Karen Petrillo
- Electrical and Electronic Engineering top 5%
- Biomedical Engineering top 10%
- Surfaces, Coatings and Films top 2%
- Atomic and Molecular Physics, and Optics
- Materials Chemistry
- Co-authors
- Marie AngelopoulosYuan TaurM. SanchezM. HargroveDavid E. SeegerM. IeongRatnam SooriyakumaranP. Oldiges
- Topics
- Advancements in Photolithography Techniques (98 papers)Integrated Circuits and Semiconductor Failure Analysis (57 papers)Electron and X-Ray Spectroscopy Techniques (44 papers)
- Journals
- Applied Physics LettersIEEE Journal of Solid-State CircuitsIEEE Transactions on Electron Devices
- Partner nations
- United StatesJapanNetherlands
In The Last Decade
Karen Petrillo
100 papers receiving 1.1k citations
Peers
Comparison fields: 5 of 43
- Electrical and Electronic Engineering 1.1k
- Biomedical Engineering 372
- Surfaces, Coatings and Films 267
- Atomic and Molecular Physics, and Optics 124
- Materials Chemistry 90
Countries citing papers authored by Karen Petrillo
This map shows the geographic impact of Karen Petrillo's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Karen Petrillo with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Karen Petrillo more than expected).
Fields of papers citing papers by Karen Petrillo
This network shows the impact of papers produced by Karen Petrillo. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Karen Petrillo. The network helps show where Karen Petrillo may publish in the future.
Co-authorship network of co-authors of Karen Petrillo
This figure shows the co-authorship network connecting the top 25 collaborators of Karen Petrillo. A scholar is included among the top collaborators of Karen Petrillo based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Karen Petrillo. Karen Petrillo is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 1 | |
| 3 | 1 | |
| 4 | 1 | |
| 5 | 1 | |
| 6 | 7 | |
| 7 | 3 | |
| 8 | 2 | |
| 9 | 3 | |
| 10 | 4 | |
| 11 | 5 | |
| 12 | 20 | |
| 13 | 1 | |
| 14 | 27 | |
| 15 | 6 | |
| 16 | 77 | |
| 17 | 1 | |
| 18 | 3 | |
| 19 | 20 | |
| 20 | 4 |
About Karen Petrillo
Karen Petrillo is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials, having authored 111 papers that have together received 1.2k indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (98 papers), Integrated Circuits and Semiconductor Failure Analysis (57 papers) and Electron and X-Ray Spectroscopy Techniques (44 papers). The work is most often cited by research in Surfaces, Coatings and Films (267 citations), Electrical and Electronic Engineering (1.1k citations) and Biomedical Engineering (372 citations). Karen Petrillo has collaborated with scholars based in United States, Japan and Netherlands. Frequent co-authors include Marie Angelopoulos, Yuan Taur, M. Sanchez, M. Hargrove, David E. Seeger, M. Ieong, Ratnam Sooriyakumaran, P. Oldiges, Greg Breyta and Darı́o L. Goldfarb. Their work appears in journals such as Applied Physics Letters, IEEE Journal of Solid-State Circuits and IEEE Transactions on Electron Devices.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.