R. Clerc

1.7k total citations
89 papers, 1.2k citations indexed

About

R. Clerc is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Polymers and Plastics. According to data from OpenAlex, R. Clerc has authored 89 papers receiving a total of 1.2k indexed citations (citations by other indexed papers that have themselves been cited), including 75 papers in Electrical and Electronic Engineering, 15 papers in Atomic and Molecular Physics, and Optics and 8 papers in Polymers and Plastics. Recurrent topics in R. Clerc's work include Advancements in Semiconductor Devices and Circuit Design (53 papers), Semiconductor materials and devices (53 papers) and Integrated Circuits and Semiconductor Failure Analysis (19 papers). R. Clerc is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (53 papers), Semiconductor materials and devices (53 papers) and Integrated Circuits and Semiconductor Failure Analysis (19 papers). R. Clerc collaborates with scholars based in France, Italy and United States. R. Clerc's co-authors include G. Ghibaudo, G. Pananakakis, A. Tsormpatzoglou, C.A. Dimitriadis, Quentin Rafhay, Pierpaolo Palestri, L. Selmi, S. Cristoloveanu, Mathieu Hébert and Akiko Ohata and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Advanced Functional Materials.

In The Last Decade

R. Clerc

86 papers receiving 1.2k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
R. Clerc France 20 1.1k 181 134 131 122 89 1.2k
Yunlong Liu China 12 686 0.6× 81 0.4× 70 0.5× 418 3.2× 121 1.0× 65 797
Pradeep Kumar United States 13 356 0.3× 71 0.4× 134 1.0× 157 1.2× 65 0.5× 54 561
E. Hourdakis Greece 15 467 0.4× 139 0.8× 164 1.2× 319 2.4× 63 0.5× 41 626
Renato Amaral Minamisawa Switzerland 14 1.0k 0.9× 331 1.8× 396 3.0× 266 2.0× 23 0.2× 87 1.2k
Louay A. Eldada United States 15 1.4k 1.3× 378 2.1× 281 2.1× 150 1.1× 133 1.1× 105 1.6k
Roy Verbeek Netherlands 12 489 0.5× 66 0.4× 129 1.0× 280 2.1× 110 0.9× 23 623
Yabin Sun China 14 870 0.8× 66 0.4× 187 1.4× 472 3.6× 31 0.3× 105 1.1k
Byoungdeog Choi South Korea 17 824 0.8× 103 0.6× 162 1.2× 403 3.1× 71 0.6× 137 1000
Youngjae Kim South Korea 14 430 0.4× 198 1.1× 129 1.0× 159 1.2× 45 0.4× 79 636
Paul Ruchhoeft United States 16 478 0.4× 207 1.1× 417 3.1× 115 0.9× 32 0.3× 59 837

Countries citing papers authored by R. Clerc

Since Specialization
Citations

This map shows the geographic impact of R. Clerc's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Clerc with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Clerc more than expected).

Fields of papers citing papers by R. Clerc

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. Clerc. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Clerc. The network helps show where R. Clerc may publish in the future.

Co-authorship network of co-authors of R. Clerc

This figure shows the co-authorship network connecting the top 25 collaborators of R. Clerc. A scholar is included among the top collaborators of R. Clerc based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. Clerc. R. Clerc is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
2.
Simonot, Lionel, et al.. (2023). Estimation of the fluorescence emission spectrum of dental composite resin samples of varying thickness. Electronic Imaging. 35(15). 190–1. 1 indexed citations
4.
Golanski, Dominique, et al.. (2021). An analytical solution for McIntyre’s model of avalanche triggering probability for SPAD compact modeling and performance exploration. Semiconductor Science and Technology. 36(8). 85008–85008. 2 indexed citations
5.
Clerc, R., et al.. (2021). On the minimum thickness of doped electron/hole transport layers in organic semiconductor devices. Journal of Applied Physics. 130(12).
6.
Clerc, R., et al.. (2020). Reflectance and transmittance of flowable dental resin composite predicted by the two-flux model: on the importance of analyzing the effective measurement geometry. HAL (Le Centre pour la Communication Scientifique Directe). 3 indexed citations
7.
Clerc, R., et al.. (2018). Three-dimensional hyperspectral imaging: a new method for human face acquisition. Electronic Imaging. 30(8). 152–1. 7 indexed citations
8.
Lechêne, Balthazar, R. Clerc, & Ana Claudia Arias. (2017). Theoretical analysis and characterization of the energy conversion and storage efficiency of photo-supercapacitors. Solar Energy Materials and Solar Cells. 172. 202–212. 19 indexed citations
9.
Hébert, Mathieu, et al.. (2016). Model-based Skin Pigment Cartography by High-Resolution Hyperspectral Imaging. Journal of Imaging Science and Technology. 60(6). 60404–1. 7 indexed citations
10.
Coignus, J., Cédric Leroux, R. Clerc, et al.. (2010). HfO2-based gate stacks transport mechanisms and parameter extraction. Solid-State Electronics. 54(9). 972–978. 1 indexed citations
11.
Griffin, Patrick, et al.. (2010). Performance and analytical modeling of Metal–Insulator-Metal Field Controlled Tunnel Transistors. Solid-State Electronics. 54(12). 1525–1531. 2 indexed citations
12.
Tsormpatzoglou, A., C.A. Dimitriadis, R. Clerc, G. Pananakakis, & G. Ghibaudo. (2008). Semianalytical Modeling of Short-Channel Effects in Lightly Doped Silicon Trigate MOSFETs. IEEE Transactions on Electron Devices. 55(10). 2623–2631. 55 indexed citations
13.
Tsormpatzoglou, A., C.A. Dimitriadis, R. Clerc, G. Pananakakis, & G. Ghibaudo. (2008). Threshold Voltage Model for Short-Channel Undoped Symmetrical Double-Gate MOSFETs. IEEE Transactions on Electron Devices. 55(9). 2512–2516. 80 indexed citations
14.
Eminente, S., et al.. (2007). Ultra-thin fully-depleted SOI MOSFETs: Special charge properties and coupling effects. Solid-State Electronics. 51(2). 239–244. 90 indexed citations
15.
Bajolet, A., S. Bruyère, R. Clerc, et al.. (2006). Impact of TiN post-treatment on metal insulator metal capacitor performances. Microelectronic Engineering. 83(11-12). 2189–2194. 11 indexed citations
16.
Palestri, Pierpaolo, David Esseni, A. Abramo, R. Clerc, & L. Selmi. (2004). Carrier quantization in SOI MOSFETs using an effective potential based Monte-Carlo tool. IRIS UNIMORE (University of Modena and Reggio Emilia). 407–410. 11 indexed citations
17.
Clerc, R., Alessandro S. Spinelli, G. Ghibaudo, & G. Pananakakis. (2002). Theory of direct tunneling current in metal–oxide–semiconductor structures. Journal of Applied Physics. 91(3). 1400–1409. 51 indexed citations
18.
Leroux, Cédric, G. Ghibaudo, G. Reimbold, R. Clerc, & S. Mathieu. (2001). Extraction of oxide thickness in the nanometer range using C(V) characteristics. Microelectronic Engineering. 59(1-4). 277–283. 1 indexed citations
19.
Clerc, R., G. Ghibaudo, C. Caillat, et al.. (2000). Capacitance–Voltage (C–V) characterization of 20 Å thick gate oxide: parameter extraction and modeling. Microelectronics Reliability. 40(4-5). 571–575. 8 indexed citations
20.
Clerc, R.. (1995). Le haut risque allergique en milieu scolaire. Revue Française d Allergologie et d Immunologie Clinique. 35(3). 289–292. 10 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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