K. Y. Ahn

1.2k citations
67 papers · 1000 indexed · h-index 18

Impact in

Papers in

K. Y. Ahn

63 papers receiving 911 citations

Peers

K. Y. Ahn
Comparison fields: 5 of 41
  • Electronic, Optical and Magnetic Materials 398
  • Condensed Matter Physics 222
  • Atomic and Molecular Physics, and Optics 443
  • Electrical and Electronic Engineering 456
  • Mechanics of Materials 173
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Citations per year

Countries citing papers authored by K. Y. Ahn

Since Specialization
Citations

This map shows the geographic impact of K. Y. Ahn's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Y. Ahn with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Y. Ahn more than expected).

Fields of papers citing papers by K. Y. Ahn

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by K. Y. Ahn. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Y. Ahn. The network helps show where K. Y. Ahn may publish in the future.

Co-authorship network

The 25 scholars most cited alongside K. Y. Ahn, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with K. Y. Ahn Line = papers co-authored together K. Y. Ahn links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 199030
2
Tungsten and other refractory metals for VLSI applications IV : proceedings of the 1988 workshop held October 4-6, 1988, Albuquerque, New Mexico, U.S.A.
19894
3
Submicron Tungsten Gate MOSFET with 10 nm Gate Oxide
19876
4 198711
5 198732
6 19867
7 198626
8 19844
9 198349
10 19832
11 198315
12 19800
13 19754
14 197518
15 19726
16 19698
17 19698
18 19682
19 196757
20 19661

About K. Y. Ahn

K. Y. Ahn is a scholar working on Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Condensed Matter Physics, Electrical and Electronic Engineering and Metals and Alloys, having authored 67 papers that have together received 1000 indexed citations. Recurring topics across this work include Magnetic properties of thin films (22 papers), Semiconductor materials and devices (14 papers), Magneto-Optical Properties and Applications (12 papers), Semiconductor materials and interfaces (11 papers), Copper Interconnects and Reliability (11 papers), Magnetic Properties and Applications (10 papers), Magnetic and transport properties of perovskites and related materials (7 papers) and Metal and Thin Film Mechanics (7 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (398 citations), Condensed Matter Physics (222 citations), Atomic and Molecular Physics, and Optics (443 citations), Electrical and Electronic Engineering (456 citations) and Mechanics of Materials (173 citations). K. Y. Ahn has collaborated with scholars based in United States, Italy and Germany. Frequent co-authors include S. R. Herd, K. N. Tu, M. W. Shafer, J. C. Suits, T. R. McGuire, M.H. Kryder, L. Krusin‐Elbaum, C. Y. Ting, M. Wittmer and George Almási. Their work appears in journals such as Journal of Applied Physics, IEEE Transactions on Magnetics, Thin Solid Films, IBM Journal of Research and Development and Applied Physics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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