Frieda Van Roey
- Electrical and Electronic Engineering top 10%
- Surfaces, Coatings and Films top 5%
- Biomedical Engineering
- Computational Mechanics
- Materials Chemistry
- Co-authors
- Gian F. LorussoRoel GronheidChris A. MackYasin EkinciAlain MoussaHarun H. SolakKurt RonseDavid Van Steenwinckel
- Topics
- Advancements in Photolithography Techniques (42 papers)Integrated Circuits and Semiconductor Failure Analysis (24 papers)Electron and X-Ray Spectroscopy Techniques (19 papers)
- Cited by
- Surfaces, Coatings and FilmsElectrical and Electronic EngineeringIndustrial and Manufacturing Engineering
- Journals
- Chemistry of MaterialsMicroelectronic EngineeringJournal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
- Partner nations
- BelgiumUnited StatesNetherlands
In The Last Decade
Frieda Van Roey
43 papers receiving 426 citations
Peers
Comparison fields: 5 of 40
- Electrical and Electronic Engineering 403
- Surfaces, Coatings and Films 191
- Biomedical Engineering 159
- Computational Mechanics 49
- Materials Chemistry 37
Countries citing papers authored by Frieda Van Roey
This map shows the geographic impact of Frieda Van Roey's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Frieda Van Roey with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Frieda Van Roey more than expected).
Fields of papers citing papers by Frieda Van Roey
This network shows the impact of papers produced by Frieda Van Roey. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Frieda Van Roey. The network helps show where Frieda Van Roey may publish in the future.
Co-authorship network of co-authors of Frieda Van Roey
This figure shows the co-authorship network connecting the top 25 collaborators of Frieda Van Roey. A scholar is included among the top collaborators of Frieda Van Roey based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Frieda Van Roey. Frieda Van Roey is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 0 | |
| 3 | 9 | |
| 4 | 9 | |
| 5 | 3 | |
| 6 | 21 | |
| 7 | 9 | |
| 8 | 15 | |
| 9 | 6 | |
| 10 | 11 | |
| 11 | 3 | |
| 12 | 10 | |
| 13 | 24 | |
| 14 | 17 | |
| 15 | 16 | |
| 16 | 1 | |
| 17 | 6 | |
| 18 | 1 | |
| 19 | 1 | |
| 20 | 3 |
About Frieda Van Roey
Frieda Van Roey is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Computational Mechanics, having authored 45 papers that have together received 463 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (42 papers), Integrated Circuits and Semiconductor Failure Analysis (24 papers) and Electron and X-Ray Spectroscopy Techniques (19 papers). The work is most often cited by research in Surfaces, Coatings and Films (191 citations), Electrical and Electronic Engineering (403 citations) and Industrial and Manufacturing Engineering (36 citations). Frieda Van Roey has collaborated with scholars based in Belgium, United States and Netherlands. Frequent co-authors include Gian F. Lorusso, Roel Gronheid, Chris A. Mack, Yasin Ekinci, Alain Moussa, Harun H. Solak, Kurt Ronse, David Van Steenwinckel, Dieter Van den Heuvel and Ivan Pollentier. Their work appears in journals such as Chemistry of Materials, Microelectronic Engineering and Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.