Jan Van Steenbergen

1.1k total citations
29 papers, 665 citations indexed

About

Jan Van Steenbergen is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, Jan Van Steenbergen has authored 29 papers receiving a total of 665 indexed citations (citations by other indexed papers that have themselves been cited), including 26 papers in Electrical and Electronic Engineering, 8 papers in Atomic and Molecular Physics, and Optics and 5 papers in Biomedical Engineering. Recurrent topics in Jan Van Steenbergen's work include Semiconductor materials and devices (21 papers), Advancements in Semiconductor Devices and Circuit Design (16 papers) and Silicon and Solar Cell Technologies (9 papers). Jan Van Steenbergen is often cited by papers focused on Semiconductor materials and devices (21 papers), Advancements in Semiconductor Devices and Circuit Design (16 papers) and Silicon and Solar Cell Technologies (9 papers). Jan Van Steenbergen collaborates with scholars based in Belgium, Greece and United Kingdom. Jan Van Steenbergen's co-authors include Marc Meuris, Brice De Jaeger, Marc Heyns, Matty Caymax, Thierry Conard, Stefan De Gendt, Michel Houssa, Sonja Sioncke, Olivier Richard and Sven Van Elshocht and has published in prestigious journals such as Applied Physics Letters, IEEE Transactions on Electron Devices and Thin Solid Films.

In The Last Decade

Jan Van Steenbergen

29 papers receiving 644 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Jan Van Steenbergen Belgium 15 638 240 190 142 25 29 665
C. Rosenblad Switzerland 12 428 0.7× 297 1.2× 124 0.7× 102 0.7× 23 0.9× 24 532
Alexandra Abbadie France 13 612 1.0× 271 1.1× 138 0.7× 180 1.3× 7 0.3× 32 658
K. Lyutovich Germany 15 679 1.1× 392 1.6× 236 1.2× 176 1.2× 20 0.8× 48 787
K. Seibert Germany 9 213 0.3× 169 0.7× 166 0.9× 68 0.5× 18 0.7× 17 346
U. Serincan Türkiye 13 316 0.5× 155 0.6× 341 1.8× 153 1.1× 19 0.8× 44 446
R. Kurps Germany 12 427 0.7× 202 0.8× 118 0.6× 50 0.4× 9 0.4× 50 461
K. Guilloy France 12 400 0.6× 196 0.8× 172 0.9× 171 1.2× 30 1.2× 20 483
V. A. Zinovyev Russia 12 263 0.4× 326 1.4× 216 1.1× 130 0.9× 10 0.4× 68 451
Nengwen Wang China 8 275 0.4× 254 1.1× 85 0.4× 54 0.4× 32 1.3× 10 383
S. H. Huang China 6 280 0.4× 239 1.0× 101 0.5× 83 0.6× 23 0.9× 12 338

Countries citing papers authored by Jan Van Steenbergen

Since Specialization
Citations

This map shows the geographic impact of Jan Van Steenbergen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jan Van Steenbergen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jan Van Steenbergen more than expected).

Fields of papers citing papers by Jan Van Steenbergen

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jan Van Steenbergen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jan Van Steenbergen. The network helps show where Jan Van Steenbergen may publish in the future.

Co-authorship network of co-authors of Jan Van Steenbergen

This figure shows the co-authorship network connecting the top 25 collaborators of Jan Van Steenbergen. A scholar is included among the top collaborators of Jan Van Steenbergen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jan Van Steenbergen. Jan Van Steenbergen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Sioncke, Sonja, D.P. Brunco, Marc Meuris, et al.. (2009). Etch Rate Study of Germanium, GaAs and InGaAs: A Challenge in Semiconductor Processing. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 145-146. 203–206. 14 indexed citations
2.
Sioncke, Sonja, D.P. Brunco, Marc Meuris, et al.. (2008). Etch Rates of Ge, GaAs and InGaAs in Acids, Bases and Peroxide Based Mixtures. ECS Transactions. 16(10). 451–460. 28 indexed citations
3.
Nicholas, G., D.P. Brunco, A. Dimoulas, et al.. (2007). Germanium MOSFETs With $\hbox{CeO}_{2}/\hbox{HfO}_{2}/ \hbox{TiN}$ Gate Stacks. IEEE Transactions on Electron Devices. 54(6). 1425–1430. 34 indexed citations
4.
Forment, Stefaan, Jan Vanhellemont, P. Clauws, et al.. (2006). A deep-level transient spectroscopy study of transition metals in n-type germanium. Materials Science in Semiconductor Processing. 9(4-5). 559–563. 18 indexed citations
5.
Elshocht, Sven Van, Matty Caymax, Thierry Conard, et al.. (2006). Study of CVD high-k gate oxides on high-mobility Ge and Ge/Si substrates. Thin Solid Films. 508(1-2). 1–5. 14 indexed citations
6.
Leys, Frederik, B. Kaczer, Tom Janssens, et al.. (2006). Thin epitaxial Si films as a passivation method for Ge(100): Influence of deposition temperature on Ge surface segregation and the high-k/Ge interface quality. Materials Science in Semiconductor Processing. 9(4-5). 679–684. 41 indexed citations
7.
Dimoulas, A., Y. Panayiotatos, A. Sotiropoulos, et al.. (2006). Germanium FETs and capacitors with rare earth CeO2/HfO2 gates. 88. 142–145. 1 indexed citations
8.
Elshocht, Sven Van, Matty Caymax, Thierry Conard, et al.. (2006). Effect of hafnium germanate formation on the interface of HfO2/germanium metal oxide semiconductor devices. Applied Physics Letters. 88(14). 65 indexed citations
9.
Houssa, Michel, Thierry Conard, Jan Van Steenbergen, et al.. (2006). Characterization of Atomic-Beam Deposited GeO1-xNx/HfO2 Stacks on Ge. ECS Transactions. 1(5). 9–16. 4 indexed citations
10.
Martens, Koen, Brice De Jaeger, Jan Van Steenbergen, et al.. (2006). New interface state density extraction method applicable to peaked and high-density distributions for Ge MOSFET development. IEEE Electron Device Letters. 27(5). 405–408. 64 indexed citations
11.
Satta, A., G. Nicholas, Eddy Simoen, et al.. (2006). Impact of germanium surface passivation on the leakage current of shallow planar p–n junctions. Materials Science in Semiconductor Processing. 9(4-5). 716–720. 16 indexed citations
12.
Fyen, Wim, Sophia Arnauts, Frank Holsteyns, et al.. (2005). Performance of a Linear Single Wafer IPA Vapour Based Drying System. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 103-104. 75–78. 2 indexed citations
13.
Hellin, David, Ivo Teerlinck, Jan Van Steenbergen, et al.. (2005). Vapor phase decomposition–droplet collection–total reflection X-ray fluorescence spectrometry for metallic contamination analysis on Ge wafers. Spectrochimica Acta Part B Atomic Spectroscopy. 60(2). 209–213. 7 indexed citations
14.
Vanhellemont, Jan, Dirk Poelman, P. Clauws, et al.. (2005). Experimental and theoretical evidence for vacancy-clustering-induced large voids in Czochralski-grown germanium crystals. Applied Physics Letters. 87(6). 22 indexed citations
15.
Onsia, Bart, Thierry Conard, Stefan De Gendt, et al.. (2005). A Study of the Influence of Typical Wet Chemical Treatments on the Germanium Wafer Surface. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 103-104. 27–30. 67 indexed citations
16.
Leys, Frederik, Roger Loo, Olivier Richard, et al.. (2005). Growth kinetics and relaxation mechanism of very thin epitaxial Si films on (100) germanium. 1 indexed citations
17.
Elshocht, Sven Van, Bert Brijs, Matty Caymax, et al.. (2005). Surface Preparation Techniques for High-k Deposition on Ge Substrates. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 103-104. 31–36. 4 indexed citations
18.
Leys, Frederik, Roger Loo, Olivier Richard, et al.. (2005). Epitaxy solutions for Ge MOS technology. Thin Solid Films. 508(1-2). 292–296. 16 indexed citations
19.
Elshocht, Sven Van, Bert Brijs, Matty Caymax, et al.. (2004). Deposition of HfO2 on germanium and the impact of surface pretreatments. Applied Physics Letters. 85(17). 3824–3826. 86 indexed citations
20.
Elshocht, Sven Van, Bert Brijs, Matty Caymax, et al.. (2004). Physical characterization of HfO2 deposited on Ge substrates by MOCVD. MRS Proceedings. 809. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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