Philippe Leray
Impact in
- Surfaces, Coatings and Films top 5%
- Optical Coatings and Gratings
- Electron and X-Ray Spectroscopy Techniques
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- Industrial Vision Systems and Defect Detection
Papers in
-
- Advancements in Photolithography Techniques 93
- Integrated Circuits and Semiconductor Failure Analysis 65
- Semiconductor materials and devices 17
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- Optical Coatings and Gratings 34
- Electron and X-Ray Spectroscopy Techniques 30
- Co-authors
- Patrick Gallinari (3 shared papers)Christine Sinoquet (4 shared papers)Raphaël Mourad (4 shared papers)Olivier François (5 shared papers)Sandip Halder (37 shared papers)Bappaditya Dey (13 shared papers)Magdy Bayoumi (5 shared papers)Koen D’havé (10 shared papers)
- Journals
- IEEE Transactions on Semiconductor Manufacturing (2 papers)Neurocomputing (2 papers)Journal of Micro/Nanolithography MEMS and MOEMS (2 papers)International Journal of Approximate Reasoning (1 paper)Knowledge-Based Systems (1 paper)
- Partner nations
- BelgiumFranceNetherlands
In The Last Decade
Philippe Leray
141 papers receiving 837 citations
Peers
Comparison fields: 5 of 130
- Surfaces, Coatings and Films 177
- Industrial and Manufacturing Engineering 91
- Electrical and Electronic Engineering 417
- Artificial Intelligence 230
- Structural Biology 9
Countries citing papers authored by Philippe Leray
This map shows the geographic impact of Philippe Leray's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Philippe Leray with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Philippe Leray more than expected).
Fields of papers citing papers by Philippe Leray
This network shows the impact of papers produced by Philippe Leray. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Philippe Leray. The network helps show where Philippe Leray may publish in the future.
Co-authors
The 25 scholars most cited alongside Philippe Leray, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 166 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1999 | 83 | |
| 2 | BNT STRUCTURE LEARNING PACKAGE : Documentation and Experiments | 2004 | 65 |
| 3 | 2011 | 39 | |
| 4 | 2013 | 36 | |
| 5 | 2015 | 26 | |
| 6 | 2008 | 25 | |
| 7 | 2009 | 19 | |
| 8 | 2017 | 19 | |
| 9 | 2008 | 19 | |
| 10 | 2022 | 16 | |
| 11 | 2011 | 16 | |
| 12 | 2021 | 16 | |
| 13 | Combining classifiers for harmful document filtering | 2004 | 16 |
| 14 | 2014 | 16 | |
| 15 | A Decision Theoretic Approach | 2006 | 15 |
| 16 | 2003 | 15 | |
| 17 | 2021 | 14 | |
| 18 | 2017 | 12 | |
| 19 | 2020 | 11 | |
| 20 | 2007 | 11 |
About Philippe Leray
Philippe Leray is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Artificial Intelligence, Biomedical Engineering and Industrial and Manufacturing Engineering, having authored 166 papers that have together received 924 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (93 papers), Integrated Circuits and Semiconductor Failure Analysis (65 papers), Optical Coatings and Gratings (34 papers), Electron and X-Ray Spectroscopy Techniques (30 papers), Industrial Vision Systems and Defect Detection (26 papers), Advanced Surface Polishing Techniques (22 papers), Bayesian Modeling and Causal Inference (19 papers) and Semiconductor materials and devices (17 papers). The work is most often cited by research in Surfaces, Coatings and Films (177 citations), Industrial and Manufacturing Engineering (91 citations), Electrical and Electronic Engineering (417 citations), Artificial Intelligence (230 citations) and Structural Biology (9 citations). Philippe Leray has collaborated with scholars based in Belgium, France and Netherlands. Frequent co-authors include Patrick Gallinari, Christine Sinoquet, Raphaël Mourad, Olivier François, Sandip Halder, Bappaditya Dey, Magdy Bayoumi, Koen D’havé, Bernard Manderick and Nevin L. Zhang. Their work appears in journals such as IEEE Transactions on Semiconductor Manufacturing, Neurocomputing, Journal of Micro/Nanolithography MEMS and MOEMS, International Journal of Approximate Reasoning and Knowledge-Based Systems.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.