M. Friedrich

1.4k total citations
79 papers, 1.2k citations indexed

About

M. Friedrich is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, M. Friedrich has authored 79 papers receiving a total of 1.2k indexed citations (citations by other indexed papers that have themselves been cited), including 53 papers in Electrical and Electronic Engineering, 30 papers in Materials Chemistry and 22 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in M. Friedrich's work include Organic Electronics and Photovoltaics (17 papers), Molecular Junctions and Nanostructures (15 papers) and Semiconductor materials and devices (14 papers). M. Friedrich is often cited by papers focused on Organic Electronics and Photovoltaics (17 papers), Molecular Junctions and Nanostructures (15 papers) and Semiconductor materials and devices (14 papers). M. Friedrich collaborates with scholars based in Germany, Russia and Belgium. M. Friedrich's co-authors include Dietrich R. T. Zahn, Ovidiu D. Gordan, Cameliu Himcinschi, Georgeta Salvan, T.U. Kampen, Thomas Geßner, Lukas M. Eng, Peter Günter, A. G. Milekhin and Jan Fousek and has published in prestigious journals such as Journal of Applied Physics, Langmuir and Sensors and Actuators B Chemical.

In The Last Decade

M. Friedrich

78 papers receiving 1.2k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. Friedrich Germany 22 679 659 315 236 214 79 1.2k
Wu‐Ching Chou Taiwan 22 911 1.3× 833 1.3× 246 0.8× 286 1.2× 140 0.7× 116 1.5k
Samuel Chen United States 16 423 0.6× 688 1.0× 150 0.5× 158 0.7× 140 0.7× 51 1.2k
R. W. M. Kwok Hong Kong 18 644 0.9× 573 0.9× 211 0.7× 74 0.3× 121 0.6× 74 1.1k
Š. Luby Slovakia 17 491 0.7× 458 0.7× 432 1.4× 252 1.1× 245 1.1× 134 1.1k
S.T Lee Hong Kong 24 764 1.1× 1.1k 1.6× 144 0.5× 186 0.8× 289 1.4× 55 1.5k
Osamu Ikeda Japan 20 491 0.7× 429 0.7× 346 1.1× 417 1.8× 138 0.6× 74 1.4k
Anil R. Duggal United States 18 994 1.5× 539 0.8× 164 0.5× 95 0.4× 230 1.1× 41 1.4k
Katsutaka Sasaki Japan 20 840 1.2× 578 0.9× 288 0.9× 380 1.6× 127 0.6× 118 1.4k
Alain Moussa Belgium 21 958 1.4× 343 0.5× 386 1.2× 96 0.4× 268 1.3× 112 1.3k
W. M. Lau Canada 23 848 1.2× 678 1.0× 346 1.1× 110 0.5× 146 0.7× 91 1.5k

Countries citing papers authored by M. Friedrich

Since Specialization
Citations

This map shows the geographic impact of M. Friedrich's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Friedrich with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Friedrich more than expected).

Fields of papers citing papers by M. Friedrich

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Friedrich. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Friedrich. The network helps show where M. Friedrich may publish in the future.

Co-authorship network of co-authors of M. Friedrich

This figure shows the co-authorship network connecting the top 25 collaborators of M. Friedrich. A scholar is included among the top collaborators of M. Friedrich based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Friedrich. M. Friedrich is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Himcinschi, Cameliu, et al.. (2010). Optical characterisation of BiFeO3 epitaxial thin films grown by pulsed laser deposition. HZB Repository (Helmholtz-Zentrum Berlin für Materialien und Energie GmbH (HZB)).
2.
Ding, Li, M. Friedrich, Ovidiu D. Gordan, & Dietrich R. T. Zahn. (2010). In situ investigation of CuPc thin films grown on vicinal Si(111). Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 28(4). C5F17–C5F21. 4 indexed citations
3.
Friedrich, M., et al.. (2006). Magnetic field influence on the molecular alignment of vanadyl phthalocyanine thin films. Journal of Crystal Growth. 291(1). 166–174. 29 indexed citations
4.
Gordan, Ovidiu D., Sascha Hermann, M. Friedrich, & Dietrich R. T. Zahn. (2005). Optical Properties of 3,4,9,10-perylenetetracarboxylic dianhydride/copper phthalocyanine superlattices. Journal of Applied Physics. 97(6). 11 indexed citations
5.
Himcinschi, Cameliu, Stefan E. Schulz, M. Friedrich, et al.. (2005). Scaling down thickness of ULK materials for 65nm node and below and its effect on electrical performance. Microelectronic Engineering. 82(3-4). 405–410. 1 indexed citations
6.
Gordan, Ovidiu D., M. Friedrich, & Dietrich R. T. Zahn. (2004). The anisotropic dielectric function for copper phthalocyanine thin films. Organic Electronics. 5(6). 291–297. 43 indexed citations
7.
Friedrich, M., Reinhard Scholz, T.U. Kampen, et al.. (2004). Vacuum ultraviolet spectroscopic ellipsometry investigations of guanine layers on H-passivated Si(111) surfaces. Thin Solid Films. 455-456. 505–508. 3 indexed citations
8.
Himcinschi, Cameliu, et al.. (2004). Contributions to the static dielectric constant of low-k xerogel films derived from ellipsometry and IR spectroscopy. Thin Solid Films. 455-456. 433–437. 9 indexed citations
9.
Kampen, T.U., Georgeta Salvan, Cameliu Himcinschi, et al.. (2003). Orientation of perylene derivatives on semiconductor surfaces. Applied Surface Science. 212-213. 501–507. 13 indexed citations
10.
Himcinschi, Cameliu, M. Friedrich, Stefan E. Schulz, et al.. (2002). Ellipsometric study of the change in the porosity of silica xerogels after chemical modification of the surface with hexamethyldisilazane. Analytical and Bioanalytical Chemistry. 374(4). 654–657. 12 indexed citations
11.
Milekhin, A. G., et al.. (2002). Optical vibrational modes in (Cd, Pb, Zn)S quantum dots embedded in Langmuir–Blodgett matrices. Thin Solid Films. 422(1-2). 200–204. 31 indexed citations
12.
Friedrich, M., T. Wágner, Georgeta Salvan, et al.. (2002). Optical constants of 3,4,9,10-perylenetetracarboxylic dianhydride films on silicon and gallium arsenide studied by spectroscopic ellipsometry. Applied Physics A. 75(4). 501–506. 23 indexed citations
13.
Himcinschi, Cameliu, M. Friedrich, Christopher P. Murray, et al.. (2001). Characterization of silica xerogel films by variable-angle spectroscopic ellipsometry and infrared spectroscopy. Semiconductor Science and Technology. 16(9). 806–811. 21 indexed citations
14.
Himcinschi, Cameliu, A. G. Milekhin, M. Friedrich, et al.. (2001). Silicon oxide in SiSi bonded wafers. Applied Surface Science. 175-176. 715–720. 7 indexed citations
15.
Kampen, T.U., U. Rossów, Suhyun Park, et al.. (2001). Optical Anisotropy of Organic Layers Deposited on Semiconductor Surfaces. physica status solidi (a). 188(4). 1307–1317. 10 indexed citations
16.
Friedrich, M. & Dietrich R. T. Zahn. (1998). Emission Spectroscopy: An Excellent Tool for the Infrared Characterization of Textile Fibers. Applied Spectroscopy. 52(12). 1530–1535. 4 indexed citations
17.
Friedrich, M., et al.. (1997). Nanoscaled SiCN-composite powders with different structures by shock-wave pyrolysis of organic precursors. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 122(3). 598–601. 2 indexed citations
18.
Richter, Frank, et al.. (1997). Utilization of cathodic arc evaporation for the deposition of boron nitride thin films. Surface and Coatings Technology. 90(1-2). 178–183. 14 indexed citations
19.
Eng, Lukas M., M. Friedrich, Jan Fousek, & Peter Günter. (1996). Deconvolution of topographic and ferroelectric contrast by noncontact and friction force microscopy. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(2). 1191–1196. 56 indexed citations
20.
Friedrich, M., et al.. (1994). Detection of Ultrathin SiC Layers by Infrared Spectroscopy. Simulation and Experiment. physica status solidi (a). 145(2). 369–377. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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