Chris A. Mack
Impact in
- Surfaces, Coatings and Films top 0.5%
- Electron and X-Ray Spectroscopy Techniques
- Optical Coatings and Gratings
-
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
Papers in
-
- Advancements in Photolithography Techniques 217
- Integrated Circuits and Semiconductor Failure Analysis 60
- 3D IC and TSV technologies 17
-
- Electron and X-Ray Spectroscopy Techniques 72
- Co-authors
- Mark D. Smith (21 shared papers)Benjamin Bunday (7 shared papers)Gian F. Lorusso (18 shared papers)Jeff D. Byers (8 shared papers)John S. Petersen (6 shared papers)Wenlong Chang (1 shared paper)Xichun Luo (1 shared paper)Jining Sun (1 shared paper)
- Journals
- Journal of Micro/Nanolithography MEMS and MOEMS (43 papers)Microelectronic Engineering (6 papers)Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena (4 papers)Optical Engineering (2 papers)Journal of The Electrochemical Society (2 papers)
- Partner nations
- United StatesBelgiumUnited Kingdom
In The Last Decade
Chris A. Mack
235 papers receiving 3.0k citations
Hit Papers
Peers
Comparison fields: 5 of 170
- Surfaces, Coatings and Films 1.0k
- Electrical and Electronic Engineering 2.7k
- Industrial and Manufacturing Engineering 285
- Biomedical Engineering 1.2k
- Media Technology 185
Countries citing papers authored by Chris A. Mack
This map shows the geographic impact of Chris A. Mack's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Chris A. Mack with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Chris A. Mack more than expected).
Fields of papers citing papers by Chris A. Mack
This network shows the impact of papers produced by Chris A. Mack. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Chris A. Mack. The network helps show where Chris A. Mack may publish in the future.
Co-authors
The 25 scholars most cited alongside Chris A. Mack, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 269 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | Fifty Years of Moore's Law Hit paper breakdown → | 2011 | 413 |
| 2 | 2007 | 317 | |
| 3 | Fundamental principles of optical lithography : the science of microfabrication Hit paper breakdown → | 2007 | 263 |
| 4 | 1987 | 118 | |
| 5 | 2011 | 97 | |
| 6 | 1985 | 95 | |
| 7 | 2013 | 83 | |
| 8 | 1967 | 70 | |
| 9 | 2006 | 66 | |
| 10 | 2011 | 49 | |
| 11 | 2013 | 48 | |
| 12 | 2015 | 48 | |
| 13 | 1986 | 46 | |
| 14 | 2018 | 45 | |
| 15 | 2018 | 43 | |
| 16 | 1988 | 41 | |
| 17 | 2011 | 38 | |
| 18 | 2009 | 36 | |
| 19 | 2005 | 29 | |
| 20 | 1995 | 28 |
About Chris A. Mack
Chris A. Mack is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Biomedical Engineering, Mechanical Engineering and Computational Mechanics, having authored 269 papers that have together received 3.7k indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (217 papers), Electron and X-Ray Spectroscopy Techniques (72 papers), Integrated Circuits and Semiconductor Failure Analysis (60 papers), Nanofabrication and Lithography Techniques (37 papers), Industrial Vision Systems and Defect Detection (31 papers), Surface Roughness and Optical Measurements (31 papers), Advanced Surface Polishing Techniques (21 papers) and 3D IC and TSV technologies (17 papers). The work is most often cited by research in Surfaces, Coatings and Films (1.0k citations), Electrical and Electronic Engineering (2.7k citations), Industrial and Manufacturing Engineering (285 citations), Biomedical Engineering (1.2k citations) and Media Technology (185 citations). Chris A. Mack has collaborated with scholars based in United States, Belgium and United Kingdom. Frequent co-authors include Mark D. Smith, Benjamin Bunday, Gian F. Lorusso, Jeff D. Byers, John S. Petersen, Wenlong Chang, Xichun Luo, Jining Sun, Frieda Van Roey and James Millar Ritchie. Their work appears in journals such as Journal of Micro/Nanolithography MEMS and MOEMS, Microelectronic Engineering, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Optical Engineering and Journal of The Electrochemical Society.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.