Karine Kenis

735 total citations
50 papers, 363 citations indexed

About

Karine Kenis is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Surfaces, Coatings and Films. According to data from OpenAlex, Karine Kenis has authored 50 papers receiving a total of 363 indexed citations (citations by other indexed papers that have themselves been cited), including 27 papers in Electrical and Electronic Engineering, 7 papers in Biomedical Engineering and 6 papers in Surfaces, Coatings and Films. Recurrent topics in Karine Kenis's work include Semiconductor materials and devices (18 papers), Silicon and Solar Cell Technologies (10 papers) and Advancements in Semiconductor Devices and Circuit Design (10 papers). Karine Kenis is often cited by papers focused on Semiconductor materials and devices (18 papers), Silicon and Solar Cell Technologies (10 papers) and Advancements in Semiconductor Devices and Circuit Design (10 papers). Karine Kenis collaborates with scholars based in Belgium, United States and Netherlands. Karine Kenis's co-authors include Paul Mertens, Marc Heyns, Stefan De Gendt, D. Martin Knotter, Marc Meuris, Rita Vos, Marcel Lux, Frank Holsteyns, Sophia Arnauts and Guy Vereecke and has published in prestigious journals such as Journal of The Electrochemical Society, IEEE Transactions on Electron Devices and Japanese Journal of Applied Physics.

In The Last Decade

Karine Kenis

44 papers receiving 329 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Karine Kenis Belgium 10 244 107 82 48 33 50 363
Glenn W. Gale United States 8 113 0.5× 134 1.3× 88 1.1× 48 1.0× 27 0.8× 17 248
E. Forniés Spain 12 182 0.7× 40 0.4× 142 1.7× 62 1.3× 9 0.3× 14 352
Tatsuhiko Shigematsu Japan 11 295 1.2× 56 0.5× 156 1.9× 38 0.8× 9 0.3× 18 401
K.P. Purushotham United States 9 79 0.3× 47 0.4× 201 2.5× 40 0.8× 31 0.9× 13 334
J. Angeli Austria 8 69 0.3× 27 0.3× 177 2.2× 40 0.8× 22 0.7× 19 392
Markus Rinio Germany 12 525 2.2× 138 1.3× 189 2.3× 22 0.5× 20 0.6× 38 616
Kenji Okada Japan 14 505 2.1× 37 0.3× 107 1.3× 18 0.4× 21 0.6× 66 593
Yoshimi Iijima Japan 11 116 0.5× 129 1.2× 65 0.8× 77 1.6× 7 0.2× 29 344
Q. Zheng Spain 12 237 1.0× 63 0.6× 144 1.8× 14 0.3× 9 0.3× 25 369
M. Gastel Germany 8 220 0.9× 17 0.2× 95 1.2× 31 0.6× 5 0.2× 18 355

Countries citing papers authored by Karine Kenis

Since Specialization
Citations

This map shows the geographic impact of Karine Kenis's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Karine Kenis with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Karine Kenis more than expected).

Fields of papers citing papers by Karine Kenis

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Karine Kenis. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Karine Kenis. The network helps show where Karine Kenis may publish in the future.

Co-authorship network of co-authors of Karine Kenis

This figure shows the co-authorship network connecting the top 25 collaborators of Karine Kenis. A scholar is included among the top collaborators of Karine Kenis based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Karine Kenis. Karine Kenis is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Kenis, Karine, et al.. (2023). Monitoring of Trace Molecular Impurities in Clean-Room Air. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 346. 183–188. 1 indexed citations
2.
Oniki, Yusuke, et al.. (2023). Model-free measurement of lateral recess in gate-all-around transistors with micro hard-X-ray fluorescence. Journal of Micro/Nanopatterning Materials and Metrology. 22(3). 5 indexed citations
3.
4.
Kikuchi, Yoshiaki, T. Chiarella, David De Roest, et al.. (2017). The Improvement of Subthreshold Slope and Transconductance of p-Type Bulk Si Field-Effect Transistors by Solid-Source Doping. IEEE Transactions on Electron Devices. 64(6). 2492–2497. 2 indexed citations
5.
Kikuchi, Yoshiaki, T. Chiarella, David De Roest, et al.. (2016). Electrical Characteristics of p-Type Bulk Si Fin Field-Effect Transistor Using Solid-Source Doping With 1-nm Phosphosilicate Glass. IEEE Electron Device Letters. 37(9). 1084–1087. 4 indexed citations
6.
Wostyn, Kurt, Andriy Hikavyy, Roger Loo, et al.. (2014). HF-Last Wet Clean in Combination with a Low Temperature GeH<sub>4</sub>-Assisted HCl <i>In Situ</i> Clean Prior to Si<sub>0.8</sub>Ge<sub>0.2</sub>-on-Si Epitaxial Growth. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 219. 20–23. 1 indexed citations
7.
Wostyn, Kurt, Karine Kenis, Roger Loo, et al.. (2014). Evaluation of the Si0.8Ge0.2-on-Si Epitaxial Quality by Inline Surface Light Scattering: A Case Study on the Impact of Interfacial Oxygen. ECS Transactions. 64(6). 989–995. 4 indexed citations
8.
Wostyn, Kurt, M. Wada, Tom Janssens, et al.. (2009). High Velocity Aerosol Cleaning with Organic Solvents: Particle Removal and Substrate Damage. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 145-146. 39–42. 4 indexed citations
9.
Pacco, Antoine, Sandip Halder, Karine Kenis, Twan Bearda, & Paul Mertens. (2009). Cleaning and Damage Performance of Single Wafer Cleaning Tools using Physical Removal Forces. ECS Transactions. 25(5). 311–317. 2 indexed citations
10.
Marco, Cinzia De, Kurt Wostyn, Twan Bearda, et al.. (2007). Damage Clustering and Damage-Size Distributions After Megasonic Cleaning. ECS Meeting Abstracts. MA2007-02(18). 1019–1019. 1 indexed citations
11.
Kenis, Karine, et al.. (2007). The effect of pneumatic gas pressure on the wear behaviour of PTFE. Wear. 264(7-8). 494–498. 2 indexed citations
12.
Frank, Martin M., Rita Vos, Sophia Arnauts, et al.. (2007). Post Ion-Implant Photoresist Removal via Wet Chemical Cleans Combined with Physical Force Pretreatments. ECS Transactions. 11(2). 219–226. 10 indexed citations
13.
Vereecke, Guy, Kai Xu, Ken‐Ichi Sano, et al.. (2007). Aging Phenomena in the Removal of Nano-Particles from Si Wafers. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 134. 155–158. 6 indexed citations
14.
Janssens, Tom, Frank Holsteyns, Karine Kenis, et al.. (2007). Study of the Dynamics of Local Particle Removal Efficiencies Using Localized Haze Maps. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 134. 233–236. 1 indexed citations
15.
Lauerhaas, Jeffrey M., Paul Mertens, Wim Fyen, et al.. (2002). Single wafer cleaning and drying: particle removal via a non-contact, non-damaging megasonic clean followed by a high performance "Rotagoni" dry. 40. 157–160. 6 indexed citations
16.
Vos, Rita, Bernd O. Kolbesen, Marcel Lux, et al.. (2001). Single Chemistry Cleaning Solution for Advanced Wafer Cleaning. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 76-77. 119–122. 1 indexed citations
17.
Vereecke, Guy, Sophia Arnauts, Karine Kenis, et al.. (2001). Analysis of trace metals in thin silicon nitride films by total-reflection X-ray fluorescence. Spectrochimica Acta Part B Atomic Spectroscopy. 56(11). 2321–2330. 2 indexed citations
18.
Meuris, Marc, Sophia Arnauts, Karine Kenis, et al.. (2000). The IMEC Clean: implementation in advanced CMOS manufacturing. 11. 295–299. 3 indexed citations
19.
Gendt, Stefan De, D. Martin Knotter, Karine Kenis, Paul Mertens, & Marc Heyns. (1998). Impact of Iron Contamination and Roughness Generated in Ammonia Hydrogen Peroxide Mixtures (SC1) on 5 nm Gate Oxides. Journal of The Electrochemical Society. 145(7). 2589–2594. 6 indexed citations
20.
Vermeire, Bert, et al.. (1994). Effect of Different Chlorine Sources during Gate Oxidation. 143–146. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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