J.-F. Damlencourt
- Electrical and Electronic Engineering top 5%
- Materials Chemistry top 10%
- Atomic and Molecular Physics, and Optics top 10%
- Biomedical Engineering
- Electronic, Optical and Magnetic Materials
- Topics
- Semiconductor materials and devices (28 papers)Advancements in Semiconductor Devices and Circuit Design (15 papers)Integrated Circuits and Semiconductor Failure Analysis (9 papers)
- Cited by
- Electrical and Electronic EngineeringMaterials ChemistryAtomic and Molecular Physics, and Optics
- Partner nations
- FranceItalySwitzerland
In The Last Decade
J.-F. Damlencourt
31 papers receiving 1.0k citations
Peers
Comparison fields: 5 of 33
- Electrical and Electronic Engineering 1.0k
- Materials Chemistry 414
- Atomic and Molecular Physics, and Optics 198
- Biomedical Engineering 198
- Electronic, Optical and Magnetic Materials 57
Countries citing papers authored by J.-F. Damlencourt
This map shows the geographic impact of J.-F. Damlencourt's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.-F. Damlencourt with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.-F. Damlencourt more than expected).
Fields of papers citing papers by J.-F. Damlencourt
This network shows the impact of papers produced by J.-F. Damlencourt. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.-F. Damlencourt. The network helps show where J.-F. Damlencourt may publish in the future.
Co-authorship network of co-authors of J.-F. Damlencourt
This figure shows the co-authorship network connecting the top 25 collaborators of J.-F. Damlencourt. A scholar is included among the top collaborators of J.-F. Damlencourt based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J.-F. Damlencourt. J.-F. Damlencourt is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 3 | |
| 3 | 13 | |
| 4 | 6 | |
| 5 | 7 | |
| 6 | 20 | |
| 7 | 198 | |
| 8 | 1 | |
| 9 | 28 | |
| 10 | 46 | |
| 11 | 2 | |
| 12 | 2 | |
| 13 | 19 | |
| 14 | 44 | |
| 15 | 9 | |
| 16 | 5 | |
| 17 | 7 | |
| 18 | 184 | |
| 19 | 3 | |
| 20 | 7 |
About J.-F. Damlencourt
J.-F. Damlencourt is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Materials Chemistry, having authored 33 papers that have together received 1.1k indexed citations. Recurring topics across this work include Semiconductor materials and devices (28 papers), Advancements in Semiconductor Devices and Circuit Design (15 papers) and Integrated Circuits and Semiconductor Failure Analysis (9 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.0k citations), Materials Chemistry (414 citations) and Atomic and Molecular Physics, and Optics (198 citations). J.-F. Damlencourt has collaborated with scholars based in France, Italy and Switzerland. Frequent co-authors include F. Martín, O. Renault, S. Deleonibus, N. Barrett, C. Le Royer, S. Marthon, C. Tabone, F. Andrieu, F. Mayer and K. Romanjek. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Applied Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.