Solids and Journal of Crystal Growth.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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