Daniel Corliss
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques 8
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- Advancements in Photolithography Techniques 21
- Integrated Circuits and Semiconductor Failure Analysis 9
- Laser Design and Applications 2
- 3D IC and TSV technologies 2
-
- Advanced Surface Polishing Techniques 3
- Nanofabrication and Lithography Techniques 3
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- Advanced Measurement and Metrology Techniques 2
- Co-authors
- John ArnoldT. DaltonHerbert H. SawinNelson FelixKafai LaiRichard A. FarrellChi‐Chun LiuCheng Chi
- Journals
- Journal of The Electrochemical Society (1 paper)Nature Electronics (1 paper)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (1 paper)
- Partner nations
- United StatesGermanyNetherlands
In The Last Decade
Daniel Corliss
22 papers receiving 294 citations
Peers
Comparison fields: 5 of 37
- Surfaces, Coatings and Films 73
- Electrical and Electronic Engineering 212
- Materials Chemistry 107
- Acoustics and Ultrasonics 2
- Media Technology 18
Countries citing papers authored by Daniel Corliss
This map shows the geographic impact of Daniel Corliss's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Daniel Corliss with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Daniel Corliss more than expected).
Fields of papers citing papers by Daniel Corliss
This network shows the impact of papers produced by Daniel Corliss. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Daniel Corliss. The network helps show where Daniel Corliss may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Daniel Corliss, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2019 | 1 | |
| 2 | 2019 | 1 | |
| 3 | 2019 | 0 | |
| 4 | 2018 | 110 | |
| 5 | 2017 | 2 | |
| 6 | 2017 | 7 | |
| 7 | 2016 | 7 | |
| 8 | 2015 | 7 | |
| 9 | 2015 | 4 | |
| 10 | 2015 | 7 | |
| 11 | 2014 | 7 | |
| 12 | 2013 | 5 | |
| 13 | 2013 | 4 | |
| 14 | 2011 | 4 | |
| 15 | 2010 | 40 | |
| 16 | 2006 | 6 | |
| 17 | 2004 | 22 | |
| 18 | 1997 | 1 | |
| 19 | 1996 | 6 | |
| 20 | 1993 | 58 |
About Daniel Corliss
Daniel Corliss is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering, Industrial and Manufacturing Engineering, Hardware and Architecture and Computational Mechanics, having authored 23 papers that have together received 311 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (21 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers), Electron and X-Ray Spectroscopy Techniques (8 papers), Advanced Surface Polishing Techniques (3 papers), Nanofabrication and Lithography Techniques (3 papers), Laser Design and Applications (2 papers), Advanced Measurement and Metrology Techniques (2 papers) and 3D IC and TSV technologies (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (73 citations), Electrical and Electronic Engineering (212 citations), Materials Chemistry (107 citations), Acoustics and Ultrasonics (2 citations) and Media Technology (18 citations). Daniel Corliss has collaborated with scholars based in United States, Germany and Netherlands. Frequent co-authors include John Arnold, T. Dalton, Herbert H. Sawin, Nelson Felix, Kafai Lai, Richard A. Farrell, Chi‐Chun Liu, Cheng Chi, Yann Mignot and Hsinyu Tsai. Their work appears in journals such as Journal of The Electrochemical Society, Nature Electronics, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.