Mark D. Smith
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 23
- Optical Coatings and Gratings 8
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- Advancements in Photolithography Techniques 59
- Integrated Circuits and Semiconductor Failure Analysis 22
- Semiconductor materials and devices 7
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- Advanced Surface Polishing Techniques 8
- Nanofabrication and Lithography Techniques 6
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- Surface and Thin Film Phenomena 5
- Co-authors
- John J. BiaforeChris A. MackStewart A. RobertsonChao FangAlessandro Vaglio PretJeffrey D. ByersJames W. ThackerayJeff D. Byers
- Journals
- Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena (2 papers)Journal of Photopolymer Science and Technology (1 paper)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (1 paper)
- Partner nations
- United StatesBelgiumSouth Korea
In The Last Decade
Mark D. Smith
61 papers receiving 361 citations
Peers
Comparison fields: 5 of 31
- Surfaces, Coatings and Films 208
- Electrical and Electronic Engineering 411
- Hardware and Architecture 25
- Industrial and Manufacturing Engineering 33
- Biomedical Engineering 127
Countries citing papers authored by Mark D. Smith
This map shows the geographic impact of Mark D. Smith's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Mark D. Smith with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Mark D. Smith more than expected).
Fields of papers citing papers by Mark D. Smith
This network shows the impact of papers produced by Mark D. Smith. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Mark D. Smith. The network helps show where Mark D. Smith may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Mark D. Smith, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2023 | 4 | |
| 2 | 2023 | 0 | |
| 3 | 2016 | 0 | |
| 4 | 2014 | 7 | |
| 5 | 2014 | 11 | |
| 6 | A comparison of processes and challenges between organic, a-Si:H, and oxide TFTs for active matrix backplanes on plastic | 2012 | 4 |
| 7 | 2011 | 12 | |
| 8 | 2011 | 12 | |
| 9 | 2010 | 2 | |
| 10 | 2009 | 36 | |
| 11 | 2009 | 1 | |
| 12 | 2007 | 6 | |
| 13 | 2007 | 5 | |
| 14 | 2007 | 7 | |
| 15 | 2006 | 6 | |
| 16 | 2005 | 3 | |
| 17 | 2003 | 4 | |
| 18 | 2002 | 8 | |
| 19 | 2001 | 6 | |
| 20 | 2000 | 1 |
About Mark D. Smith
Mark D. Smith is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering, Media Technology, Industrial and Manufacturing Engineering and Radiation, having authored 65 papers that have together received 429 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (59 papers), Electron and X-Ray Spectroscopy Techniques (23 papers), Integrated Circuits and Semiconductor Failure Analysis (22 papers), Advanced Surface Polishing Techniques (8 papers), Optical Coatings and Gratings (8 papers), Semiconductor materials and devices (7 papers), Nanofabrication and Lithography Techniques (6 papers) and Surface and Thin Film Phenomena (5 papers). The work is most often cited by research in Surfaces, Coatings and Films (208 citations), Electrical and Electronic Engineering (411 citations), Hardware and Architecture (25 citations), Industrial and Manufacturing Engineering (33 citations) and Biomedical Engineering (127 citations). Mark D. Smith has collaborated with scholars based in United States, Belgium and South Korea. Frequent co-authors include John J. Biafore, Chris A. Mack, Stewart A. Robertson, Chao Fang, Alessandro Vaglio Pret, Jeffrey D. Byers, James W. Thackeray, Jeff D. Byers, John S. Petersen and Roel Gronheid. Their work appears in journals such as Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Journal of Photopolymer Science and Technology, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, SID Symposium Digest of Technical Papers and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.