Yayi Wei
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
-
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
Papers in
-
- Optical Coatings and Gratings 24
- Electron and X-Ray Spectroscopy Techniques 20
-
- Industrial Vision Systems and Defect Detection 39
- Co-authors
- Lisong DongXu MaYajuan SuLibin ZhangRobert L. BrainardThomas I. WallowTianchun YeKaren Petrillo
- Journals
- Optics Express (19 papers)Applied Optics (16 papers)Journal of Micro/Nanolithography MEMS and MOEMS (8 papers)Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena (6 papers)IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (3 papers)
- Partner nations
- ChinaUnited StatesSingapore
In The Last Decade
Yayi Wei
134 papers receiving 671 citations
Peers
Comparison fields: 5 of 54
- Surfaces, Coatings and Films 175
- Electrical and Electronic Engineering 623
- Media Technology 79
- Industrial and Manufacturing Engineering 75
- Biomedical Engineering 266
Countries citing papers authored by Yayi Wei
This map shows the geographic impact of Yayi Wei's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yayi Wei with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yayi Wei more than expected).
Fields of papers citing papers by Yayi Wei
This network shows the impact of papers produced by Yayi Wei. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yayi Wei. The network helps show where Yayi Wei may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Yayi Wei, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 0 | |
| 2 | 2025 | 0 | |
| 3 | 2024 | 0 | |
| 4 | 2024 | 1 | |
| 5 | 2024 | 7 | |
| 6 | 2024 | 2 | |
| 7 | 2023 | 1 | |
| 8 | 2023 | 3 | |
| 9 | 2023 | 2 | |
| 10 | 2023 | 0 | |
| 11 | 2023 | 3 | |
| 12 | 2022 | 6 | |
| 13 | 2022 | 2 | |
| 14 | 2022 | 3 | |
| 15 | 2022 | 4 | |
| 16 | 2022 | 10 | |
| 17 | 2020 | 1 | |
| 18 | 2020 | 12 | |
| 19 | 2020 | 0 | |
| 20 | 2017 | 7 |
About Yayi Wei
Yayi Wei is a scholar working on Surfaces, Coatings and Films, Industrial and Manufacturing Engineering, Media Technology, Electrical and Electronic Engineering and Hardware and Architecture, having authored 178 papers that have together received 769 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (124 papers), Integrated Circuits and Semiconductor Failure Analysis (42 papers), Industrial Vision Systems and Defect Detection (39 papers), Image Processing Techniques and Applications (26 papers), Advanced Surface Polishing Techniques (25 papers), Optical Coatings and Gratings (24 papers), Semiconductor materials and devices (21 papers) and Electron and X-Ray Spectroscopy Techniques (20 papers). The work is most often cited by research in Surfaces, Coatings and Films (175 citations), Electrical and Electronic Engineering (623 citations), Media Technology (79 citations), Industrial and Manufacturing Engineering (75 citations) and Biomedical Engineering (266 citations). Yayi Wei has collaborated with scholars based in China, United States and Singapore. Frequent co-authors include Lisong Dong, Xu Ma, Yajuan Su, Libin Zhang, Robert L. Brainard, Thomas I. Wallow, Tianchun Ye, Karen Petrillo, Yuliang He and Min Liu. Their work appears in journals such as Optics Express, Applied Optics, Journal of Micro/Nanolithography MEMS and MOEMS, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.