Luca Vandelli

2.0k total citations
37 papers, 1.6k citations indexed

About

Luca Vandelli is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Polymers and Plastics. According to data from OpenAlex, Luca Vandelli has authored 37 papers receiving a total of 1.6k indexed citations (citations by other indexed papers that have themselves been cited), including 37 papers in Electrical and Electronic Engineering, 6 papers in Materials Chemistry and 2 papers in Polymers and Plastics. Recurrent topics in Luca Vandelli's work include Semiconductor materials and devices (33 papers), Advanced Memory and Neural Computing (25 papers) and Ferroelectric and Negative Capacitance Devices (21 papers). Luca Vandelli is often cited by papers focused on Semiconductor materials and devices (33 papers), Advanced Memory and Neural Computing (25 papers) and Ferroelectric and Negative Capacitance Devices (21 papers). Luca Vandelli collaborates with scholars based in Italy, Belgium and United States. Luca Vandelli's co-authors include Luca Larcher, Andrea Padovani, G. Bersuker, P. D. Kirsch, D. C. Gilmer, Dmitry Veksler, M. Nafrı́a, V. Iglesias, M. Porti and Keith P. McKenna and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Transactions on Electron Devices.

In The Last Decade

Luca Vandelli

36 papers receiving 1.5k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Luca Vandelli Italy 18 1.6k 347 214 166 45 37 1.6k
L. Altimime Belgium 19 1.3k 0.8× 323 0.9× 235 1.1× 191 1.2× 33 0.7× 48 1.3k
P. J. Tzeng Taiwan 12 1.2k 0.7× 340 1.0× 144 0.7× 180 1.1× 53 1.2× 30 1.2k
Damien Deleruyelle France 17 789 0.5× 241 0.7× 156 0.7× 137 0.8× 56 1.2× 66 844
Alvaro Padilla United States 10 705 0.4× 330 1.0× 119 0.6× 147 0.9× 46 1.0× 12 755
Burt Fowler United States 22 1.3k 0.8× 301 0.9× 448 2.1× 242 1.5× 38 0.8× 68 1.3k
Damian Walczyk Germany 16 900 0.6× 332 1.0× 202 0.9× 136 0.8× 19 0.4× 22 996
Subhranu Samanta Singapore 21 947 0.6× 390 1.1× 163 0.8× 128 0.8× 30 0.7× 47 993
Christian Walczyk Germany 16 868 0.6× 223 0.6× 208 1.0× 137 0.8× 21 0.5× 23 904
M. Bocquet France 17 814 0.5× 181 0.5× 146 0.7× 96 0.6× 49 1.1× 66 857
Congyan Lu China 18 841 0.5× 302 0.9× 151 0.7× 162 1.0× 53 1.2× 63 927

Countries citing papers authored by Luca Vandelli

Since Specialization
Citations

This map shows the geographic impact of Luca Vandelli's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Luca Vandelli with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Luca Vandelli more than expected).

Fields of papers citing papers by Luca Vandelli

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Luca Vandelli. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Luca Vandelli. The network helps show where Luca Vandelli may publish in the future.

Co-authorship network of co-authors of Luca Vandelli

This figure shows the co-authorship network connecting the top 25 collaborators of Luca Vandelli. A scholar is included among the top collaborators of Luca Vandelli based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Luca Vandelli. Luca Vandelli is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Buscemi, Fabrizio, Enrico Piccinini, Luca Vandelli, et al.. (2023). A HydroDynamic Model for Trap-Assisted Tunneling Conduction in Ovonic Devices. IEEE Transactions on Electron Devices. 70(4). 1808–1814. 7 indexed citations
2.
Larcher, Luca, Francesco Maria Puglisi, Andrea Padovani, Luca Vandelli, & Paolo Pavan. (2016). Multiscale modeling of electron-ion interactions for engineering novel electronic devices and materials. IRIS UNIMORE (University of Modena and Reggio Emilia). 75. 128–132. 10 indexed citations
3.
Larcher, Luca, et al.. (2016). Electrical defect spectroscopy and reliability prediction through a novel simulation-based methodology. IRIS UNIMORE (University of Modena and Reggio Emilia). 75. 1–2. 1 indexed citations
4.
Puglisi, Francesco Maria, et al.. (2015). A microscopic physical description of RTN current fluctuations in HfO<inf>x</inf> RRAM. IRIS UNIMORE (University of Modena and Reggio Emilia). 5B.5.1–5B.5.6. 30 indexed citations
5.
6.
Vandelli, Luca, et al.. (2014). A new method for extracting interface state and border trap densities in high-k/III-V MOSFETs. Iris Unimore (University of Modena and Reggio Emilia). 55. 2C.3.1–2C.3.6. 5 indexed citations
7.
Larcher, Luca, Francesco Maria Puglisi, Paolo Pavan, et al.. (2014). A Compact Model of Program Window in HfO<italic>x</italic> RRAM Devices for Conductive Filament Characteristics Analysis. IEEE Transactions on Electron Devices. 61(8). 2668–2673. 65 indexed citations
8.
Larcher, Luca, Andrea Padovani, & Luca Vandelli. (2013). A simulation framework for modeling charge transport and degradation in high-k stacks. Journal of Computational Electronics. 12(4). 658–665. 18 indexed citations
9.
Butcher, B., G. Bersuker, Luca Vandelli, et al.. (2013). Modeling the effects of different forming conditions on RRAM conductive filament stability. IRIS UNIMORE (University of Modena and Reggio Emilia). 52–55. 27 indexed citations
10.
Veksler, Dmitry, G. Bersuker, Luca Vandelli, et al.. (2013). Random telegraph noise (RTN) in scaled RRAM devices. IRIS UNIMORE (University of Modena and Reggio Emilia). MY.10.1–MY.10.4. 73 indexed citations
11.
Vandelli, Luca, Andrea Padovani, Luca Larcher, & G. Bersuker. (2013). Microscopic Modeling of Electrical Stress-Induced Breakdown in Poly-Crystalline Hafnium Oxide Dielectrics. IEEE Transactions on Electron Devices. 60(5). 1754–1762. 66 indexed citations
12.
Veksler, Dmitry, G. Bersuker, Himanshu Madan, et al.. (2012). Multi-technique study of defect generation in high-k gate stacks. 5D.2.1–5D.2.5. 6 indexed citations
13.
Larcher, Luca, Andrea Padovani, Onofrio Pirrotta, Luca Vandelli, & G. Bersuker. (2012). Microscopic understanding and modeling of HfO<inf>2</inf> RRAM device physics. IRIS UNIMORE (University of Modena and Reggio Emilia). 41. 20.1.1–20.1.4. 34 indexed citations
14.
Padovani, Andrea, A. Arreghini, Luca Vandelli, et al.. (2011). A Comprehensive Understanding of the Erase of TANOS Memories Through Charge Separation Experiments and Simulations. IEEE Transactions on Electron Devices. 58(9). 3147–3155. 33 indexed citations
15.
Larcher, Luca, Andrea Padovani, Luca Vandelli, & Paolo Pavan. (2011). Charge transport in high-κ stacks for charge-trapping memory applications: A modeling perspective (invited). Microelectronic Engineering. 88(7). 1168–1173. 5 indexed citations
16.
Larcher, Luca, Andrea Padovani, Luca Vandelli, & G. Bersuker. (2011). (Invited) Physical Modeling of Charge Transport and Degradation in HfO2 Stacks for Logic Device and Memory Applications. ECS Transactions. 37(1). 189–197. 1 indexed citations
17.
Vandelli, Luca, Andrea Padovani, G. Bersuker, et al.. (2011). Modeling of the Forming Operation in HfO2-Based Resistive Switching Memories. IRIS UNIMORE (University of Modena and Reggio Emilia). 1–4. 20 indexed citations
18.
Bersuker, G., D. C. Gilmer, Dekel Veksler, et al.. (2010). Metal oxide RRAM switching mechanism based on conductive filament microscopic properties. IRIS UNIMORE (University of Modena and Reggio Emilia). 19.6.1–19.6.4. 92 indexed citations
19.
Arreghini, A., G. Van den bosch, Luca Vandelli, et al.. (2010). Experimental Assessment of Electrons and Holes in Erase Transient of TANOS and TANVaS Memories. IEEE Electron Device Letters. 31(9). 936–938. 11 indexed citations
20.
Vandelli, Luca, Andrea Padovani, Luca Larcher, et al.. (2010). Role of holes and electrons during erase of TANOS memories: Evidences for dipole formation and its impact on reliability. IRIS UNIMORE (University of Modena and Reggio Emilia). 731–737. 9 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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