Alain Moussa
- Electrical and Electronic Engineering top 5%
- Atomic and Molecular Physics, and Optics top 5%
- Materials Chemistry
- Biomedical Engineering top 10%
- Surfaces, Coatings and Films top 2%
- Co-authors
- Alain M. JonasAndré LaschewskyKarine GlinelWilfried VandervorstH. BenderAlexis FranquetRoger LooMatty Caymax
- Topics
- Semiconductor materials and devices (47 papers)Integrated Circuits and Semiconductor Failure Analysis (31 papers)Advancements in Photolithography Techniques (19 papers)
- Cited by
- Surfaces, Coatings and FilmsElectrical and Electronic EngineeringAtomic and Molecular Physics, and Optics
- Partner nations
- BelgiumNetherlandsGermany
In The Last Decade
Alain Moussa
101 papers receiving 1.3k citations
Peers
Comparison fields: 5 of 59
- Electrical and Electronic Engineering 958
- Atomic and Molecular Physics, and Optics 386
- Materials Chemistry 343
- Biomedical Engineering 268
- Surfaces, Coatings and Films 242
Countries citing papers authored by Alain Moussa
This map shows the geographic impact of Alain Moussa's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Alain Moussa with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Alain Moussa more than expected).
Fields of papers citing papers by Alain Moussa
This network shows the impact of papers produced by Alain Moussa. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Alain Moussa. The network helps show where Alain Moussa may publish in the future.
Co-authorship network of co-authors of Alain Moussa
This figure shows the co-authorship network connecting the top 25 collaborators of Alain Moussa. A scholar is included among the top collaborators of Alain Moussa based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Alain Moussa. Alain Moussa is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 4 | |
| 3 | 3 | |
| 4 | 0 | |
| 5 | 0 | |
| 6 | 2 | |
| 7 | 1 | |
| 8 | 7 | |
| 9 | 45 | |
| 10 | 3 | |
| 11 | 2 | |
| 12 | 10 | |
| 13 | 3 | |
| 14 | 9 | |
| 15 | 1 | |
| 16 | 23 | |
| 17 | 26 | |
| 18 | 18 | |
| 19 | 40 | |
| 20 | 1 |
About Alain Moussa
Alain Moussa is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Electrochemistry, having authored 112 papers that have together received 1.3k indexed citations. Recurring topics across this work include Semiconductor materials and devices (47 papers), Integrated Circuits and Semiconductor Failure Analysis (31 papers) and Advancements in Photolithography Techniques (19 papers). The work is most often cited by research in Surfaces, Coatings and Films (242 citations), Electrical and Electronic Engineering (958 citations) and Atomic and Molecular Physics, and Optics (386 citations). Alain Moussa has collaborated with scholars based in Belgium, Netherlands and Germany. Frequent co-authors include Alain M. Jonas, André Laschewsky, Karine Glinel, Wilfried Vandervorst, H. Bender, Alexis Franquet, Roger Loo, Matty Caymax, Sven Van Elshocht and Jean‐Louis Habib‐Jiwan. Their work appears in journals such as Advanced Materials, Journal of Applied Physics and Chemistry of Materials.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.