F. Leverd
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- Semiconductor materials and devices 23
- Advancements in Semiconductor Devices and Circuit Design 18
- Integrated Circuits and Semiconductor Failure Analysis 14
- Photonic and Optical Devices 4
- 3D IC and TSV technologies 4
- Thin-Film Transistor Technologies 3
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- Semiconductor materials and interfaces 5
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- Copper Interconnects and Reliability 3
F. Leverd
30 papers receiving 364 citations
Peers
Comparison fields: 5 of 25
- Electrical and Electronic Engineering 386
- Instrumentation 6
- Biomedical Engineering 67
- Atomic and Molecular Physics, and Optics 44
- Surfaces, Coatings and Films 9
Countries citing papers authored by F. Leverd
This map shows the geographic impact of F. Leverd's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Leverd with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Leverd more than expected).
Fields of papers citing papers by F. Leverd
This network shows the impact of papers produced by F. Leverd. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Leverd. The network helps show where F. Leverd may publish in the future.
Co-authorship network
The 25 scholars most cited alongside F. Leverd, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2022 | 2 | |
| 2 | 2021 | 1 | |
| 3 | 2020 | 9 | |
| 4 | 2020 | 0 | |
| 5 | 2018 | 2 | |
| 6 | 2014 | 10 | |
| 7 | 2014 | 3 | |
| 8 | 2013 | 36 | |
| 9 | 2013 | 8 | |
| 10 | 2011 | 1 | |
| 11 | 2010 | 18 | |
| 12 | 2010 | 2 | |
| 13 | 2009 | 2 | |
| 14 | 2006 | 22 | |
| 15 | 2006 | 0 | |
| 16 | 2005 | 7 | |
| 17 | 2005 | 0 | |
| 18 | 2004 | 18 | |
| 19 | 2003 | 0 | |
| 20 | 2002 | 44 |
About F. Leverd
F. Leverd is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials and Automotive Engineering, having authored 36 papers that have together received 390 indexed citations. Recurring topics across this work include Semiconductor materials and devices (23 papers), Advancements in Semiconductor Devices and Circuit Design (18 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers), Semiconductor materials and interfaces (5 papers), Photonic and Optical Devices (4 papers), 3D IC and TSV technologies (4 papers), Thin-Film Transistor Technologies (3 papers) and Copper Interconnects and Reliability (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (386 citations), Instrumentation (6 citations), Biomedical Engineering (67 citations), Atomic and Molecular Physics, and Optics (44 citations) and Surfaces, Coatings and Films (9 citations). F. Leverd has collaborated with scholars based in France, Switzerland and United States. Frequent co-authors include T. Skotnicki, Romuald Blanc, O. Joubert, D. Dutartre, R. Pantel, S. Monfray, Y. Morand, M. Rivoire, D. Louis and B. Tavel. Their work appears in journals such as Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Solid-State Electronics, Materials Science in Semiconductor Processing, IEEE Transactions on Nanotechnology and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.