T. Dalton
- Electrical and Electronic Engineering top 10%
- Mechanics of Materials top 5%
- Electronic, Optical and Magnetic Materials top 10%
- Materials Chemistry
- Biomedical Engineering
- Co-authors
- G. S. OehrleinT. E. F. M. StandaertChrister HedlundEric JosephStacey F. BentNicholas FullerMarcus A. WorsleyP. J. Matsuo
- Topics
- Copper Interconnects and Reliability (12 papers)Semiconductor materials and devices (11 papers)Metal and Thin Film Mechanics (6 papers)
- Cited by
- Electronic, Optical and Magnetic MaterialsMechanics of MaterialsElectrical and Electronic Engineering
- Journals
- Journal of Applied PhysicsJournal of The Electrochemical SocietyJournal of Chromatography A
- Partner nations
- United StatesCanadaTaiwan
In The Last Decade
T. Dalton
24 papers receiving 648 citations
Peers
Comparison fields: 5 of 50
- Electrical and Electronic Engineering 574
- Mechanics of Materials 254
- Electronic, Optical and Magnetic Materials 230
- Materials Chemistry 169
- Biomedical Engineering 90
Countries citing papers authored by T. Dalton
This map shows the geographic impact of T. Dalton's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. Dalton with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. Dalton more than expected).
Fields of papers citing papers by T. Dalton
This network shows the impact of papers produced by T. Dalton. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. Dalton. The network helps show where T. Dalton may publish in the future.
Co-authorship network of co-authors of T. Dalton
This figure shows the co-authorship network connecting the top 25 collaborators of T. Dalton. A scholar is included among the top collaborators of T. Dalton based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with T. Dalton. T. Dalton is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 7 | |
| 2 | 72 | |
| 3 | 1 | |
| 4 | 2 | |
| 5 | 1 | |
| 6 | 241 | |
| 7 | 3 | |
| 8 | 1 | |
| 9 | 4 | |
| 10 | 45 | |
| 11 | 64 | |
| 12 | 7 | |
| 13 | 1 | |
| 14 | 1 | |
| 15 | 2 | |
| 16 | 23 | |
| 17 | 58 | |
| 18 | 7 | |
| 19 | 0 | |
| 20 | 16 |
About T. Dalton
T. Dalton is a scholar working on Electronic, Optical and Magnetic Materials, Surfaces, Coatings and Films and Electrical and Electronic Engineering, having authored 25 papers that have together received 677 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (12 papers), Semiconductor materials and devices (11 papers) and Metal and Thin Film Mechanics (6 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (230 citations), Mechanics of Materials (254 citations) and Electrical and Electronic Engineering (574 citations). T. Dalton has collaborated with scholars based in United States, Canada and Taiwan. Frequent co-authors include G. S. Oehrlein, T. E. F. M. Standaert, Christer Hedlund, Eric Joseph, Stacey F. Bent, Nicholas Fuller, Marcus A. Worsley, P. J. Matsuo, Susan D. Allen and Herbert H. Sawin. Their work appears in journals such as Journal of Applied Physics, Journal of The Electrochemical Society and Journal of Chromatography A.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.