Jay Mody

533 total citations
26 papers, 415 citations indexed

About

Jay Mody is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Jay Mody has authored 26 papers receiving a total of 415 indexed citations (citations by other indexed papers that have themselves been cited), including 18 papers in Electrical and Electronic Engineering, 14 papers in Biomedical Engineering and 13 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Jay Mody's work include Integrated Circuits and Semiconductor Failure Analysis (14 papers), Force Microscopy Techniques and Applications (12 papers) and Semiconductor materials and devices (9 papers). Jay Mody is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (14 papers), Force Microscopy Techniques and Applications (12 papers) and Semiconductor materials and devices (9 papers). Jay Mody collaborates with scholars based in Belgium, United States and Netherlands. Jay Mody's co-authors include Wilfried Vandervorst, Pierre Eyben, Kausala Mylvaganam, Andreas Schulze, M. Gilbert, Thomas Hantschel, Sebastian Koelling, Trudo Clarysse, W. Vandervorst and W. Polspoel and has published in prestigious journals such as Journal of Applied Physics, Nanotechnology and Ultramicroscopy.

In The Last Decade

Jay Mody

25 papers receiving 398 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Jay Mody Belgium 13 254 230 189 154 48 26 415
M. Grégoire France 11 234 0.9× 107 0.5× 195 1.0× 72 0.5× 28 0.6× 51 334
Janusz Bogdanowicz Belgium 12 197 0.8× 191 0.8× 144 0.8× 144 0.9× 37 0.8× 42 360
D. Chidambarrao United States 12 398 1.6× 94 0.4× 132 0.7× 114 0.7× 76 1.6× 43 514
W. Scholz Germany 9 188 0.7× 194 0.8× 189 1.0× 91 0.6× 75 1.6× 19 386
Naoki Ebisawa Japan 12 116 0.5× 80 0.3× 65 0.3× 262 1.7× 33 0.7× 20 347
A.M. Papon France 11 468 1.8× 119 0.5× 102 0.5× 122 0.8× 27 0.6× 25 522
Y. Morand France 16 690 2.7× 191 0.8× 106 0.6× 102 0.7× 52 1.1× 72 741
Jinjer Huang China 13 255 1.0× 60 0.3× 188 1.0× 108 0.7× 28 0.6× 58 401
E. Ganin United States 12 547 2.2× 75 0.3× 173 0.9× 121 0.8× 28 0.6× 31 634
T. Barge France 9 310 1.2× 80 0.3× 127 0.7× 105 0.7× 11 0.2× 22 388

Countries citing papers authored by Jay Mody

Since Specialization
Citations

This map shows the geographic impact of Jay Mody's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jay Mody with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jay Mody more than expected).

Fields of papers citing papers by Jay Mody

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jay Mody. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jay Mody. The network helps show where Jay Mody may publish in the future.

Co-authorship network of co-authors of Jay Mody

This figure shows the co-authorship network connecting the top 25 collaborators of Jay Mody. A scholar is included among the top collaborators of Jay Mody based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jay Mody. Jay Mody is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Mody, Jay, et al.. (2018). Impact of Scratch Speed on Interface Adhesion of Thin Films. Bulletin of the American Physical Society. 2018. 1 indexed citations
2.
3.
Vandervorst, Wilfried, et al.. (2013). Dopant/carrier profiling for 3D‐structures. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 11(1). 121–129. 24 indexed citations
4.
Eyben, Pierre, Trudo Clarysse, Geert Hellings, et al.. (2012). Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations. Solid-State Electronics. 74. 38–42. 3 indexed citations
5.
Mody, Jay, Sebastian Kölling, A. De Keersgieter, et al.. (2012). Scanning spreading resistance microscopy for carrier profiling beyond 32nm node. 94–99. 1 indexed citations
6.
Togo, M., et al.. (2012). Atom Probe Tomography for 3D-dopant analysis in FinFET devices. 77–78. 4 indexed citations
7.
Schulze, Andreas, Thomas Hantschel, Pierre Eyben, et al.. (2011). Observation of diameter dependent carrier distribution in nanowire-based transistors. Nanotechnology. 22(18). 185701–185701. 35 indexed citations
8.
Mody, Jay, et al.. (2011). Atom-probe for FinFET dopant characterization. Ultramicroscopy. 111(6). 535–539. 41 indexed citations
9.
Bogdanowicz, Janusz, Trudo Clarysse, Alain Moussa, et al.. (2011). Non-Destructive Characterization of Activated Ion-Implanted Doping Profiles Based on Photomodulated Optical Reflectance. AIP conference proceedings. 220–224. 1 indexed citations
10.
Mody, Jay, Sebastian Kölling, A. De Keersgieter, et al.. (2011). 3D-carrier profiling in FinFETs using scanning spreading resistance microscopy. 6.1.1–6.1.4. 13 indexed citations
11.
Hayashi, S., M. Togo, T. Chiarella, et al.. (2011). High performance n-MOS finFET by damage-free, conformal extension doping. 35.6.1–35.6.4. 7 indexed citations
12.
Mody, Jay, T. Chiarella, Nadine Collaert, et al.. (2011). Dopant and carrier profiling for 3D-device architectures. 108–113. 5 indexed citations
13.
Eyben, Pierre, Francesca Clemente, Kris Vanstreels, et al.. (2010). Analysis and modeling of the high vacuum scanning spreading resistance microscopy nanocontact on silicon. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 28(2). 401–406. 38 indexed citations
14.
Mody, Jay, Ray Duffy, Pierre Eyben, et al.. (2010). Experimental studies of dose retention and activation in fin field-effect-transistor-based structures. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 28(1). C1H5–C1H13. 25 indexed citations
15.
Mylvaganam, Kausala, et al.. (2009). Evolution of metastable phases in silicon during nanoindentation: mechanism analysis and experimental verification. Nanotechnology. 20(30). 305705–305705. 105 indexed citations
16.
Mody, Jay, Ray Duffy, Pierre Eyben, et al.. (2009). Experimental studies of dose retention and activation in FinFet-based structures. 2 indexed citations
17.
Vandervorst, W., M. Jurczak, T. Hoffman, et al.. (2008). Conformal Doping of FINFETs: a Fabrication and Metrology Challenge. AIP conference proceedings. 449–456. 23 indexed citations
18.
Eyben, Pierre, et al.. (2008). Impact of the environmental conditions on the electrical characteristics of scanning spreading resistance microscopy. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 26(1). 338–341. 13 indexed citations
19.
Mody, Jay, Pierre Eyben, W. Polspoel, M. Jurczak, & Wilfried Vandervorst. (2008). Scanning Spreading Resistance Microscopy For 3D-Carrier Profiling in FinFET-based Structures. MRS Proceedings. 1070. 2 indexed citations
20.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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