M. Rothschild

3.6k total citations
172 papers, 2.8k citations indexed

About

M. Rothschild is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Computational Mechanics. According to data from OpenAlex, M. Rothschild has authored 172 papers receiving a total of 2.8k indexed citations (citations by other indexed papers that have themselves been cited), including 128 papers in Electrical and Electronic Engineering, 73 papers in Biomedical Engineering and 54 papers in Computational Mechanics. Recurrent topics in M. Rothschild's work include Advancements in Photolithography Techniques (65 papers), Laser Material Processing Techniques (37 papers) and Nanofabrication and Lithography Techniques (28 papers). M. Rothschild is often cited by papers focused on Advancements in Photolithography Techniques (65 papers), Laser Material Processing Techniques (37 papers) and Nanofabrication and Lithography Techniques (28 papers). M. Rothschild collaborates with scholars based in United States, Germany and Singapore. M. Rothschild's co-authors include D. J. Ehrlich, Vladimir Liberman, Roderick R. Kunz, M. Switkes, T. M. Bloomstein, Jan Sedláček, S. T. Palmacci, C. Arnone, David C. Shaver and Mark W. Horn and has published in prestigious journals such as Advanced Materials, Applied Physics Letters and The Journal of Immunology.

In The Last Decade

M. Rothschild

167 papers receiving 2.6k citations

Peers

Countries citing papers authored by M. Rothschild

Since Specialization

Citations

This map shows the geographic impact of M. Rothschild's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Rothschild with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Rothschild more than expected).

Fields of papers citing papers by M. Rothschild

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Rothschild. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Rothschild. The network helps show where M. Rothschild may publish in the future.

Co-authorship network of co-authors of M. Rothschild

This figure shows the co-authorship network connecting the top 25 collaborators of M. Rothschild. A scholar is included among the top collaborators of M. Rothschild based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Rothschild. M. Rothschild is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work	Indexed citations
1	Predicting the Thermal Behavior in Functional Textile Fibers Having Embedded Electronics 2022 ·Advanced Fiber Materials ·Shaun Berry, Shawn M. Redmond, Tairan Wang, M. Rothschild	1
2	Enhanced coupling of broadband light into amorphous silicon via periodic nanoplasmonic arrays 2018 ·Nanotechnology ·Vladimir Liberman, (unknown), M. Rothschild, (unknown), (unknown), (unknown), (unknown), (unknown), Richard M. Osgood	1
3	Noncontact detection of homemade explosive constituents via photodissociation followed by laser-induced fluorescence 2010 ·Optics Express ·Charles M. Wynn, S. T. Palmacci, Roderick R. Kunz, M. Rothschild	42
4	A Nanoparticle Convective Directed Assembly Process for the Fabrication of Periodic Surface Enhanced Raman Spectroscopy Substrates 2010 ·Advanced Materials ·Vladimir Liberman, Cihan Yılmaz, T. M. Bloomstein, (unknown), Yolanda Echegoyen Sanz, Ahmed Busnaina, (unknown), K. E. Krohn, (unknown), M. Rothschild	98
5	Detection of condensed-phase explosives via laser-induced vaporization, photodissociation, and resonant excitation 2008 ·Applied Optics ·Charles M. Wynn, S. T. Palmacci, Roderick R. Kunz, (unknown), M. Rothschild	33
6	Nanoscale selective area epitaxy: towards lithographically defined quantum dots at 1.5 /spl mu/m using direct lithographic patterning 2005 ·R.B. Swint, P Juodawlkis, Douglas C. Oakley, A. Napoleone, C.J. Vineis, (unknown), G. W. Turner, J.C. Twichell, T. M. Bloomstein, (unknown), N. N. Efremow, D. E. Hardy, (unknown), M. Rothschild	2
7	Controlled contamination studies in 193-nm immersion lithography 2005 ·Vladimir Liberman, S. T. Palmacci, D. E. Hardy, M. Rothschild, Andrew Grenville	8
8	A 157-nm immersion microstepper 2005 ·M. Switkes, T. M. Bloomstein, M. Rothschild, (unknown), (unknown)	2
9	Liquid immersion lithography: Why, how, and when? 2004 ·Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·M. Rothschild, T. M. Bloomstein, Roderick R. Kunz, (unknown), M. Switkes, S. T. Palmacci, Jan Sedláček, D. E. Hardy, Andrew Grenville	35
10	157-nm pellicles: polymer design for transparency and lifetime 2002 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Roger H. French, Robert C. Wheland, Weiming Qiu, M. F. Lemon, Gregory S. Blackman, Xun Zhang, (unknown), Vladimir Liberman, Andrew Grenville, Roderick R. Kunz, M. Rothschild	12
11	Excimer-laser-induced degradation of fused silica and calcium fluoride for 193-nm lithographic applications 1999 ·Optics Letters ·Vladimir Liberman, M. Rothschild, Jan Sedláček, (unknown), Andrew Grenville, (unknown), (unknown)	25
12	Excimer-laser-induced densification of fused silica:laser-fluence and material-grade effects on the scaling law 1999 ·Journal of Non-Crystalline Solids ·Vladimir Liberman, M. Rothschild, Jan Sedláček, (unknown), Andrew Grenville	22
13	Long-term 193-nm laser-induced degradation of fused silica and calcium fluoride 1999 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Vladimir Liberman, M. Rothschild, Jan Sedláček, (unknown), (unknown), (unknown)	1
14	Damage testing of pellicles for 193-nm lithography 1998 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Vladimir Liberman, Roderick R. Kunz, M. Rothschild, Jan Sedláček, (unknown), Andrew Grenville, (unknown), (unknown)	1
15	The hinge deletion allelic variant of porcine IgA results from a mutation at the splice acceptor site in the first C alpha intron. 1995 ·The Journal of Immunology ·William R. Brown, Imre Kacskovıcs, Brad A. Amendt, (unknown), M. Rothschild, (unknown), J.E. Butler	31
16	Profile control in dry development of high-aspect-ratio resist structures 1995 ·Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·M. B. Stern, S. C. Palmateer, Mark W. Horn, M. Rothschild, (unknown), (unknown)	5
17	Photolithography at 193 nm 1992 ·Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·M. Rothschild, Russell B. Goodman, Mark A. Hartney, Mark W. Horn, Roderick R. Kunz, Jan Sedláček, David C. Shaver	15
18	Laser patterning of metal oxide superconductor films by reactive solid-state transformation 1988 ·IEEE Electron Device Letters ·M. Rothschild, Jan Sedláček, Jerry G. Black, D. J. Ehrlich	11
19	<title>Excimer Projection Lithography At 193-nm Wavelength</title> 1988 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·M. Rothschild, D. J. Ehrlich, Burn J. Lin	2
20	Visible-laser photochemical etching of Cr, Mo, and W 1987 ·Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ·M. Rothschild, Jan Sedláček, Jerry G. Black, D. J. Ehrlich	6

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact