S. Marthon
-
- Semiconductor materials and devices 16
- Plasma Diagnostics and Applications 4
- Advancements in Photolithography Techniques 3
- Integrated Circuits and Semiconductor Failure Analysis 3
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques 13
-
- Electronic and Structural Properties of Oxides 4
- Silicon Nanostructures and Photoluminescence 3
-
- Ion-surface interactions and analysis 6
- Journals
- Applied Surface Science (3 papers)Thin Solid Films (3 papers)Surface and Interface Analysis (3 papers)
- Partner nations
- FranceSwitzerlandIndia
In The Last Decade
S. Marthon
24 papers receiving 498 citations
Peers
Comparison fields: 5 of 39
- Electrical and Electronic Engineering 418
- Surfaces, Coatings and Films 50
- Materials Chemistry 252
- Electronic, Optical and Magnetic Materials 42
- Atomic and Molecular Physics, and Optics 68
Countries citing papers authored by S. Marthon
This map shows the geographic impact of S. Marthon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Marthon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Marthon more than expected).
Fields of papers citing papers by S. Marthon
This network shows the impact of papers produced by S. Marthon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Marthon. The network helps show where S. Marthon may publish in the future.
Co-authorship network
The 25 scholars most cited alongside S. Marthon, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2003 | 44 | |
| 2 | 2003 | 1 | |
| 3 | 2003 | 63 | |
| 4 | 2002 | 184 | |
| 5 | 2002 | 7 | |
| 6 | 2001 | 4 | |
| 7 | 1995 | 2 | |
| 8 | 1994 | 1 | |
| 9 | 1994 | 4 | |
| 10 | 1993 | 8 | |
| 11 | 1992 | 5 | |
| 12 | 1992 | 17 | |
| 13 | 1991 | 11 | |
| 14 | 1991 | 21 | |
| 15 | 1991 | 10 | |
| 16 | 1991 | 4 | |
| 17 | 1990 | 8 | |
| 18 | 1989 | 4 | |
| 19 | 1988 | 36 | |
| 20 | 1986 | 34 |
About S. Marthon
S. Marthon is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Computational Mechanics, having authored 25 papers that have together received 509 indexed citations. Recurring topics across this work include Semiconductor materials and devices (16 papers), Electron and X-Ray Spectroscopy Techniques (13 papers), Ion-surface interactions and analysis (6 papers), Electronic and Structural Properties of Oxides (4 papers), Plasma Diagnostics and Applications (4 papers), Advancements in Photolithography Techniques (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers) and Silicon Nanostructures and Photoluminescence (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (418 citations), Surfaces, Coatings and Films (50 citations) and Materials Chemistry (252 citations). S. Marthon has collaborated with scholars based in France, Switzerland and India. Frequent co-authors include A. Ermolieff, O. Renault, D. Blin, F. Martín, J.-F. Damlencourt, N. Barrett, P. Besson, Pascal Bernard, Anne‐Marie Papon and D. Rouchon. Their work appears in journals such as Applied Surface Science, Thin Solid Films, Surface and Interface Analysis, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and Semiconductor Science and Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.