T.I. Chappell

974 citations

29 papers · 715 indexed · h-index 14

Impact in

Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
Electrical and Electronic Engineering top 10%
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon and Solar Cell Technologies

Papers in

Electrical and Electronic Engineering 26
- Semiconductor materials and devices 14
- Low-power high-performance VLSI design 8
- Advancements in Semiconductor Devices and Circuit Design 8
- Silicon and Solar Cell Technologies 6
- solar cell performance optimization 4
- Integrated Circuits and Semiconductor Failure Analysis 3
Hardware and Architecture 3

Co-authors: P. D. Kirchner J. M. Woodall B.A. Chappell G. D. Pettit A.C. Warren S. D. Offsey S.E. Schuster R. Franch
Journals: IEEE Journal of Solid-State Circuits (5 papers)Applied Physics Letters (3 papers)IEEE Transactions on Electron Devices (3 papers)Journal of Applied Physics (2 papers)IBM Journal of Research and Development (1 paper)
Partner nations: United States

In The Last Decade

T.I. Chappell

28 papers receiving 667 citations

Peers

Countries citing papers authored by T.I. Chappell

Since Specialization

Citations

This map shows the geographic impact of T.I. Chappell's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T.I. Chappell with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T.I. Chappell more than expected).

Fields of papers citing papers by T.I. Chappell

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by T.I. Chappell. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T.I. Chappell. The network helps show where T.I. Chappell may publish in the future.

Co-authorship network

The 25 scholars most cited alongside T.I. Chappell, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with T.I. Chappell Line = papers co-authored together T.I. Chappell links everyone, so they are left out of the graph.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work
1	On-Chip Test Circuitry for a 2 ns Cycle 512Kb CMOS ECL SRAM European Solid-State Circuits Conference ·S.E. Schuster, T.I. Chappell, B.A. Chappell, R. Franch	1991	1
2	A 2-ns cycle, 3.8-ns access 512-kb CMOS ECL SRAM with a fully pipelined architecture IEEE Journal of Solid-State Circuits ·T.I. Chappell, B.A. Chappell, S.E. Schuster, Gerrit Verkugl, S. P. Klepner, (unknown), R. Franch	1991	99
3	Process Integration for a 2ns Cycle/4ns Access 512K CMOS SRAM (unknown), S. P. Klepner, S. Basavaiah, A. Ray, Karen Petrillo, Teresa Figueiredo, T. Bucelot, Stuart K Lee, M. Jaso, Timothy A. Brunner, E. Petrillo, K. Stein, G.P. Coleman, R. Franch, B.A. Chappell, T.I. Chappell, S.E. Schuster	1991	1
4	A 2ns Cycle, 4ns Access 512kb CMOS ECL SRAM T.I. Chappell, B.A. Chappell, S.E. Schuster, Gerrit Verkugl, D. H. Bolton, (unknown), Tipografia Obradors	1991	26
5	A 3.5 ns/77 K and 6.2 ns/300 K 64 K CMOS RAM with ECL interfaces IEEE Journal of Solid-State Circuits ·T.I. Chappell, S.E. Schuster, B.A. Chappell, Gerrit Verkugl, J.Y.-C. Sun, S. P. Klepner, J. L. Gili, Nadene Johns, P.J. Restle	1989	8
6	Fast CMOS ECL receivers with 100-mV worst-case sensitivity IEEE Journal of Solid-State Circuits ·B.A. Chappell, T.I. Chappell, S.E. Schuster, T. Schlüter, Gerrit Verkugl, R. Franch, P.J. Restle	1988	44
7	A HIGH PERFORMANCE LIQUID-NITROGEN CMOS SRAM TECHNOLOGY Le Journal de Physique Colloques ·J.Y.-C. Sun, S. P. Klepner, Yuan Taur, H.I. Hanafi, P.J. Restle, T. Bucelot, Karen Petrillo, R.H. Dennard, S.E. Schuster, T.I. Chappell, B.A. Chappell, David F. Heidel	1988	2
8	Summary Abstract: Unpinned (100) GaAs surfaces in air using photochemistry Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ·A.C. Warren, S. D. Offsey, J. M. Woodall, P. D. Kirchner, T.I. Chappell, G. D. Pettit	1986	1
9	Unpinned (100) GaAs surfaces in air using photochemistry Applied Physics Letters ·S. D. Offsey, J. M. Woodall, A.C. Warren, P. D. Kirchner, T.I. Chappell, G. D. Pettit	1986	171
10	Modulating Functions Waveform Analysis of Multi-Exponential Transients for Deep-Level Transient Spectroscopy MRS Proceedings ·C. Ransom, T.I. Chappell, Dan Jia, P. D. Kirchner	1986	14
11	Modifications to the Boonton 72BD capacitance meter for deep-level transient spectroscopy applications Review of Scientific Instruments ·T.I. Chappell, C. Ransom	1984	18
12	Transport properties and defect states of a-Si:H grown by HOMOCVD Journal of Non-Crystalline Solids ·Jerzy Kanicki, C. Ransom, W. Bauhofer, T.I. Chappell, B. A. Scott	1984	6
13	Determination of the oxygen precipitate-free zone width in silicon wafers from surface photovoltage measurements Solid-State Electronics ·T.I. Chappell, P. W. Chye, JOSÉ HENRIQUE ALEXANDRE DE AZEVEDO	1983	6
14	The analysis of exponential and nonexponential transients in deep-level transient spectroscopy Journal of Applied Physics ·P. D. Kirchner, W. J. Schaff, G.N. Maracas, L.F. Eastman, T.I. Chappell, C. Ransom	1981	72
15	Voltage-controlled photoetching of GaAs Applied Physics Letters ·Hans Jürgen Hoffmann, J. M. Woodall, T.I. Chappell	1981	20
16	A study of the conversion efficiency limit of p⁺-i-n⁺silicon solar cells in concentrated sunlight IEEE Transactions on Electron Devices ·T.I. Chappell	1980	5
17	The V-groove multijunction solar cell IEEE Transactions on Electron Devices ·T.I. Chappell	1979	28
18	The V-Groove Multijunction solar cell pvsp ·T.I. Chappell	1978	1
19	A pn junction silicon sensor for high-intensity solar flux mapping pvsp ·T.I. Chappell	1976	1
20	Characteristics of a water absorber in front of a silicon solar cell Applied Physics Letters ·T.I. Chappell, R.M. White	1976	6

About T.I. Chappell

T.I. Chappell is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Bioengineering, Surfaces, Coatings and Films and Atomic and Molecular Physics, and Optics, having authored 29 papers that have together received 715 indexed citations. Recurring topics across this work include Semiconductor materials and devices (14 papers), Low-power high-performance VLSI design (8 papers), Advancements in Semiconductor Devices and Circuit Design (8 papers), Silicon and Solar Cell Technologies (6 papers), Photovoltaic System Optimization Techniques (4 papers), solar cell performance optimization (4 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers) and Semiconductor materials and interfaces (2 papers). The work is most often cited by research in Hardware and Architecture (127 citations), Electrical and Electronic Engineering (637 citations), Atomic and Molecular Physics, and Optics (202 citations), Surfaces, Coatings and Films (39 citations) and Nuclear Energy and Engineering (2 citations). T.I. Chappell has collaborated with scholars based in United States. Frequent co-authors include P. D. Kirchner, J. M. Woodall, B.A. Chappell, G. D. Pettit, A.C. Warren, S. D. Offsey, S.E. Schuster, R. Franch, C. Ransom and S. P. Klepner. Their work appears in journals such as IEEE Journal of Solid-State Circuits, Applied Physics Letters, IEEE Transactions on Electron Devices, Journal of Applied Physics and IBM Journal of Research and Development.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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