Mark C. Benjamin

863 total citations · 1 hit paper
23 papers, 742 citations indexed

About

Mark C. Benjamin is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, Mark C. Benjamin has authored 23 papers receiving a total of 742 indexed citations (citations by other indexed papers that have themselves been cited), including 18 papers in Electrical and Electronic Engineering, 8 papers in Condensed Matter Physics and 7 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in Mark C. Benjamin's work include Semiconductor materials and devices (14 papers), GaN-based semiconductor devices and materials (8 papers) and Ga2O3 and related materials (6 papers). Mark C. Benjamin is often cited by papers focused on Semiconductor materials and devices (14 papers), GaN-based semiconductor devices and materials (8 papers) and Ga2O3 and related materials (6 papers). Mark C. Benjamin collaborates with scholars based in United States, France and Japan. Mark C. Benjamin's co-authors include R. J. Nemanich, R. F. Davis, Sean W. King, Cheng Wang, Carsten Ronning, Matthew Powers, Lisa M. Porter, J. J. Cuomo, Stephen J. Harris and Gary L. Doll and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

Mark C. Benjamin

21 papers receiving 716 citations

Hit Papers

Observation of a negative electron affinity for heteroepi... 1994 2026 2004 2015 1994 50 100 150

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Mark C. Benjamin United States 12 401 373 338 165 155 23 742
Y.P. Hsu Taiwan 17 307 0.8× 379 1.0× 577 1.7× 215 1.3× 71 0.5× 24 700
M. Kuball United Kingdom 19 430 1.1× 496 1.3× 695 2.1× 244 1.5× 196 1.3× 45 922
J. L. Farvacque France 15 354 0.9× 274 0.7× 309 0.9× 160 1.0× 78 0.5× 72 683
Hiromu Shiomi Japan 17 825 2.1× 691 1.9× 262 0.8× 200 1.2× 363 2.3× 57 1.3k
Satoru Nagao Japan 10 340 0.8× 348 0.9× 623 1.8× 364 2.2× 101 0.7× 21 786
Yuri Makarov Russia 11 325 0.8× 205 0.5× 304 0.9× 174 1.1× 59 0.4× 55 616
S. B. Thapa Germany 14 203 0.5× 273 0.7× 368 1.1× 201 1.2× 98 0.6× 26 522
Li Chang Taiwan 12 256 0.6× 208 0.6× 349 1.0× 180 1.1× 88 0.6× 33 502
Sg. Fujita Japan 16 397 1.0× 556 1.5× 372 1.1× 305 1.8× 69 0.4× 42 859
M. R. Gokhale India 15 283 0.7× 302 0.8× 301 0.9× 182 1.1× 48 0.3× 59 651

Countries citing papers authored by Mark C. Benjamin

Since Specialization
Citations

This map shows the geographic impact of Mark C. Benjamin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Mark C. Benjamin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Mark C. Benjamin more than expected).

Fields of papers citing papers by Mark C. Benjamin

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Mark C. Benjamin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Mark C. Benjamin. The network helps show where Mark C. Benjamin may publish in the future.

Co-authorship network of co-authors of Mark C. Benjamin

This figure shows the co-authorship network connecting the top 25 collaborators of Mark C. Benjamin. A scholar is included among the top collaborators of Mark C. Benjamin based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Mark C. Benjamin. Mark C. Benjamin is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Nichols, J.H., A.G. McLean, R. Maingi, et al.. (2011). Design and Deployment of a Wide-Angle Two-Color Infrared Camera with Optical Relay on NSTX. APS Division of Plasma Physics Meeting Abstracts. 53.
2.
Clarysse, Trudo, Alain Moussa, Frederik Leys, et al.. (2006). Accurate Sheet Resistance Measurement on Ultra-Shallow Profiles. MRS Proceedings. 912. 26 indexed citations
3.
Borland, John, W. Krull, D. C. Jacobson, et al.. (2006). 45nm Node p+ USJ Formation With High Dopant Activation And Low Damage. 4–9. 7 indexed citations
4.
Borland, John, W. Krull, D. C. Jacobson, et al.. (2006). High Dopant Activation And Low Damage P+ USJ Formation. AIP conference proceedings. 866. 96–100. 2 indexed citations
5.
Benjamin, Mark C., et al.. (2005). Ultra-shallow junction (USJ) sheet resistance measurements with a non-penetrating four point probe. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 237(1-2). 351–355. 9 indexed citations
6.
Benjamin, Mark C.. (2005). Determination of Ultra-shallow Junction (USJ) Quality with an Elastic Material Probe (EM-Probe). AIP conference proceedings. 788. 245–248. 1 indexed citations
7.
Mazur, R. G., et al.. (2004). Measurements of Ultra-Shallow Junction (USJ) Sheet Resistance with a Non-Penetrating Four Point Probe. MRS Proceedings. 810. 3 indexed citations
8.
King, Sean W., R. S. Kern, Mark C. Benjamin, et al.. (1999). Chemical Vapor Cleaning of 6H‐SiC Surfaces. Journal of The Electrochemical Society. 146(9). 3448–3454. 15 indexed citations
9.
King, Sean W., R. F. Davis, Carsten Ronning, Mark C. Benjamin, & R. J. Nemanich. (1999). Valence band discontinuity, surface reconstruction, and chemistry of (0001), (0001), and (1100) 2H–AlN/6H–SiC interfaces. Journal of Applied Physics. 86(8). 4483–4490. 30 indexed citations
10.
Nemanich, R. J., et al.. (1998). Characterization of electron emitting surfaces of diamond and III-V nitrides. 8(4). 211–223. 3 indexed citations
11.
Benjamin, Mark C.. (1998). Electronic properties of SiC and AlN surfaces and interfaces. 6630. 1 indexed citations
12.
Nemanich, R. J., P. K. Baumann, Mark C. Benjamin, et al.. (1998). Electron emission properties of crystalline diamond and III-nitride surfaces. Applied Surface Science. 130-132. 694–703. 30 indexed citations
13.
Nemanich, R. J., et al.. (1997). Electron emission from diamond and other wide-bandgap semiconductors. 537–554. 1 indexed citations
15.
Benjamin, Mark C., M. D. Bremser, T. W. Weeks, et al.. (1996). UV photoemission study of heteroepitaxial AlGaN films grown on 6H-SiC. Applied Surface Science. 104-105. 455–460. 60 indexed citations
16.
Powers, Matthew, Mark C. Benjamin, Lisa M. Porter, et al.. (1995). Observation of a negative electron affinity for boron nitride. Applied Physics Letters. 67(26). 3912–3914. 152 indexed citations
17.
Nemanich, R. J., Mark C. Benjamin, M. D. Bremser, et al.. (1995). (Negative) Electron Affinity of AlN and AlGaN Alloys. MRS Proceedings. 395. 30 indexed citations
18.
King, Sean W., Laura L. Smith, J. P. Barnak, et al.. (1995). Ex Situ and in Situ Methods for Oxide and Carbon Removal from AlN and GaN Surfaces. MRS Proceedings. 395. 18 indexed citations
19.
King, Sean W., Mark C. Benjamin, R. J. Nemanich, R. F. Davis, & Walter R. L. Lambrecht. (1995). XPS Measurement of the SiC/AlN Band-Offset at the (0001) Interface. MRS Proceedings. 395. 14 indexed citations
20.
Benjamin, Mark C., Cheng Wang, R. F. Davis, & R. J. Nemanich. (1994). Observation of a negative electron affinity for heteroepitaxial AlN on α(6H)-SiC(0001). Applied Physics Letters. 64(24). 3288–3290. 188 indexed citations breakdown →

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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