O. Flament
- Electrical and Electronic Engineering top 5%
- Hardware and Architecture top 5%
- Radiation top 10%
- Materials Chemistry
- Nuclear and High Energy Physics
- Topics
- Semiconductor materials and devices (43 papers)Radiation Effects in Electronics (37 papers)Integrated Circuits and Semiconductor Failure Analysis (34 papers)
- Journals
- Applied Physics LettersNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and AtomsSolid-State Electronics
- Partner nations
- FranceUnited StatesItaly
In The Last Decade
O. Flament
60 papers receiving 967 citations
Peers
Comparison fields: 5 of 35
- Electrical and Electronic Engineering 989
- Hardware and Architecture 121
- Radiation 84
- Materials Chemistry 50
- Nuclear and High Energy Physics 47
Countries citing papers authored by O. Flament
This map shows the geographic impact of O. Flament's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by O. Flament with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites O. Flament more than expected).
Fields of papers citing papers by O. Flament
This network shows the impact of papers produced by O. Flament. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by O. Flament. The network helps show where O. Flament may publish in the future.
Co-authorship network of co-authors of O. Flament
This figure shows the co-authorship network connecting the top 25 collaborators of O. Flament. A scholar is included among the top collaborators of O. Flament based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with O. Flament. O. Flament is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 2 | |
| 3 | 30 | |
| 4 | 20 | |
| 5 | 24 | |
| 6 | 14 MeV Neutron-Induced SEU in SRAM Devices | 1 |
| 7 | 36 | |
| 8 | 25 | |
| 9 | 6 | |
| 10 | 49 | |
| 11 | 10 | |
| 12 | 3 | |
| 13 | 7 | |
| 14 | 13 | |
| 15 | 4 | |
| 16 | 18 | |
| 17 | 9 | |
| 18 | 27 | |
| 19 | 10 | |
| 20 | 2 |
About O. Flament
O. Flament is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Radiation, having authored 61 papers that have together received 1.0k indexed citations. Recurring topics across this work include Semiconductor materials and devices (43 papers), Radiation Effects in Electronics (37 papers) and Integrated Circuits and Semiconductor Failure Analysis (34 papers). The work is most often cited by research in Hardware and Architecture (121 citations), Electrical and Electronic Engineering (989 citations) and Radiation (84 citations). O. Flament has collaborated with scholars based in France, United States and Italy. Frequent co-authors include V. Ferlet-Cavrois, J.L. Leray, J. Baggio, O. Musseau, A. Torres, P. Paillet, J.L. Leray, O. Faynot, J.L. Pelloie and Daniel M. Fleetwood. Their work appears in journals such as Applied Physics Letters, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms and Solid-State Electronics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.