M.R. Polcari
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- Semiconductor materials and devices 19
- Advancements in Semiconductor Devices and Circuit Design 17
- Integrated Circuits and Semiconductor Failure Analysis 5
- Low-power high-performance VLSI design 4
- Advancements in Photolithography Techniques 3
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- Semiconductor materials and interfaces 2
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- Advanced Surface Polishing Techniques 2
- Nanowire Synthesis and Applications 2
M.R. Polcari
21 papers receiving 447 citations
Peers
Comparison fields: 5 of 26
- Electrical and Electronic Engineering 459
- Atomic and Molecular Physics, and Optics 72
- Hardware and Architecture 15
- Structural Biology 3
- Biomedical Engineering 42
Countries citing papers authored by M.R. Polcari
This map shows the geographic impact of M.R. Polcari's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M.R. Polcari with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M.R. Polcari more than expected).
Fields of papers citing papers by M.R. Polcari
This network shows the impact of papers produced by M.R. Polcari. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M.R. Polcari. The network helps show where M.R. Polcari may publish in the future.
Co-authorship network
The 25 scholars most cited alongside M.R. Polcari, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2003 | 1 | |
| 2 | 2003 | 0 | |
| 3 | 2002 | 24 | |
| 4 | 2002 | 7 | |
| 5 | 2002 | 19 | |
| 6 | 2002 | 14 | |
| 7 | 1995 | 31 | |
| 8 | 1994 | 64 | |
| 9 | 1994 | 44 | |
| 10 | 1993 | 2 | |
| 11 | 1992 | 85 | |
| 12 | 1991 | 8 | |
| 13 | 1989 | 11 | |
| 14 | 1988 | 12 | |
| 15 | 1988 | 2 | |
| 16 | Submicron Tungsten Gate MOSFET with 10 nm Gate Oxide | 1987 | 6 |
| 17 | 1987 | 99 | |
| 18 | 1986 | 1 | |
| 19 | 1986 | 19 | |
| 20 | 1980 | 15 |
About M.R. Polcari
M.R. Polcari is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics, Biomedical Engineering and Electronic, Optical and Magnetic Materials, having authored 22 papers that have together received 468 indexed citations. Recurring topics across this work include Semiconductor materials and devices (19 papers), Advancements in Semiconductor Devices and Circuit Design (17 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), Low-power high-performance VLSI design (4 papers), Advancements in Photolithography Techniques (3 papers), Advanced Surface Polishing Techniques (2 papers), Semiconductor materials and interfaces (2 papers) and Nanowire Synthesis and Applications (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (459 citations), Atomic and Molecular Physics, and Optics (72 citations), Hardware and Architecture (15 citations), Structural Biology (3 citations) and Biomedical Engineering (42 citations). M.R. Polcari has collaborated with scholars based in United States and Italy. Frequent co-authors include B. Davari, M.R. Wordeman, Yuan Taur, R.H. Dennard, D. P. Kern, J.Y.-C. Sun, S. A. Rishton, T.H. Ning, D. Moy and G.A. Sai-Halasz. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Electron Device Letters, Applied Physics Letters, Solid-State Electronics and IBM Journal of Research and Development.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.