R. Franch
- Electrical and Electronic Engineering top 10%
- Hardware and Architecture top 5%
- Computer Networks and Communications top 10%
- Biomedical Engineering
- Materials Chemistry
- Co-authors
- P.J. RestleB.A. ChappellT.I. ChappellS.E. SchusterN. JamesS. P. KlepnerW. HuottKenneth L. Shepard
- Topics
- Semiconductor materials and devices (21 papers)Low-power high-performance VLSI design (17 papers)Advancements in Semiconductor Devices and Circuit Design (14 papers)
- Cited by
- Hardware and ArchitectureElectrical and Electronic EngineeringComputer Networks and Communications
- Journals
- IEEE Journal of Solid-State CircuitsIEEE Transactions on Electron DevicesIEEE Electron Device Letters
- Partner nations
- United StatesSpainGermany
In The Last Decade
R. Franch
44 papers receiving 624 citations
Peers
Comparison fields: 5 of 40
- Electrical and Electronic Engineering 588
- Hardware and Architecture 224
- Computer Networks and Communications 74
- Biomedical Engineering 63
- Materials Chemistry 44
Countries citing papers authored by R. Franch
This map shows the geographic impact of R. Franch's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Franch with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Franch more than expected).
Fields of papers citing papers by R. Franch
This network shows the impact of papers produced by R. Franch. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Franch. The network helps show where R. Franch may publish in the future.
Co-authorship network of co-authors of R. Franch
This figure shows the co-authorship network connecting the top 25 collaborators of R. Franch. A scholar is included among the top collaborators of R. Franch based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. Franch. R. Franch is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 8 | |
| 3 | 43 | |
| 4 | 47 | |
| 5 | 3 | |
| 6 | 62 | |
| 7 | 5 | |
| 8 | 4 | |
| 9 | 7 | |
| 10 | 3 | |
| 11 | 2 | |
| 12 | 4 | |
| 13 | 2 | |
| 14 | On-Chip Test Circuitry for a 2 ns Cycle 512Kb CMOS ECL SRAM | 1 |
| 15 | 99 | |
| 16 | 1 | |
| 17 | 14 | |
| 18 | 20 ns 512 kb DRAM with 83 MHz page operation. | 2 |
| 19 | 19 | |
| 20 | 21 |
About R. Franch
R. Franch is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Industrial and Manufacturing Engineering, having authored 44 papers that have together received 663 indexed citations. Recurring topics across this work include Semiconductor materials and devices (21 papers), Low-power high-performance VLSI design (17 papers) and Advancements in Semiconductor Devices and Circuit Design (14 papers). The work is most often cited by research in Hardware and Architecture (224 citations), Electrical and Electronic Engineering (588 citations) and Computer Networks and Communications (74 citations). R. Franch has collaborated with scholars based in United States, Spain and Germany. Frequent co-authors include P.J. Restle, B.A. Chappell, T.I. Chappell, S.E. Schuster, N. James, S. P. Klepner, W. Huott, Kenneth L. Shepard, W.H. Henkels and Nicky Lu. Their work appears in journals such as IEEE Journal of Solid-State Circuits, IEEE Transactions on Electron Devices and IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.