Hye-Keun Oh
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques 34
- Optical Coatings and Gratings 16
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- Advancements in Photolithography Techniques 125
- Integrated Circuits and Semiconductor Failure Analysis 37
- 3D IC and TSV technologies 14
- Silicon and Solar Cell Technologies 13
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- Advanced Surface Polishing Techniques 22
- Nanofabrication and Lithography Techniques 19
Hye-Keun Oh
132 papers receiving 454 citations
Peers
Comparison fields: 5 of 53
- Surfaces, Coatings and Films 156
- Electrical and Electronic Engineering 368
- Structural Biology 7
- Biomedical Engineering 191
- Acoustics and Ultrasonics 3
Countries citing papers authored by Hye-Keun Oh
This map shows the geographic impact of Hye-Keun Oh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Hye-Keun Oh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Hye-Keun Oh more than expected).
Fields of papers citing papers by Hye-Keun Oh
This network shows the impact of papers produced by Hye-Keun Oh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Hye-Keun Oh. The network helps show where Hye-Keun Oh may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Hye-Keun Oh, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2023 | 2 | |
| 2 | 2023 | 3 | |
| 3 | 2021 | 3 | |
| 4 | 2021 | 2 | |
| 5 | 2019 | 2 | |
| 6 | 2017 | 1 | |
| 7 | 2017 | 2 | |
| 8 | 2016 | 1 | |
| 9 | 2016 | 1 | |
| 10 | 2014 | 4 | |
| 11 | 2011 | 3 | |
| 12 | 2009 | 3 | |
| 13 | 2008 | 4 | |
| 14 | Improvement of column spacer uniformity in a TFT LCD panel | 2006 | 2 |
| 15 | Modeling for resist reflow of an elongated contact hole | 2006 | 2 |
| 16 | Bulk effects of thermal flow resists | 2005 | 1 |
| 17 | 2005 | 1 | |
| 18 | A practical method of extracting the photoresist exposure parameters by using a dose-to-clear swing curve | 2003 | 1 |
| 19 | Resist Pattern Collapse Modeling for Smaller Features | 2003 | 4 |
| 20 | 2003 | 3 |
About Hye-Keun Oh
Hye-Keun Oh is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Industrial and Manufacturing Engineering, having authored 147 papers that have together received 485 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (125 papers), Integrated Circuits and Semiconductor Failure Analysis (37 papers), Electron and X-Ray Spectroscopy Techniques (34 papers), Advanced Surface Polishing Techniques (22 papers), Nanofabrication and Lithography Techniques (19 papers), Optical Coatings and Gratings (16 papers), 3D IC and TSV technologies (14 papers) and Silicon and Solar Cell Technologies (13 papers). The work is most often cited by research in Surfaces, Coatings and Films (156 citations), Electrical and Electronic Engineering (368 citations) and Structural Biology (7 citations). Hye-Keun Oh has collaborated with scholars based in South Korea, United States and Belgium. Frequent co-authors include Ilsin An, Michael Yeung, Eytan Barouch, Sunggyu Lee, In-Seon Kim, Jiwon Kim, Eun‐Sang Park, C. S. Parmenter, Sunghwan Kim and Taehyung Kim. Their work appears in journals such as The Journal of Physical Chemistry, RSC Advances and Japanese Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.