Anthony R. Forte
- Electrical and Electronic Engineering
- Biomedical Engineering
- Surfaces, Coatings and Films top 10%
- Atomic and Molecular Physics, and Optics
- Mechanical Engineering
- Co-authors
- S. C. PalmateerRoderick R. KunzT. M. LyszczarzM. RothschildCarol LivermoreArturo A. AyónS.D. UmansChristine M. Nelson
- Topics
- Advancements in Photolithography Techniques (12 papers)Advanced Surface Polishing Techniques (2 papers)Laser Design and Applications (2 papers)
- Journals
- Applied Physics LettersJournal of Vacuum Science & Technology A Vacuum Surfaces and FilmsIBM Journal of Research and Development
- Partner nations
- United States
In The Last Decade
Anthony R. Forte
15 papers receiving 263 citations
Peers
Comparison fields: 5 of 35
- Electrical and Electronic Engineering 245
- Biomedical Engineering 108
- Surfaces, Coatings and Films 60
- Atomic and Molecular Physics, and Optics 30
- Mechanical Engineering 27
Countries citing papers authored by Anthony R. Forte
This map shows the geographic impact of Anthony R. Forte's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Anthony R. Forte with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Anthony R. Forte more than expected).
Fields of papers citing papers by Anthony R. Forte
This network shows the impact of papers produced by Anthony R. Forte. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Anthony R. Forte. The network helps show where Anthony R. Forte may publish in the future.
Co-authorship network of co-authors of Anthony R. Forte
This figure shows the co-authorship network connecting the top 25 collaborators of Anthony R. Forte. A scholar is included among the top collaborators of Anthony R. Forte based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Anthony R. Forte. Anthony R. Forte is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 46 | |
| 2 | Subwavelength Optical Lithography with Phase-Shift Photomasks | 9 |
| 3 | 2 | |
| 4 | 3 | |
| 5 | 30 | |
| 6 | 4 | |
| 7 | 74 | |
| 8 | 14 | |
| 9 | 7 | |
| 10 | 6 | |
| 11 | 52 | |
| 12 | 1 | |
| 13 | 3 | |
| 14 | 16 | |
| 15 | 9 | |
| 16 | 8 |
About Anthony R. Forte
Anthony R. Forte is a scholar working on Instrumentation, Surfaces, Coatings and Films and Electrical and Electronic Engineering, having authored 16 papers that have together received 284 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (12 papers), Advanced Surface Polishing Techniques (2 papers) and Laser Design and Applications (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (60 citations), Electrical and Electronic Engineering (245 citations) and Biomedical Engineering (108 citations). Anthony R. Forte has collaborated with scholars based in United States. Frequent co-authors include S. C. Palmateer, Roderick R. Kunz, T. M. Lyszczarz, M. Rothschild, Carol Livermore, Arturo A. Ayón, S.D. Umans, Christine M. Nelson, Jeffrey H. Lang and Mark W. Horn. Their work appears in journals such as Applied Physics Letters, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and IBM Journal of Research and Development.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.