G. J. Pietsch

778 total citations
17 papers, 663 citations indexed

About

G. J. Pietsch is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, G. J. Pietsch has authored 17 papers receiving a total of 663 indexed citations (citations by other indexed papers that have themselves been cited), including 11 papers in Electrical and Electronic Engineering, 8 papers in Materials Chemistry and 7 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in G. J. Pietsch's work include Semiconductor materials and devices (7 papers), Silicon Nanostructures and Photoluminescence (6 papers) and Force Microscopy Techniques and Applications (4 papers). G. J. Pietsch is often cited by papers focused on Semiconductor materials and devices (7 papers), Silicon Nanostructures and Photoluminescence (6 papers) and Force Microscopy Techniques and Applications (4 papers). G. J. Pietsch collaborates with scholars based in Germany and United States. G. J. Pietsch's co-authors include M. Henzler, Ulrich Köhler, Yves J. Chabal, G. S. Higashi, Otto Jusko, Bert Müller, Peter Hahn, A. M. Mujsce, Greg Kochanski and A. F. Hebard and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Chemical Physics Letters.

In The Last Decade

G. J. Pietsch

17 papers receiving 623 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
G. J. Pietsch Germany 12 394 340 294 277 60 17 663
G. Kissinger Germany 13 591 1.5× 204 0.6× 240 0.8× 108 0.4× 24 0.4× 105 677
A. Appelbaum United States 13 301 0.8× 309 0.9× 102 0.3× 84 0.3× 81 1.4× 37 517
Michael A. Capano United States 14 499 1.3× 273 0.8× 483 1.6× 94 0.3× 52 0.9× 30 853
T. Tatsumi Japan 15 545 1.4× 247 0.7× 173 0.6× 77 0.3× 31 0.5× 78 695
Russell B. Goodman United States 13 386 1.0× 59 0.2× 126 0.4× 237 0.9× 21 0.3× 31 532
Vimal Kamineni United States 12 252 0.6× 135 0.4× 229 0.8× 188 0.7× 12 0.2× 28 495
J.M. Kim South Korea 11 136 0.3× 100 0.3× 456 1.6× 190 0.7× 14 0.2× 27 552
Alexander Mattausch Germany 14 915 2.3× 266 0.8× 699 2.4× 64 0.2× 47 0.8× 26 1.3k
А.А. Еvtukh Ukraine 15 456 1.2× 146 0.4× 529 1.8× 253 0.9× 20 0.3× 110 766
S. Guerri Italy 11 340 0.9× 199 0.6× 128 0.4× 40 0.1× 49 0.8× 25 444

Countries citing papers authored by G. J. Pietsch

Since Specialization
Citations

This map shows the geographic impact of G. J. Pietsch's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. J. Pietsch with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. J. Pietsch more than expected).

Fields of papers citing papers by G. J. Pietsch

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G. J. Pietsch. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. J. Pietsch. The network helps show where G. J. Pietsch may publish in the future.

Co-authorship network of co-authors of G. J. Pietsch

This figure shows the co-authorship network connecting the top 25 collaborators of G. J. Pietsch. A scholar is included among the top collaborators of G. J. Pietsch based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G. J. Pietsch. G. J. Pietsch is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

17 of 17 papers shown
1.
Heiß, Wolfgang, et al.. (2024). Crystal Damage and Surface Morphology in Industrial Diamond Wire Slicing of 300 mm Monocrystalline Silicon Wafers for Microelectronic Devices. Advanced Materials Technologies. 10(8). 2 indexed citations
2.
Pietsch, G. J., et al.. (2004). Understanding simultaneous double-disk grinding: operation principle and material removal kinematics in silicon wafer planarization. Precision Engineering. 29(2). 189–196. 27 indexed citations
3.
Pietsch, G. J.. (1995). Hydrogen on Si: Ubiquitous surface termination after wet-chemical processing. Applied Physics A. 60(4). 347–363. 68 indexed citations
4.
Pietsch, G. J., Yves J. Chabal, & G. S. Higashi. (1995). The atomic-scale removal mechanism during chemo-mechanical polishing of Si(100) and Si(111). Surface Science. 331-333. 395–401. 74 indexed citations
5.
Pietsch, G. J., Yves J. Chabal, & G. S. Higashi. (1995). Infrared-absorption spectroscopy of Si(100) and Si(111) surfaces after chemomechanical polishing. Journal of Applied Physics. 78(3). 1650–1658. 52 indexed citations
6.
Pietsch, G. J.. (1995). Hydrogen on Si: Ubiquitous surface termination after wet-chemical processing. Applied Physics A. 60(4). 347–363. 1 indexed citations
7.
Pietsch, G. J., G. S. Higashi, & Yves J. Chabal. (1994). Chemomechanical polishing of silicon: Surface termination and mechanism of removal. Applied Physics Letters. 64(23). 3115–3117. 75 indexed citations
8.
Pietsch, G. J., Ulrich Köhler, & M. Henzler. (1994). Chemistry of silicon surfaces after wet chemical preparation: A thermodesorption spectroscopy study. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 12(1). 78–87. 34 indexed citations
9.
Pietsch, G. J., Ulrich Köhler, & M. Henzler. (1993). Anisotropic etching versus interaction of atomic steps: Scanning tunneling microscopy observations on HF/NH4F-treated Si(111). Journal of Applied Physics. 73(10). 4797–4807. 83 indexed citations
10.
Pietsch, G. J., Ulrich Köhler, & M. Henzler. (1993). Chemical Status and Surface Topography of Si(111) After HF/NH4F/H2O Wet Chemical Treat-Ments: Investigations With STM, AES, and TDS. MRS Proceedings. 315(1). 497–504. 3 indexed citations
11.
Hebard, A. F., Chang‐Beom Eom, R. M. Fleming, et al.. (1993). Enhanced cohesion of photo-oxygenated fullerene films: A new opportunity for lithography. Applied Physics A. 57(3). 299–303. 30 indexed citations
12.
Jusko, Otto, et al.. (1992). Trench formation in surfactant mediated epitaxial film growth of Ge on Si(100). Applied Physics A. 54(3). 265–269. 10 indexed citations
13.
Pietsch, G. J., Ulrich Köhler, & M. Henzler. (1992). Direct observation of silicon surface etching by water with scanning tunneling microscopy. Chemical Physics Letters. 197(4-5). 346–351. 20 indexed citations
14.
Pietsch, G. J., Ulrich Köhler, Otto Jusko, M. Henzler, & Peter Hahn. (1992). Structure of the stepped Si/SiO2 interface after thermal oxidation: Investigations with scanning tunneling microscopy and spot-profile analysis of low-energy electron diffraction. Applied Physics Letters. 60(11). 1321–1323. 20 indexed citations
15.
Müller, Bert, Otto Jusko, G. J. Pietsch, & Ulrich Köhler. (1992). Strain-induced dimer adatom stacking fault structures of germanium on Si(111)-(√3×√3)R30°:B observed by scanning tunneling microscopy. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 10(1). 16–18. 7 indexed citations
16.
Köhler, Ulrich, Otto Jusko, G. J. Pietsch, Bert Müller, & M. Henzler. (1991). Strained-layer growth and islanding of germanium on Si(111)-(7 × 7) studied with STM. Surface Science. 248(3). 321–331. 143 indexed citations
17.
Pietsch, G. J., M. Henzler, & Peter Hahn. (1989). Continuous roughness characterization from atomic to micron distances: Angle-resolved electron and photon scattering. Applied Surface Science. 39(1-4). 457–472. 14 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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