Abraham Arceo

1.5k total citations
18 papers, 324 citations indexed

About

Abraham Arceo is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Surfaces, Coatings and Films. According to data from OpenAlex, Abraham Arceo has authored 18 papers receiving a total of 324 indexed citations (citations by other indexed papers that have themselves been cited), including 14 papers in Electrical and Electronic Engineering, 6 papers in Materials Chemistry and 5 papers in Surfaces, Coatings and Films. Recurrent topics in Abraham Arceo's work include Integrated Circuits and Semiconductor Failure Analysis (9 papers), Advancements in Photolithography Techniques (8 papers) and Electron and X-Ray Spectroscopy Techniques (5 papers). Abraham Arceo is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (9 papers), Advancements in Photolithography Techniques (8 papers) and Electron and X-Ray Spectroscopy Techniques (5 papers). Abraham Arceo collaborates with scholars based in United States, Germany and Japan. Abraham Arceo's co-authors include Peter F. Green, Luciana Meli, Benjamin Bunday, Hui Zhou, Brian M. Barnes, Richard M. Silver, Ravikiran Attota, Victor Vartanian, András Vládar and Oliver D. Patterson and has published in prestigious journals such as Nano Letters, The Journal of Physical Chemistry B and Optics Express.

In The Last Decade

Abraham Arceo

18 papers receiving 302 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Abraham Arceo United States 10 150 108 97 85 66 18 324
Sung Chan Park South Korea 13 219 1.5× 290 2.7× 106 1.1× 38 0.4× 26 0.4× 26 404
Noel Corcoran United States 8 316 2.1× 100 0.9× 89 0.9× 35 0.4× 156 2.4× 21 386
Kanaiyalal C. Patel United States 10 131 0.9× 295 2.7× 114 1.2× 74 0.9× 17 0.3× 13 367
Daniel Corliss United States 8 212 1.4× 107 1.0× 72 0.7× 73 0.9× 4 0.1× 23 311
Jean‐Baptiste Doucet France 10 205 1.4× 22 0.2× 130 1.3× 33 0.4× 29 0.4× 40 313
Joo-Tae Moon South Korea 8 311 2.1× 147 1.4× 127 1.3× 42 0.5× 13 0.2× 68 382
T.E. Kopley United States 9 304 2.0× 146 1.4× 136 1.4× 19 0.2× 23 0.3× 25 468
Gee Sung Chae South Korea 10 292 1.9× 234 2.2× 70 0.7× 13 0.2× 62 0.9× 17 370
Sang Hee Lee South Korea 12 323 2.2× 155 1.4× 103 1.1× 43 0.5× 19 0.3× 50 443
Hiroshi Kiguchi Japan 4 351 2.3× 76 0.7× 149 1.5× 23 0.3× 35 0.5× 6 400

Countries citing papers authored by Abraham Arceo

Since Specialization
Citations

This map shows the geographic impact of Abraham Arceo's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Abraham Arceo with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Abraham Arceo more than expected).

Fields of papers citing papers by Abraham Arceo

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Abraham Arceo. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Abraham Arceo. The network helps show where Abraham Arceo may publish in the future.

Co-authorship network of co-authors of Abraham Arceo

This figure shows the co-authorship network connecting the top 25 collaborators of Abraham Arceo. A scholar is included among the top collaborators of Abraham Arceo based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Abraham Arceo. Abraham Arceo is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

18 of 18 papers shown
1.
Baskar, J. F., et al.. (2018). Ultra-low resistivity aluminum doped ZnO thin films on flexible substrates using sol-gel solution deposition. Thin Solid Films. 664. 41–45. 7 indexed citations
2.
Silva, Anuja De, Indira Seshadri, Abraham Arceo, et al.. (2017). Development of TiO2 containing hardmasks through PEALD deposition. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 10146. 1014615–1014615. 1 indexed citations
3.
Silva, Anuja De, Indira Seshadri, Abraham Arceo, et al.. (2017). Development of TiO2 containing hardmasks through plasma-enhanced atomic layer deposition. Journal of Micro/Nanolithography MEMS and MOEMS. 16(2). 23504–23504. 1 indexed citations
4.
Silva, Anuja De, Indira Seshadri, Abraham Arceo, et al.. (2016). Study of alternate hardmasks for extreme ultraviolet patterning. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 34(6). 12 indexed citations
5.
Barnes, Brian M., et al.. (2014). Optical volumetric inspection of sub-20nm patterned defects with wafer noise. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9050. 905016–905016. 1 indexed citations
6.
Ito, Wataru, Benjamin Bunday, Abraham Arceo, et al.. (2014). Novel three dimensional (3D) CD-SEM profile measurements. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9050. 90500D–90500D. 5 indexed citations
7.
Bunday, Benjamin, et al.. (2014). CD-SEM metrology for sub-10nm width features. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9050. 90500T–90500T. 25 indexed citations
8.
Barnes, Brian M., et al.. (2013). Enhancing 9 nm node dense patterned defect optical inspection using polarization, angle, and focus. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8681. 86810E–86810E. 18 indexed citations
9.
Arceo, Abraham, Benjamin Bunday, & Ravikiran Attota. (2013). Use of TSOM for sub-11nm node pattern defect detection and HAR features. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8681. 86812G–86812G. 8 indexed citations
10.
Barnes, Brian M., et al.. (2013). Three-dimensional deep sub-wavelength defect detection using λ = 193 nm optical microscopy. Optics Express. 21(22). 26219–26219. 29 indexed citations
11.
Patterson, Oliver D., et al.. (2013). In-line E-beam wafer metrology and defect inspection: the end of an era for image-based critical dimensional metrology? New life for defect inspection. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8681. 86810D–86810D. 24 indexed citations
12.
Barnes, Brian M., et al.. (2012). Scatterfield microscopy of 22-nm node patterned defects using visible and DUV light. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8324. 83240F–83240F. 15 indexed citations
13.
Arceo, Abraham, Benjamin Bunday, Victor Vartanian, & Ravikiran Attota. (2012). Patterned defect and CD metrology by TSOM beyond the 22-nm node. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8324. 83240E–83240E. 22 indexed citations
14.
Humphris, Andrew D. L., et al.. (2011). High-speed atmospheric imaging of semiconductor wafers using rapid probe microscopy. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7971. 797119–797119. 3 indexed citations
15.
Hartley, John G., et al.. (2011). 13nm gate Intentional Defect Array (IDA) wafer patterning by e-beam lithography for defect metrology evaluation. Microelectronic Engineering. 88(8). 2729–2731. 5 indexed citations
16.
Meli, Luciana, Abraham Arceo, & Peter F. Green. (2008). Control of the entropic interactions and phase behavior of athermal nanoparticle/homopolymer thin film mixtures. Soft Matter. 5(3). 533–537. 82 indexed citations
17.
Arceo, Abraham, Luciana Meli, & Peter F. Green. (2008). Glass Transition of Polymer−Nanocrystal Thin Film Mixtures: Role of Entropically Directed Forces on Nanocrystal Distribution. Nano Letters. 8(8). 2271–2276. 42 indexed citations
18.
Arceo, Abraham & Peter F. Green. (2005). Ordering Transition of Block Copolymer Films. The Journal of Physical Chemistry B. 109(15). 6958–6962. 24 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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