H. Katto

403 citations

34 papers · 262 indexed · h-index 10

Electrical and Electronic Engineering
- Semiconductor materials and devices 28
- Advancements in Semiconductor Devices and Circuit Design 25
- Silicon Carbide Semiconductor Technologies 9
- Integrated Circuits and Semiconductor Failure Analysis 8
- Advanced Memory and Neural Computing 5
- Electronic Packaging and Soldering Technologies 3
Hardware and Architecture
Atomic and Molecular Physics, and Optics
- Semiconductor materials and interfaces 5
Electronic, Optical and Magnetic Materials
- Copper Interconnects and Reliability 4
Software

Co-authors: H. Kawamoto R. Hori Y. Kamigaki H. Masuda K. Itoh Yasutoshi Koga C. T. Sah Masaaki Aoki
Cited by: Electrical and Electronic Engineering Hardware and Architecture Atomic and Molecular Physics, and Optics
Journals: Solid-State Electronics (9 papers)IEEE Transactions on Electron Devices (3 papers)IEEE Journal of Solid-State Circuits (2 papers)
Partner nations: Japan United States

In The Last Decade

H. Katto

31 papers receiving 241 citations

Peers

Countries citing papers authored by H. Katto

Since Specialization

Citations

This map shows the geographic impact of H. Katto's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. Katto with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. Katto more than expected).

Fields of papers citing papers by H. Katto

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H. Katto. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. Katto. The network helps show where H. Katto may publish in the future.

Co-authorship network

The 25 scholars most cited alongside H. Katto, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with H. Katto Line = papers co-authored together H. Katto links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	MOSFET I–V characteristics at small and large drain biases in the linear region Solid-State Electronics ·H. Katto	2007	2
2	A compact and accurate MOSFET model with simple expressions for linear, saturation and sub-threshold regions Solid-State Electronics ·H. Katto	2006	4
3	Breakdown voltage distribution and extrinsic TDDB failures of MOS gate oxides H. Katto	2003	2
4	Analytical model for extrinsic time-dependent dielectric breakdown of thin gate oxide Solid-State Electronics ·H. Katto	2002	0
5	Temperature-controlled wafer level Joule-heated constant-current EM tests of W/AlCuSi/W wires J.F. Sepúlveda Ramirez,Yasumasa Fujisaki,俊郎柴田,H. Katto,M. Kubo	2002	0
6	Wafer-level Jramp and J-constant electromigration testing of conventional and SWEAT patterns assisted by a thermal and electrical simulator H. Katto,Masahide Harada,Yuki Higuchi	2002	6
7	Physical parameters of the quantum mechanical interference method for the determination of oxide thickness in MOS devices Solid-State Electronics ·H. Katto	2001	1
8	Device parameter extraction in the linear region of MOSFET's IEEE Electron Device Letters ·H. Katto	1997	20
9	VLSI reliability challenges: From device physics to wafer scale systems Microelectronics Reliability ·Eiji Takeda,フアンルフィノカステイジョ,H. Katto,Yuzuru Ohji,K. Hinode,A. Hamada,T Moshammer,re g,Toshio Sasaki	1995	2
10	VLSI reliability challenges: from device physics to wafer scale systems Proceedings of the IEEE ·Eiji Takeda,フアンルフィノカステイジョ,H. Katto,Yuzuru Ohji,K. Hinode,A. Hamada,T Moshammer,re g,Larry Collins	1993	5
11	Hi-MNOS II Technology for a 64-kbit Byte-Erasable 5-V-Only EEPROM IEEE Journal of Solid-State Circuits ·Tito Mundt,輝久尾崎,Ken Uchida,Elisabeth Kuh ̈nel,Dorotea Felicetti,Tomoaki Hagiwara,H. Katto,Edward. Lupito	1985	7
12	Hot carrier degradation modes and optimization of LDD MOSFETs H. Katto,Kikuo Okuyama,S. Meguro,R. Nagai,Adam D. Shapiro	1984	21
13	FCAT-II: A 50 ns/15 V alterable nonvolatile memory device—Part I: Experimental IEEE Transactions on Electron Devices ·M. Horiuchi,H. Katto	1983	1
14	Design for alpha immunity of MOS dynamic RAM's Mariupol'skiĭ Mb,H. Katto,T. Toyabe	1981	5
15	A single 5V 64K dynamic RAM K. Itoh,R. Hori,H. Masuda,Y. Kamigaki,H. Kawamoto,H. Katto	1980	25
16	A 5 V-only 64K dynamic RAM based on high S/N design IEEE Journal of Solid-State Circuits ·H. Masuda,R. Hori,Y. Kamigaki,K. Itoh,H. Kawamoto,H. Katto	1980	44
17	FCAT—A low-voltage high-speed alterable n-channel nonvolatile memory device IEEE Transactions on Electron Devices ·M. Horiuchi,H. Katto	1979	8
18	Low-frequency 1/f noise in MOSFET’s at low current levels Journal of Applied Physics ·Masaaki Aoki,H. Katto,Takuma Kizuki	1977	18
19	Surface state density evaluation using high-frequency MOS capacitance technique physica status solidi (a) ·H. Katto,Yokichi Itoh	1974	14
20	Frequency response of the surface state admittance in weakly inverted thin SiO2–Si MOS capacitors physica status solidi (a) ·H. Katto,C. T. Sah	1972	14

About H. Katto

H. Katto is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Ceramics and Composites, Atomic and Molecular Physics, and Optics and Hardware and Architecture, having authored 34 papers that have together received 262 indexed citations. Recurring topics across this work include Semiconductor materials and devices (28 papers), Advancements in Semiconductor Devices and Circuit Design (25 papers), Silicon Carbide Semiconductor Technologies (9 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers), Semiconductor materials and interfaces (5 papers), Advanced Memory and Neural Computing (5 papers), Copper Interconnects and Reliability (4 papers) and Electronic Packaging and Soldering Technologies (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (255 citations), Hardware and Architecture (10 citations), Atomic and Molecular Physics, and Optics (36 citations), Electronic, Optical and Magnetic Materials (16 citations) and Software (2 citations). H. Katto has collaborated with scholars based in Japan and United States. Frequent co-authors include H. Kawamoto, R. Hori, Y. Kamigaki, H. Masuda, K. Itoh, Yasutoshi Koga, C. T. Sah, Masaaki Aoki, M. Horiuchi and S. Meguro. Their work appears in journals such as Solid-State Electronics, IEEE Transactions on Electron Devices, IEEE Journal of Solid-State Circuits, IEEE Electron Device Letters and Proceedings of the IEEE.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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