Wim Fyen

556 total citations
37 papers, 417 citations indexed

About

Wim Fyen is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Surfaces, Coatings and Films. According to data from OpenAlex, Wim Fyen has authored 37 papers receiving a total of 417 indexed citations (citations by other indexed papers that have themselves been cited), including 19 papers in Electrical and Electronic Engineering, 18 papers in Biomedical Engineering and 6 papers in Surfaces, Coatings and Films. Recurrent topics in Wim Fyen's work include Advanced Surface Polishing Techniques (12 papers), Semiconductor materials and devices (6 papers) and Surface Modification and Superhydrophobicity (5 papers). Wim Fyen is often cited by papers focused on Advanced Surface Polishing Techniques (12 papers), Semiconductor materials and devices (6 papers) and Surface Modification and Superhydrophobicity (5 papers). Wim Fyen collaborates with scholars based in Belgium, United States and Netherlands. Wim Fyen's co-authors include Paul Mertens, Jo De Boeck, Roel Wirix-Speetjens, Rita Vos, Kai Xu, Chris Vinckier, Guy Vereecke, Jan Fransaer, Marc Heyns and G. Borghs and has published in prestigious journals such as Journal of Applied Physics, Journal of The Electrochemical Society and The Journal of Physical Chemistry C.

In The Last Decade

Wim Fyen

37 papers receiving 402 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Wim Fyen Belgium 11 223 163 138 56 49 37 417
Thomas Haensel Germany 12 167 0.7× 134 0.8× 178 1.3× 58 1.0× 12 0.2× 21 407
Л. В. Поперенко Ukraine 11 112 0.5× 119 0.7× 138 1.0× 55 1.0× 27 0.6× 65 354
Yiying Zhu China 13 134 0.6× 181 1.1× 221 1.6× 139 2.5× 34 0.7× 56 475
H. Daniels United Kingdom 7 74 0.3× 66 0.4× 247 1.8× 86 1.5× 42 0.9× 10 364
F. Santagata Netherlands 15 157 0.7× 321 2.0× 155 1.1× 42 0.8× 25 0.5× 42 527
Dmitry Karpov France 9 182 0.8× 138 0.8× 173 1.3× 16 0.3× 11 0.2× 36 450
Fei Ma China 11 71 0.3× 154 0.9× 189 1.4× 56 1.0× 9 0.2× 32 440
Petr Bábor Czechia 11 43 0.2× 125 0.8× 183 1.3× 46 0.8× 42 0.9× 29 322
Н. И. Боргардт Russia 13 78 0.3× 199 1.2× 226 1.6× 23 0.4× 17 0.3× 76 426
S.Z. Szilasi Hungary 12 143 0.6× 146 0.9× 106 0.8× 8 0.1× 58 1.2× 31 372

Countries citing papers authored by Wim Fyen

Since Specialization
Citations

This map shows the geographic impact of Wim Fyen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Wim Fyen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Wim Fyen more than expected).

Fields of papers citing papers by Wim Fyen

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Wim Fyen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Wim Fyen. The network helps show where Wim Fyen may publish in the future.

Co-authorship network of co-authors of Wim Fyen

This figure shows the co-authorship network connecting the top 25 collaborators of Wim Fyen. A scholar is included among the top collaborators of Wim Fyen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Wim Fyen. Wim Fyen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Fyen, Wim & Paul Mertens. (2008). An Analytical Model to Describe the Efficiency of an Immersion Rinsing Process. IEEE Transactions on Semiconductor Manufacturing. 21(4). 661–667. 2 indexed citations
2.
Sioncke, Sonja, Marcel Lux, Wim Fyen, et al.. (2007). Particle Deposition and Removal from Ge Wafers. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 134. 173–176. 2 indexed citations
3.
Fyen, Wim, et al.. (2007). Particle-Substrate Interaction Forces in a Non-Polar Liquid. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 134. 165–168. 3 indexed citations
4.
Fyen, Wim & Paul Mertens. (2006). Study of the Carry-over Layer and Its Importance for Wet Processing of Semiconductor Substrates. Journal of The Electrochemical Society. 153(5). G443–G443. 2 indexed citations
5.
Wirix-Speetjens, Roel, Wim Fyen, Jo De Boeck, & Gustaaf Borghs. (2006). Single magnetic particle detection: Experimental verification of simulated behavior. Journal of Applied Physics. 99(10). 28 indexed citations
6.
Fyen, Wim, Sophia Arnauts, Frank Holsteyns, et al.. (2005). Performance of a Linear Single Wafer IPA Vapour Based Drying System. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 103-104. 75–78. 2 indexed citations
7.
Xu, Kai, Rita Vos, Guy Vereecke, et al.. (2005). Fundamental study of the removal mechanisms of nano-sized particles using brush scrubber cleaning. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 23(5). 2160–2175. 46 indexed citations
8.
Wirix-Speetjens, Roel, et al.. (2005). A force study of on-chip magnetic particle transport based on tapered conductors. IEEE Transactions on Magnetics. 41(10). 4128–4133. 45 indexed citations
9.
Xu, Kai, Rita Vos, Guy Vereecke, et al.. (2005). A Force Study in Brush Scrubbing. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 103-104. 279–282. 1 indexed citations
10.
Xu, Kai, Rita Vos, Guy Vereecke, et al.. (2004). Particle adhesion and removal mechanisms during brush scrubber cleaning. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 22(6). 2844–2852. 42 indexed citations
11.
Hellin, David, Wim Fyen, Jens Rip, et al.. (2004). Saturation effects in TXRF on micro-droplet residue samples. Journal of Analytical Atomic Spectrometry. 19(12). 1517–1517. 42 indexed citations
12.
Fyen, Wim, et al.. (2003). Procedure to Evaluate Particle-Substrate Interaction during Immersion in Liquid. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 92. 53–56. 2 indexed citations
13.
Donaton, R. A., Karen Maex, Herbert Struyf, et al.. (2003). Critical issues in the integration of copper and low-k dielectrics. 511. 262–264. 1 indexed citations
14.
Lauerhaas, Jeffrey M., Paul Mertens, Wim Fyen, et al.. (2002). Single wafer cleaning and drying: particle removal via a non-contact, non-damaging megasonic clean followed by a high performance "Rotagoni" dry. 40. 157–160. 6 indexed citations
15.
Vos, Rita, Kai Xu, Marcel Lux, et al.. (2001). Use of Surfactants for Improved Particle Performance of dHF-Based Cleaning Recipes. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 76-77. 263–266. 2 indexed citations
16.
Fyen, Wim, et al.. (2001). Non-Contact Post Cu CMP Cleaning Using Megasonic Energy. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 76-77. 39–42. 2 indexed citations
17.
Fyen, Wim, Rita Vos, Ivo Teerlinck, et al.. (2000). Cleaning, rinsing and drying effects in post-Cu CMP clean. 507. 1 indexed citations
18.
Meuris, Marc, Evi Vrancken, N. Heylen, et al.. (1999). Modelling the influence of pad bending on the planarization performance during CMP. MRS Proceedings. 566. 8 indexed citations
19.
Dubois, Jessica, Wim Fyen, Daniela Rusu, Edith Peuvrel‐Disdier, & Patrick Navard. (1998). Small-angle scattering of polarized light. VI. Sphere doublets at rest and during shear. Journal of Polymer Science Part B Polymer Physics. 36(11). 2005–2013. 3 indexed citations
20.
Fyen, Wim, et al.. (1997). Point of Use HF Purification for Silicon Surface Preparation by Ion Exchange. Journal of The Electrochemical Society. 144(6). 2189–2196. 14 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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