P. Mertens

661 total citations
25 papers, 288 citations indexed

About

P. Mertens is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Biomedical Engineering. According to data from OpenAlex, P. Mertens has authored 25 papers receiving a total of 288 indexed citations (citations by other indexed papers that have themselves been cited), including 19 papers in Electrical and Electronic Engineering, 6 papers in Materials Chemistry and 5 papers in Biomedical Engineering. Recurrent topics in P. Mertens's work include Semiconductor materials and devices (7 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers) and Silicon and Solar Cell Technologies (5 papers). P. Mertens is often cited by papers focused on Semiconductor materials and devices (7 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers) and Silicon and Solar Cell Technologies (5 papers). P. Mertens collaborates with scholars based in Belgium, Netherlands and United States. P. Mertens's co-authors include Guy Vereecke, M. M. Heyns, Rita Vos, Marc Heyns, H. Schmidt, Kai Xu, Wim Fyen, Chris Vinckier, Jan Fransaer and Sophia Arnauts and has published in prestigious journals such as Journal of The Electrochemical Society, International Journal of Pharmaceutics and Japanese Journal of Applied Physics.

In The Last Decade

P. Mertens

21 papers receiving 277 citations

Peers

Countries citing papers authored by P. Mertens

Since Specialization

Citations

This map shows the geographic impact of P. Mertens's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Mertens with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Mertens more than expected).

Fields of papers citing papers by P. Mertens

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. Mertens. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Mertens. The network helps show where P. Mertens may publish in the future.

Co-authorship network of co-authors of P. Mertens

This figure shows the co-authorship network connecting the top 25 collaborators of P. Mertens. A scholar is included among the top collaborators of P. Mertens based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with P. Mertens. P. Mertens is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	A comparative study between melt granulation/compression and hot melt extrusion/injection molding for the manufacturing of oral sustained release thermoplastic polyurethane matrices 2016 ·International Journal of Pharmaceutics ·G. Verstraete, P. Mertens, W. Grymonpré, Pieter-Jan Van Bockstal, Thomas De Beer, Matthieu Boone, Luc Van Hoorebeke, Jean Paul Remon, Chris Vervaet	30
2	Leaching and drying marks on photoresist-coated substrates 2013 ·Microelectronic Engineering ·(unknown), (unknown), P. Mertens, Herbert Struyf	1
3	Dynamics of the Drying Defects Left by Residual Ultra-Pure Water Droplets on Silicon Substrate 2012 ·ECS Journal of Solid State Science and Technology ·(unknown), (unknown), P. Mertens, Herbert Struyf, XiuMei Xu	17
4	Non‐destructive characterization of saw damage in silicon photovoltaics substrates by means of photomodulated optical reflectance 2012 ·Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics ·Janusz Bogdanowicz, P. Mertens, Emanuele Cornagliotti, Kurt Wostyn, J. Penaud, P. Jaffrennou, (unknown), W. Vandervorst	1
5	Damage Clustering and Damage-Size Distributions After Megasonic Cleaning 2007 ·ECS Meeting Abstracts ·Cinzia De Marco, Kurt Wostyn, Twan Bearda, Ken‐Ichi Sano, Karine Kenis, Tom Janssens, Leonardus H. A. Leunissen, (unknown), P. Mertens	1
6	Post Salicidation Clean: Selective Removal of Un-Reacted NiPt Towards NiPtSi(Ge) 2007 ·ECS Transactions ·(unknown), A. Lauwers, Rita Vos, (unknown), (unknown), C. Demeurisse, S. Mertens, (unknown), (unknown), P. Mertens, (unknown), (unknown), (unknown)	0
7	Post Ion-Implant Photoresist Removal via Wet Chemical Cleans Combined with Physical Force Pretreatments 2007 ·ECS Transactions ·(unknown), Martin M. Frank, Rita Vos, Sophia Arnauts, Twan Bearda, Karine Kenis, (unknown), Quoc Toan Le, (unknown), Guy Vereecke, G. Mannaert, Marcel Lux, I. Hoflijk, Thierry Conard, (unknown), Stéphane Malhouitre, Leonardus H. A. Leunissen, P. Mertens	10
8	Particle Removal from Micrometer-Sized Trenches Using High-Velocity-Aerosol Cleaning and Comparison with Megasonic Tank Cleaning 2007 ·ECS Transactions ·Kurt Wostyn, Ken‐Ichi Sano, (unknown), Tom Janssens, Twan Bearda, Leonardus H. A. Leunissen, P. Mertens	2
9	Modifications of Porous Low-k by Plasma Treatments and Wet Cleans 2007 ·ECS Transactions ·(unknown), Guy Vereecke, (unknown), Quoc Toan Le, Marcel Lux, (unknown), (unknown), (unknown), P. Mertens, (unknown), (unknown), (unknown), Shijian Luo, Qingyuan Han, Ivan L. Berry	0
10	Fundamental study of the removal mechanisms of nano-sized particles using brush scrubber cleaning 2005 ·Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·Kai Xu, Rita Vos, Guy Vereecke, (unknown), Wim Fyen, P. Mertens, M. M. Heyns, C. Vinckier, Jan Fransaer, Ferenc Kovács	46
11	Evaluation of megasonic cleaning systems for particle removal efficiency and damaging 2004 ·Guy Vereecke, Frank Holsteyns, (unknown), Marcel Lux, Sophia Arnauts, (unknown), Rita Vos, P. Mertens, Marc Heyns	2
12	Validation of vapor phase decomposition–droplet collection–total reflection X-ray fluorescence spectrometry for metallic contamination analysis of silicon wafers 2004 ·Spectrochimica Acta Part B Atomic Spectroscopy ·David Hellin, Jens Rip, Sophia Arnauts, Stefan De Gendt, P. Mertens, Chris Vinckier	25
13	Imbibition of Dye and Pigment-based Aqueous Inks into Porous Substrates 2003 ·Technical programs and proceedings ·(unknown), (unknown), (unknown), (unknown), P. Mertens, (unknown), Arthur Soucémarianadin	2
14	Determination of metallic contaminants on Ge wafers using direct- and droplet sandwich etch-total reflection X-ray fluorescence spectrometry 2003 ·Spectrochimica Acta Part B Atomic Spectroscopy ·David Hellin, Twan Bearda, Chenguang Zhao, (unknown), P. Mertens, Stefan De Gendt, Marc Heyns, C. Vinckier	7
15	Chlorine Precursors For Gate Oxidation Processes 1996 ·MRS Proceedings ·(unknown), P. Mertens, Bert Vermeire, Marc Heyns, (unknown), (unknown), Marc Schaekers	1
16	Impact of the Electrochemical Properties of Silicon Wafer Surfaces on Copper Outplating from HF Solutions 1996 ·Journal of The Electrochemical Society ·Ivo Teerlinck, P. Mertens, H. Schmidt, M. Meuris, Marc Heyns	31
17	Cleaning technology for improved gate oxide integrity 1993 ·Microelectronic Engineering ·Marc Meuris, Steven Verhaverbeke, P. Mertens, H. Schmidt, M. M. Heyns, M. Kubota, Ara Philipossian, (unknown), D. Gräf, (unknown), (unknown)	14
18	New Wet Cleaning Strategies for Obtaining Highly Reliable Thin Oxides 1993 ·MRS Proceedings ·Marc Heyns, Steven Verhaverbeke, Marc Meuris, P. Mertens, H. Schmidt, M. Kubota, Ara Philipossian, (unknown), D. Gräf, (unknown), (unknown)	24
19	Different Defect Patterns in Stacked Silicon Films Obtained by Radiative-Heating Zone-Melting Recrystallization 1992 ·Japanese Journal of Applied Physics ·P. Mertens, H.E. Maes	1
20	A Comparative Study of Starting Materials for SOI Device Fabrication Obtained by Different Recrystallization Procedures and Material Structures 1987 ·D. J. Wouters, M. Tack, P. Mertens, H.E. Maes, C. Claeys	1

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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